Visible-light optical system for all-view 3D measuring instrument
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HARBIN INST OF TECH
- Publication Date
- 2017-05-31
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of optical imaging, and relates to a visible light optical system used for a full-view three-dimensional measuring instrument. Background technique
[0002] The fully automatic image measuring instrument can perform three-dimensional coordinate measurement conveniently and quickly, meeting the requirements of higher speed, more convenient and more accurate measurement for size detection proposed by the modern manufacturing industry. It is a bottleneck technology to solve the development of the manufacturing industry. The full-view high-precision three-dimensional measuring instrument is a precision angle measurement and positioning system with a large field of view, high resolution, and a large working distance range. Its angle measurement accuracy requires second-level accuracy. As one of the key core components of the system, the optical system mainly undertakes the important task of collecting target info...