A kind of p-type znmsno amorphous oxide semiconductor thin film and preparation method thereof

A technology of amorphous oxide and amorphous film, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, transistors, etc., to achieve good material properties and promote development

Active Publication Date: 2020-01-17
ZHEJIANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, the currently reported AOS TFTs are all n-type channel, lack of p-type channel AOS TFT, which greatly restricts the application of AOS TFT in new generation display, transparent electronics and many other fields.

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0026] (1) With high-purity ZnO, Cu 2 O and SnO powders were used as raw materials, mixed, ground, and N at 1000 °C 2 Sintering under the atmosphere to make ZnCuSnO ceramic sheet as the target material, in which the atomic ratio of Zn, Cu and Sn is 1:0.2:0.3;

[0027] (2) Using the radio frequency magnetron sputtering method, install the substrate and target in the sputtering reaction chamber, and evacuate to 1×10 - 3 Pa;

[0028] (3) Passing Ar-O 2 It is the working gas, the gas pressure is 1.1Pa, Ar-O 2 The flow volume ratio is 10:2, the sputtering power is 120W, and the substrate temperature is 25°C. 2 Under the bombardment of ions, the atoms and molecules on the surface of the target are sputtered out, and a thin film is deposited on the substrate to obtain p-type ZnCu 0.2 sn 0.3 o 1.4 Amorphous thin film.

[0029] Using quartz as the substrate, p-type ZnCu was prepared according to the above growth steps 0.2 sn 0.3 o 1.4 The film was tested for its structure, ...

Embodiment 2

[0031] (1) With high-purity ZnO, Cu 2 O and SnO powders were used as raw materials, mixed, ground, and N at 1000 °C 2 Sintering under the atmosphere to make ZnCuSnO ceramic sheet as the target material, in which the atomic ratio of Zn, Cu and Sn is 1:0.25:0.4;

[0032] (2) Using the radio frequency magnetron sputtering method, install the substrate and target in the sputtering reaction chamber, and evacuate to 1×10 - 3 Pa;

[0033] (3) Passing Ar-O 2 It is the working gas, the gas pressure is 1.1Pa, Ar-O 2The flow volume ratio is 10:2, the sputtering power is 120W, and the substrate temperature is 150°C. 2 Under the bombardment of ions, the atoms and molecules on the surface of the target are sputtered out, and a thin film is deposited on the substrate to obtain p-type ZnCu 0.25 sn 0.4 o 1.525 Amorphous thin film.

[0034] Using quartz as the substrate, p-type ZnCu was prepared according to the above growth steps 0.25 sn 0.4 o 1.525 The film was tested for its stru...

Embodiment 3

[0036] (1) With high-purity ZnO, Cu 2 O and SnO powders were used as raw materials, mixed, ground, and N at 1000 °C 2 Sintering under the atmosphere to make ZnCuSnO ceramic sheet as the target material, in which the atomic ratio of Zn, Cu and Sn is 1:0.3:0.5;

[0037] (2) Using the radio frequency magnetron sputtering method, install the substrate and target in the sputtering reaction chamber, and evacuate to 1×10 - 3 Pa;

[0038] (3) Passing Ar-O 2 It is the working gas, the gas pressure is 1.2Pa, Ar-O 2 The flow volume ratio is 10:3, the sputtering power is 130W, and the substrate temperature is 300°C. 2 Under the bombardment of ions, the atoms and molecules on the surface of the target are sputtered out, and a thin film is deposited on the substrate to obtain p-type ZnCu 0.3 sn 0.5 o 1.65 Amorphous thin film.

[0039] Using quartz as the substrate, p-type ZnCu was prepared according to the above growth steps 0.3 sn 0.5 o 1.65 The film was tested for its structur...

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Abstract

The invention discloses a p-type ZnMSnO amorphous oxide semiconductor film. The M element in ZnMSnO is a transition metal element, the oxide of the M element is p-type conductive, the M element is one of Cu, Ni, Ag, Au, Fe, Co and Mn elements, and the M element in the ZnMSnO is the lowest valence state of the M element. In the ZnMSnO, Zn is +2 valence state and is the basic element of material; M is the lowest valence state and doped in the base to form p-type conductivity; and Sn is +2 valence state and has a spherical electron orbit and is highly overlapped with electron cloud under the amorphous state so as to realize the effect of a hole transmission channel. The invention also discloses a preparation method of the p-type ZnCuSnO amorphous oxide semiconductor film. A ZnCuSnO ceramic chip acts as target material, a radio frequency magnetron sputtering method is adopted, the hole concentration of the prepared p-type ZnCuSnO amorphous film is 1015-1016cm<-3>, and the visible light transmittance is greater than or equal to 85%. The prepared film can be used for a P-type amorphous film transistor.

Description

technical field [0001] The invention relates to an amorphous oxide semiconductor thin film, in particular to a p-type amorphous oxide semiconductor thin film and a preparation method thereof. Background technique [0002] Thin film transistor (TFT) is one of the core technologies in the field of microelectronics, especially display engineering. At present, TFT is mainly based on amorphous silicon (a-Si) technology, but a-Si TFT is opaque, has strong photosensitivity, and needs to add a mask layer. The pixel aperture ratio of the display screen is low, which limits the display performance. And the mobility of a-Si is low (~2 cm 2 / Vs), cannot meet some application requirements. Although TFT based on polysilicon (p-Si) technology has high mobility, its device uniformity is poor and its fabrication cost is high, which limits its application. In addition, organic semiconductor thin-film transistors (OTFT) have also been studied a lot, but the stability of OTFT is not high, an...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): H01L29/22H01L29/227H01L29/786H01L21/02C23C14/08C23C14/35
CPCC23C14/08C23C14/35H01L21/02554H01L21/02631H01L29/2206H01L29/227H01L29/78693
Inventor吕建国程晓涵叶志镇
OwnerZHEJIANG UNIV