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A method for accelerated aging test with light, humidity and heat integrated aging test equipment

An aging test and accelerated aging technology, applied in the monitoring of photovoltaic systems, photovoltaic modules, photovoltaic power generation, etc., can solve the problems of photovoltaic module reliability testing research process not keeping up with photovoltaic cost reduction, and promises being questioned, so as to shorten the time. , the effect of improving work efficiency

Active Publication Date: 2018-04-10
HOHAI UNIV CHANGZHOU
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  • Application Information

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Problems solved by technology

However, the reliability testing and research process of photovoltaic modules has not kept up with the pace of photovoltaic cost reduction, and the industry's commitment to the 25-year warranty of modules has been increasingly questioned

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  • A method for accelerated aging test with light, humidity and heat integrated aging test equipment
  • A method for accelerated aging test with light, humidity and heat integrated aging test equipment

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Embodiment Construction

[0021] The present invention will be further described below in conjunction with the accompanying drawings. The following examples are only used to illustrate the technical solution of the present invention more clearly, but not to limit the protection scope of the present invention.

[0022] Such as figure 1 and figure 2 As shown, the light, humidity and heat integrated aging equipment of the present invention includes a box body 104 and a light source 101 installed on the top of the box body. The box body 104 is divided into two parts: an experimental test box and an electrical control box. The experimental test box includes a light source radiation box 103. The motor 201 and the heating and humidifying system 203, the stage 106 is installed on the bottom of the light source radiation box 103, the test assembly 105 is placed on the stage 106, the motor 201 is installed on the top of the experimental test box, and the heating and humidifying system 203 is installed on the ...

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Abstract

The invention discloses a light-damp-heat integrated aging test device and a light-damp-heat integrated aging test method. The device comprises a light source, an air suction opening, an air outlet, a box body, a light source radiation box, a test assembly, a motor, a heating and humidifying system, a compressor, a controller, and a line control system. The box body is divided into an experimental test box and an electrical control box. The light source radiation box is arranged inside the experimental test box. The controller controls the heating and humidifying system through the line control system to adjust the temperature and humidity of air in the experimental test box. The controller controls the light source through the line control system to adjust the spectrum and light intensity. The motor drives hot and damp air to flow and circulate between the experimental test box and the light source radiation box. The compressor makes cooled air enter the light source radiation box via the air suction opening to take away heat of the test assembly. By adjusting parameters like spectrum, light intensity, temperature and humidity, outdoor environment conditions of different regions are simulated, accelerated aging experiment of photovoltaic modules is carried out, and the reliability of photovoltaic modules is tested.

Description

technical field [0001] The invention relates to a method for accelerated aging testing of light, humidity and heat integrated aging testing equipment, and belongs to the technical field of reliability testing of photovoltaic modules. Background technique [0002] With the rapid growth of installed capacity of photovoltaic systems, the operational safety and reliability of photovoltaic systems have gradually emerged. The focus of photovoltaic users has also shifted from focusing on price to quality assurance. However, the reliability testing and research process of photovoltaic modules has not kept up with the pace of photovoltaic cost reduction, and the industry's commitment to the 25-year warranty of modules has been increasingly questioned. Whether the outdoor environment can be simulated by an indoor environmental chamber, and whether there is a correlation between the two, have become technical issues that need to be resolved urgently in the development of the photovolt...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05D27/02H02S50/10
CPCG05D27/02H02S50/10Y02E10/50
Inventor 张臻吴晋禄刘志康潘武淳吴军祝曾伟
Owner HOHAI UNIV CHANGZHOU
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