A kind of preparation method of electron microscope sample of flat glass

A technology for flat glass and electron microscope samples, applied in the field of glass, can solve problems such as affecting production cost and efficiency, gas phase defects, defect corrosion damage, etc.

Active Publication Date: 2019-03-12
DONGXU OPTOELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] High-quality display glass has become an important condition for making high-quality displays. However, in the process of glass production, due to process fluctuations or mismatching process conditions, some solid phase (stones, crystallization, unmelted materials, etc.) or gas phase defects will be caused (bubbles), the inclusion of these defects in the glass will affect the quality of the product, and the serious one will make the product discarded
Among such glass defects, needle-shaped platinum defects are particularly difficult to deal with. This defect is caused by the formation of needle-like crystallization or granular crystallization in the molten glass because the platinum material used in the glass melting process dissolves or volatilizes at high temperature. Due to the extremely small size of such defects, it is difficult for online inspectors and inspection equipment to detect them. Once they flow to the client, defective products will be produced in the panel manufacturing process, affecting production costs and efficiency.
Therefore, it is particularly important to eliminate such defects. To solve the problem, we must first understand the problem. For the detection of such defects, scanning electron microscopy is usually used. However, scanning electron microscopy can only test the surface part of the sample. For defects contained in the sample, only Through processing, the defects are exposed to be detected
If this kind of platinum defect is ground and polished by mechanical means, because its size is too small, it is easy to be worn off, and the success rate is too low to be implemented. If it is directly corroded with acid solution, it is easy to corrode and destroy the defect and cannot be observed.

Method used

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  • A kind of preparation method of electron microscope sample of flat glass
  • A kind of preparation method of electron microscope sample of flat glass
  • A kind of preparation method of electron microscope sample of flat glass

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preparation example Construction

[0019] The invention provides a method for preparing an electron microscope sample of flat glass, wherein the flat glass 2 contains platinum crystallization 1, wherein the preparation method comprises:

[0020] S1. Determine the position of the platinum crystallization 1 in the flat glass 2, and mark the two surfaces of the flat glass 2 corresponding to the position as the first marking area 3 and the second marking area 4; determine where the first marking area 3 is located The distance between the surface of the first mark area 3 and the platinum crystallization 1; the distance between the surface of the first marking area 3 and the platinum crystallization 1 is not greater than the distance between the surface of the second marking area 4 and the platinum crystallization 1 ;

[0021] S2, grinding the first marking area 3, so that the first marking area 3 forms a rough surface, and covering the second marking area 4 with an anti-corrosion film 5;

[0022] S3. Etching the fi...

Embodiment 1

[0035] S1. Ultrasonic cleaning and drying the TFT-LCD substrate with platinum crystallization 1 defects inside, and confirming the position of platinum crystallization 1 in the TFT-LCD substrate through microscope observation, and the TFT-LCD substrate corresponding to the position The two surfaces of the two surfaces are respectively marked as the first marking area 3 and the second marking area 4 by drawing a circle with an oil-based marker pen; the distance between the surface where the first marking area 3 is located and the platinum crystallization 1 is determined by microscope observation; the first The distance between the surface where the marking area 3 is located and the platinum crystallization 1 is not greater than the distance between the surface where the second marking area 4 is located and the platinum crystallization 1; according to the first marking area relative to 1mm The distance corrosion time between the surface where 3 is located and the platinum crystal...

Embodiment 2

[0039]S1. Ultrasonic cleaning and drying the OLED device cover glass with platinum crystallization 1 defects inside, and confirming the position of platinum crystallization 1 in the OLED device cover glass through microscope observation, and the OLED device corresponding to the position The two surfaces of the cover glass are respectively marked as the first marking area 3 and the second marking area 4 by drawing lines with an oil-based marker; the distance between the surface where the first marking area 3 is located and the platinum crystallization 1 is determined by microscope observation The distance between the surface where the first marking area 3 is located and the platinum crystallization 1 is not greater than the distance between the surface where the second marking area 4 is located and the platinum crystallization 1; The distance corrosion time between the surface where the marking area 3 is located and the platinum crystallization 1 is 5h, and the time for the plat...

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Abstract

The invention discloses a method for preparing an electron microscope sample of flat glass, wherein the flat glass contains platinum crystallization, wherein the preparation method comprises: S1, determining the position of platinum crystallization in the flat glass, and setting the The two surfaces of the flat glass are respectively marked as a first mark area and a second mark area; determine the distance between the surface where the first mark area is located and the platinum crystallization; S2, polish the first mark area, making the first marking area form a rough surface, and covering the second marking area with an anti-corrosion film; S3, performing acid corrosion on the first marking area formed with a rough surface. The electron microscope sample of the flat glass containing platinum crystallization impurities prepared by the preparation method of the present invention can well protect the platinum crystallization in the flat glass from falling off, so that the platinum crystallization defects in the flat glass are only partially located on the flat glass external.

Description

technical field [0001] The invention relates to the field of glass, in particular to a method for preparing an electron microscope sample of flat glass. Background technique [0002] With the rapid development of flat panel display technology and the rapid popularization of portable electronic products such as notebook computers, tablet computers, smart phones and smart wearable devices, liquid crystal displays play an increasingly important role in them. High-quality liquid crystal display products are more accepted by the market. [0003] High-quality display glass has become an important condition for making high-quality displays. However, in the process of glass production, due to process fluctuations or mismatching process conditions, some solid phase (stones, crystallization, unmelted materials, etc.) or gas phase defects will be caused The generation of (bubbles), the inclusion of these defects in the glass will affect the quality of the product, and in serious cases...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N1/32
CPCG01N1/32
Inventor 王俊峰郑权王丽红闫冬成李俊锋张广涛
Owner DONGXU OPTOELECTRONICS TECH CO LTD
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