Method and system for measuring chopping delay of switching Hall sensor

A Hall sensor and measurement method technology, applied in the field of sensors, can solve the problems of slowly changing magnetic field strength, single test method of switch-type Hall sensor, and difficult to directly test and obtain, and achieve simple measurement steps, low cost of hardware equipment, and difficult Directly Measured Effects

Active Publication Date: 2019-09-20
SHANGHAI MAIGEEN MICROELECTRONICS CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When this VOUT signal is used to control the rotation of the motor, the random reversal of VOUT will greatly reduce the control efficiency of the motor and limit the overall performance of the motor.
[0006] The existing switch-type Hall sensor test method is relatively simple: put the sensor in a static magnetic field environment, slowly change the magnetic field strength, and record the magnetic field strength when VOUT changes from high level to low level as BOP; The magnetic field strength when leveling to high level is BRP
Since the chopping delay involves the sampling signal of the internal circuit of the sensor, it is not easy to directly test and obtain, so there is no effective test method for the chopping delay

Method used

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  • Method and system for measuring chopping delay of switching Hall sensor
  • Method and system for measuring chopping delay of switching Hall sensor
  • Method and system for measuring chopping delay of switching Hall sensor

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Experimental program
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Embodiment 1

[0039] see figure 1 , the present invention discloses a method and system for measuring chopping delay of a switch-type Hall sensor. By placing a switch-type Hall sensor in a periodically changing magnetic field and observing the afterglow of the output signal of the sensor with an oscilloscope, the chopping delay can be indirectly measured. wave delay. Persistence display is a general display function of the oscilloscope, which can keep the waveform light spots on the oscilloscope display for a period of time.

[0040] test system such as Figure 4 As shown, it includes a device 100 capable of generating a periodically varying magnetic field, a DC power supply 200 , an oscilloscope 300 and a switch-type Hall sensor 400 to be tested. The switch-type Hall sensor includes at least 3 pins, which are power supply VCC, ground GND and output VOUT. Where VCC is connected to the positive output terminal of the DC power supply; GND is connected to the ground terminal of the DC power...

Embodiment 2

[0047] The difference between this embodiment and Embodiment 1 is that in this embodiment, step 1 is the same as step 2 and the first embodiment, and step 3 can be replaced with a falling edge trigger to observe the afterglow of the next rising edge, namely:

[0048] Step 3: Set the oscilloscope to trigger mode, use Figure 5 The falling edge of the middle square wave is used as the trigger edge, and at the same time turn on the afterglow display function of the oscilloscope. waveform like Figure 7 shown. Among them, BX is the ambient magnetic field strength, which decreases monotonically in this experiment; BRP is the threshold value of the magnetic release point, which is a constant value; BX is greater than BRP at the initial time, and will be less than BOP at the final time; the sensor output waveform displayed on the oscilloscope is VOUT. In the VOUT waveform, R is the falling edge used for triggering. After a period of time, VOUT will have a rising edge. According to ...

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Abstract

The invention discloses a switch hall sensor chopped wave delay measuring method, which comprises the following steps of supplying electricity to a magnetic ring so that the magnetic ring starts to rotate; a direct current power supply supplies electricity to a hall sensor; an oscilloscope is started; the waveform of an output signal VOUT is observed; the VOUT waveform is a square wave of one random period; the oscilloscope is set into a triggering mode; the square wave rise edge is used as the triggering edge; meanwhile, the afterglow display function of the oscilloscope is started; the afterglow display function is started, so that the falling edges are all displayed on a screen of the oscilloscope to form the belt afterglow; if the rotating period and the chopped wave sampling period of the magnetic ring just have the integral multiple relationship, the falling edges can occur in the fixed positions, so that the rotating speed of the magnetic ring needs to be regulated, and the afterglow width of the falling edge reaches the maximum; at the moment, the falling edge afterglow width of the sensor output waveform is measured; the time difference of the earliest falling edge and the latest falling edge is the chopped wave delay TCD. The method provided by the invention has the advantages that the hardware equipment cost can be reduced; the measurement steps are simple and easy.

Description

technical field [0001] The invention belongs to the technical field of sensors, and relates to a Hall sensor, in particular to a method for measuring a chopping delay of a switch-type Hall sensor; meanwhile, the invention also relates to a system for measuring the chopping delay of a switch-type Hall sensor. Background technique [0002] Hall sensor is a kind of magnetic sensor made according to Hall effect. Hall sensors are divided into two categories: switching Hall sensors and linear Hall sensors. Among them, the switch-type Hall sensor can realize distance detection, speed detection and other functions, and is widely used in the fields of industrial control, detection technology and information processing, especially in applications such as DC brushless motors, switch-type Hall sensor is its core components, the market demand is huge. [0003] The working characteristics of the switching Hall sensor are as follows: figure 1 shown. The abscissa indicates the magnetic ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01D18/00
Inventor 陈志卿
Owner SHANGHAI MAIGEEN MICROELECTRONICS CO LTD
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