Method and device for power integrity testing

Abstract

The invention provides a power source integrity test method and a power source integrity test device. The method comprises the following steps: predetermining a loading voltage, and carrying out such presetting that the output end of a tested circuit is loaded with no load; under a first state in which the output end of the tested circuit is loaded with no load, making the tested circuit powered on; monitoring a first output voltage output by the output end of the tested circuit in real time under the first state; judging whether the first output voltage under the first state is greater than or equal to the loading voltage, and if the first output voltage under the first state is greater than or equal to the loading voltage, loading a target load to the output end of the tested circuit; and monitoring the first output voltage output by the output end of the tested circuit in real time under a second state in which the output end of the tested circuit is loaded with the target load. The invention provides a power source integrity test method and a power source integrity test device, which can reduce the test failure rate of the tested circuit.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a method and device for testing power integrity (Power Integrity Validation, PIV). Background technique [0002] With the vigorous development of technologies such as cloud computing and big data, as the hardware support of these new technologies, servers play an increasingly important role in the Internet field, and at the same time, the requirements for server performance also increase. DC Power (Direct Current Power, DC power supply), as one of the most important hardware parts in the server, is a DC power signal for each circuit module of the entire server motherboard and backplane. [0003] In the prior art, the performance of a DC power supply circuit is tested through a power integrity test. Through the power integrity test, the Overshoot (overshoot) of the electrical signal output by the DC power supply circuit can be tested. Generally speaking, if the overshoot wavefor...

AI Technical Summary

Problems solved by technology

In the power integrity testing scheme of the prior art, when testing the overshoot, the load of the tested DC power supply circuit has a great influence on the output voltage of the DC power supply, so that the waveform of the measured overshoot is not monotonous.

[0004] It can be seen from the above description that when testing the overshoot of the power supply in the prior art, the waveform of the overshoot is often not monotonous, so that the test failure rate of the circuit under test is relatively high.

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