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Electronic product appearance surface defect detecting device and detecting method

A technology for electronic products and defect detection, applied in the direction of measuring devices, optical testing of flaws/defects, material analysis through optical means, etc., to achieve the effect of uniform illumination

Pending Publication Date: 2017-05-31
XIJING UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, there are many surface defect detectors on the market, but they have the following problems: 1) The imaging problem of electronic products of different materials needs to clearly show the defects on the surface of electronic products, and at the same time, it is necessary to avoid the influence of sandblasting particles on the detection, and the minimum defect detection accuracy 0.007mm; 2) The size of the detection object is 4.5 inches and 5.0 inches, and a system needs to be solved to solve the problem of high-precision detection of two sizes; 3) The detection mobile phone shell will contain two materials in one image, and different materials need to be solved Imaging problem; 4) The detection of the mobile phone shell is a comprehensive appearance defect detection, and its outer surface is an arc edge, and the arc edge imaging problem needs to be solved; 5) The same defect in this inspection will be divided into NG and OK, general NG, and There are three types of serious NG, and it is necessary to comprehensively detect three types of defects; 6) The detection needs to solve the relevant needs, how to quickly increase the corresponding processing algorithm modules, and shorten the development cycle; 7) The detection needs to solve multiple types in an image The problem of one-time detection of defects

Method used

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  • Electronic product appearance surface defect detecting device and detecting method
  • Electronic product appearance surface defect detecting device and detecting method

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Embodiment

[0052] 1) This time I chose a telecentric lens with a telecentricity less than 0.06 and a distortion less than 0.08%, a 3000W CCD camera with a resolution of 6576x4384, a minimum pixel size of 5.5 μm, and an accuracy of 0.007 with 1 / 2 sub-pixel mm. At the same time, in the combined lighting system, red light with a wavelength of 700nm is used as the main lighting source. According to the light wave characteristics in the wave-particle duality of light, the small gaps between sandblasting particles can be effectively avoided, and at the same time, small defects can be identified. can be imaged.

[0053] 2) A multi-station solution is adopted for large-format detection, as shown in Figure (2) for the division of 5.5-foot mobile phone stations; first take pictures of the Zone1 area, and during the process of image processing, the device moves to the Zone2 area at the same time, and again It takes pictures and detects in turn to complete the detection of the entire mobile phone. ...

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Abstract

The invention discloses an electronic product appearance surface defect detecting device and a detecting method. The electronic product appearance surface defect detecting device comprises a detecting object shell; a high-precision CCD (Charge Coupled Device) camera is arranged at the upper end of a dual-telephoto lens; a combination lighting system coaxial light source is arranged at the lower end of the dual-telephoto lens; a combination lighting system sphere integral light source is arranged at the lower end of the combination lighting system coaxial light source; the detecting object shell is placed in the combination lighting system coaxial light source; the technologies of CCD image acquiring, optical lighting, image processing and surface defect detecting are involved; the detecting device and the detecting method are mainly used for solving the problem about detection of metal material electronic product appearance and surface defects; firstly, appearance imaging is performed through a machine vision acquisition system, and secondly, corresponding software algorithm processing are performed on images; the problem that the defects are difficult to detect can be solved well through an image acquisition method and a novel image processing mode.

Description

technical field [0001] The invention belongs to the technical field of surface inspection, and in particular relates to an electronic product appearance surface defect inspection device and a inspection method thereof. Background technique [0002] At present, there are many surface defect detectors on the market, but they have the following problems: 1) The imaging problem of electronic products of different materials needs to clearly show the defects on the surface of electronic products, and at the same time, it is necessary to avoid the influence of sandblasting particles on the detection, and the minimum defect detection accuracy 0.007mm; 2) The size of the detection object is 4.5 inches and 5.0 inches, and a system needs to be solved to solve the problem of high-precision detection of two sizes; 3) The detection mobile phone shell will contain two materials in one image, and different materials need to be solved Imaging problem; 4) The detection of the mobile phone she...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
CPCG01N21/8851G01N2021/8887
Inventor 刘哲于涛杨飞飞
Owner XIJING UNIV