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Testing method and device for oscilloscope

A test method and test device technology, applied in the test field, can solve problems such as data misrecording, troublesome data recording and analysis, lack of oscilloscope to analyze whether the data is abnormal, etc., and achieve the effect of improving efficiency and quality

Active Publication Date: 2017-05-31
GUANGZHOU SHIYUAN ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The conventional oscilloscope test method is to manually record the measured values ​​into the table one by one after the oscilloscope captures the signal. Since there are generally many signal test points, the manual method is inefficient, and it is easy to manually record the data incorrectly when the workload is heavy, resulting in low test quality. At the same time, the oscilloscope also lacks the function of analyzing whether the data is abnormal
When there are too many test parameters, data recording and analysis become troublesome

Method used

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  • Testing method and device for oscilloscope

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0014] figure 1 It is a flowchart of a test method for an oscilloscope provided in Embodiment 1 of the present invention. This embodiment is applicable to the measurement of an oscilloscope. The method can be performed by a test device for an oscilloscope. The device can be implemented by software and / or hardware This device can be integrated into any device that provides data processing, such as a typical user terminal device, such as a desktop computer or a tablet computer. The method includes:

[0015] S101. Invoking a test case of a signal to be tested, where the test case includes test information and measurement parameters required for testing.

[0016] A test case is a set of test inputs, execution conditions, and expected results compiled for testing hardware, so as to test whether a circuit or chip meets a specific function, such as an EXCEL test case embedded with a software function for automatically collecting signal measurement data, through the test case It can...

Embodiment 2

[0028] figure 2 It is a flow chart of a test method for an oscilloscope provided in Embodiment 2 of the present invention. Embodiment 2 is based on the above-mentioned embodiment, and the step of obtaining the measurement data obtained by the oscilloscope according to the test information in Embodiment 1, The optimization is to obtain the signal waveform measured by the oscilloscope according to the test information, collect corresponding measurement data from the signal waveform, and confirm that the signal is abnormal if the signal waveform is inconsistent with the preset waveform.

[0029] The testing method for an oscilloscope provided in this embodiment includes the following steps: step S201, step S202, step S203, step S204 and step S205. Wherein, step S201 is the same as step S101 in the first embodiment, step S204 is the same as step S103 in the first embodiment, step S205 is the same as step S104 in the first embodiment, and the same steps will not be repeated.

[0...

Embodiment 3

[0039] image 3 It is a flow chart of the test method for an oscilloscope provided by Embodiment 3 of the present invention. Embodiment 3 is based on Embodiment 1, adding a step of storing test results with normal test parameters and / or test results with abnormal test parameters.

[0040] The testing method for an oscilloscope provided in this embodiment includes the following steps: step S301, step S302, step S303, step S304 and step S305. Wherein, steps S301 , S302 , S303 and S304 are respectively the same as steps S101 , S102 , S103 and S104 in Embodiment 1, and the same steps will not be repeated here.

[0041] S301. Invoking a test case of a signal to be tested, where the test case includes test information and measurement parameters required for testing.

[0042] S302. Obtain measurement data measured by the oscilloscope according to the test information.

[0043] S303. Extract a measurement value corresponding to the measurement parameter from the measurement data.

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Abstract

The embodiment of the invention discloses a testing method and device for an oscilloscope. The method comprises the steps: carrying out the call of a test case of a to-be-tested signal, wherein the test case comprises test information and parameters needed during testing; obtaining the measurement data obtained by the oscilloscope according to the test information; extracting a measurement value corresponding to the measurement parameters from the measurement data; obtaining a normal test result of the test parameters if the measurement value is within a threshold range corresponding to the measurement parameters; and obtaining an abnormal test result of the test parameters if the measurement value is not within the threshold range corresponding to the measurement parameters. According to the invention, the test information is set through the test case, the test parameters are automatically collected and the correctness of the test parameters is judged, thereby enabling the test content and sequence to be adjusted flexibly, and improving the test efficiency and quality of the oscilloscope.

Description

technical field [0001] Embodiments of the present invention relate to testing technologies, and in particular to a testing method and device for an oscilloscope. Background technique [0002] In the process of using an oscilloscope to test the signal of a circuit or chip, it is necessary to record the data and waveform diagrams of each test parameter, and analyze the measurement results. [0003] The conventional oscilloscope test method is to manually record the measured values ​​into the table one by one after the oscilloscope captures the signal. Since there are generally many signal test points, the manual method is inefficient, and it is easy to manually record the data incorrectly when the workload is heavy, resulting in low test quality. At the same time, the oscilloscope also lacks the function of analyzing whether the data is abnormal. When there are too many test parameters, data recording and analysis become troublesome. Contents of the invention [0004] Embo...

Claims

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Application Information

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IPC IPC(8): G01R13/00
CPCG01R13/00
Inventor 梁波
Owner GUANGZHOU SHIYUAN ELECTRONICS CO LTD