Data-driven flat panel display (FPD) map mark rule check (MRC) device and method
A flat-panel display, data-driven technology, applied in electrical digital data processing, special data processing applications, natural language data processing, etc., can solve the problems of very different command file syntax formats, large workload, and large number of constraints, etc. Achieve efficient writing and maintenance, ensure correct execution, and improve work efficiency
Active Publication Date: 2017-05-17
北京华大九天科技股份有限公司
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Problems solved by technology
[0008] For the flat panel display layout of the existing manufacturing process, such command files have tens of thousands of lines. Although the inspection rules are relatively simple, the number of constraint conditions is too large. Each condition has a command, and the user needs to write in a text editor. Thousands of lines, a huge workload
[0009] In addition, marking rule checking is not as mature as design rule checking, and the standards of different checking tools are different, and the syntax format of command files is very different
Then, if the user purchases multiple marking rule checking tools, it is necessary to maintain multiple sets of command files with different writing styles for the same check, which will increase the workload and cause a high probability of errors in the work.
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[0040] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.
[0041] figure 1 For the data-driven flat panel display layout marking rule checking device architecture diagram according to the present invention, such as figure 1 As shown, the data-driven flat panel display layout marking rule inspection device of the present invention includes a constraint condition table generation module 101, a constraint content generation module 102, an inspection item table generation module 103, an inspection content generation module 104, and a command file The generating module 105, the rule content generating module 106, the layout content generating module 107, and the marking rule checking output module 108, wherein,
[0042] The con...
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Disclosed are data-driven flat panel display (FPD) map mark rule check (MRC) device and method. The data-driven FPD map MRC device comprises a constraint condition table generation module, a constraint content generation module, a check item table generation module, a check content generation module, an order file generation module, a rule content generation module, a map content generation module and a mark rule check output module. The data-driven FPD map MRC method includes the steps of converting a mark constraint database or a spreadsheet into a constraint condition table and generating a check item table; according to the constraint condition table and the check item table, performing layout check and clearance area check; outputting error reports violating check rules. By the arrangement of the device and the method, error probability in FPD map MRC work is greatly reduced, and user productivity can be remarkably improved.
Description
technical field [0001] The invention relates to the technical field of semiconductor integrated circuit design, in particular to a marking rule checking tool for flat panel display layout in semiconductor integrated circuit design. Background technique [0002] Mark Rule Check (MRC) of flat panel display (Flat Panel Display, FPD) layout is similar to design rule check (Design Rule Check, DRC), and is an important part of electronic design automation of flat panel display layout. Design rule checking typically checks for items such as wire width, wire spacing, etc., and the output is a rule-violating design. Before the layout is delivered for tape-out, all designs that violate the rules must be iteratively modified to ensure successful tape-out. [0003] In the prior art, the inspection of Mark Cell instances usually includes the following two items: [0004] 1) Check whether the coordinate range, the number of rows and columns, and the distance between centers of the marke...
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Login to View More IPC IPC(8): G06F17/21G06F17/24G06F17/30
CPCG06F16/258G06F40/117G06F40/177
Inventor于士涛马海南李志梁白丽双
Owner北京华大九天科技股份有限公司