Product
Patsnap Eureka
For R&D, Patsnap Eureka makes reading and utilizing patents & technical documents easy.
Patsnap Eureka AIR
Designed for self-driven R&D workflows. Generate viable solutions, solve complex R&D challenges, empower your innovation with AI.
Patsnap Eureka Materials
Designed for material experts only. Revolutionize your material R&D, from search, analyze, to developing new materials.
Feature
TechResearch
Generate reliable direction feasibility study reports for your R&D in just a few steps.
TechSeek
Discover and master advanced knowledge NOW. Basics, ideas, possibilities, all at once.
TechMind
As an expert in R&D Theories, TechMind can generates customized viable solutions instantly.
TechRisk
Analyze your overall solution with one click, know your potential R&D risks in advance.
TechMonitor
Get weekly tech updates, stay abreast of the latest tech innovations and key insights.
Patents
Literature
Hiro is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
38 results about "Abnormal test result" patented technology
Efficacy Topic
Property
Owner
Technical Advancement
Application Domain
Technology Topic
Technology Field Word
Patent Country/Region
Patent Type
Patent Status
Application Year
Inventor
A positive test is one in which the result of the test is abnormal; a negative test is one in which the test’s result is normal. A problem with this way of teaching about the value of test results is that often physicians and patients think there are only two possible test results, normal or not.
Combined cell phone and medical monitoring apparatus
InactiveUS20080070599A1The result is accurateEasily identifiableEvaluation of blood vesselsSensorsComputer hardwareMedical equipment
The present invention discloses an apparatus that combines a cellular phone or other wireless device with one or more medical monitoring devices, wherein the two devices share a single housing, power source, display, memory chip and data processor. The apparatus is capable of functioning as a separate medical apparatus and a normal cellular phone and addresses the need for combining multi-function portable medical testing and condition indicator devices into a device that is already carried by the majority of the population. The preferred embodiment of the invention combines a portable device of blood glucose monitoring with a cellular phone and is capable of audibly alerting the user of abnormal test results and storing multiple test results for monitoring and managing chronic conditions. In addition the apparatus is capable of storing and transmitting medical information to healthcare providers or emergency responders if highly abnormal results are obtained.
Owner:APODACA JENNIFER +1
Intelligent test system and test method for improving probe card test abnormality
InactiveCN103439643AReduce consumptionGuaranteed contact effectElectronic circuit testingWire rodProbe card
The invention discloses an intelligent test system for improving probe card test abnormality. The intelligent test system is applied to a test of chip parameters and comprises a testing machine stand provided with a probe card. The intelligent test system further comprises a target parameter normal value setting device, a judging device, a test result output device and a test control device. The invention further discloses a test method for improving the probe card test abnormality. The method further includes the following steps of target parameter normal value setting, testing and controlling, judging, test result outputting and repeated testing and controlling. According to the intelligent test system and the test method for improving the probe card test abnormality, through repeated probing, testing and parameter range judging, consumption of the probe card is effectively reduced, the contact capacity of the probe card is guaranteed, wire rod aging of the probe card is controlled, therefore, the problem that due to the probe card test abnormality, chip parameter test results are abnormal is improved, and the qualified rate of chip testing is improved.
Owner:SHANGHAI HUALI MICROELECTRONICS CORP
Method and system for testing communication module on embedded printed circuit board assembly (PCBA)
ActiveCN103293466AImprove test efficiencyIncrease productivityElectronic circuit testingTransmission monitoringTest efficiencyMemory interface
The invention provides a method and system for testing a communication module on an embedded printed circuit board assembly (PCBA). The fast testing method includes the following steps: scanning a pluggable storage in a storage interface on the PCBA; loading testing codes pre-stored in the pluggable storage, and testing the communication module; if the testing result is normal, driving a prompting device on the PCBA to send normal prompting information, and if the testing result is abnormal, driving the prompting device on the PCBA to send abnormal prompting information. By using the embedded PCBA to load the testing codes of the pluggable storage to conduct communication module testing, quality of the surface mount technology (SMT) of the communication module can be tested fast, the testing result can be observed directly, testing efficiency is greatly improved, and hardware guarantee is provided for follow-up normal work of a whole machine.
Owner:FUZHOU ROCKCHIP SEMICON
Application testing method and testing device
InactiveCN107967214AReduce testing labor costsEliminate the effects ofSoftware testing/debuggingTest efficiencyTest scene
The invention discloses an application program testing method and testing equipment. The method includes: setting up a test network; in the test network, performing a corresponding test operation through a target application program according to a preset test scene to obtain a corresponding test result; When the test result meets the test exception condition corresponding to the test scenario, a corresponding repair operation is performed on the target application program; after the repair operation is performed, a corresponding verification operation is performed on the target application program to obtain the repair result. According to the present invention, application program test automation in a weak network environment can be implemented, and labor costs for testing can be saved. In addition, it can automatically eliminate the impact of abnormal test results on subsequent tests and improve test efficiency. Verify the robustness and maintainability of the target application.
Owner:BEIJING MOBIKE TECH CO LTD
Method and system for testing swinging cross or breaking of multi-core cable
InactiveCN102854430AImprove test efficiencyReduce the number of testsElectrical testingTest channelMulticore cable
The invention discloses a method and a system for testing swinging cross or breaking of a multi-core cable. The method includes the steps of A, selecting a one cable core of a tested cable and performing a continuity test by respectively connecting two ends of the cable core on a testing channel of a continuity tester; B, selecting another cable core and repeating the step A until continuity tests for all cable cores are finished; C, selecting one pair of cable cores of the tested cable and respectively connecting one ends thereof on a test channel of a capacitance unbalance tester to test capacitance difference of the pair of the cable cores relative to other cable cores and a metal sheath; D, selecting another pair of cable cores and repeating the step C until all capacitance unbalance tests for the cable cores are finished; E, selecting cable core pairs with abnormal test results obtained in the step C and the step D, combining the cable cores two by two, respectively connecting one ends on the continuity tester to finish the continuity test between two random cable cores, obtaining result of the swinging cross, and then recording the result.
Owner:SHANGHAI ELECTRIC CABLE RES INST +1
Automatic testing method and system for PCBA
InactiveCN104881344AEasy to testImprove test efficiencyFunctional testingTest efficiencyMemory interface
The invention discloses an automatic testing method for a PCBA. The method comprises the steps that whether a storage interface on the PCBA is connected with a pluggable storage or not is tested; if the storage interface is connected with the pluggable storage, multiple testing programs pre-stored in the pluggable storage are loaded, and testing is conducted on each to-be-tested function module of the PCBA respectively; if a testing result is normal, prompt equipment of the PCBA is controlled to send a normal prompt message, and if the testing result is abnormal, the prompt equipment is controlled to send an abnormal prompt message. The invention further discloses an automatic testing system for the PCBA. By adopting the automatic testing method and system for the PCBA, all to-be-tested function modules of the PCBA can be convenient to test, and the testing efficiency is improved.
Owner:SHENZHEN CHUANGWEI ELECTRONICS APPLIANCE TECH
Visual testing method and device
InactiveCN109542786AReduce communication costsImprove development efficiencySoftware testing/debuggingAutoanalysisSoftware engineering
The visual testing method and the device are provided. The method includes: acquiring the dependency package corresponding to the external interface of the service system, and parsing the dependency package to obtain the request parameters of the external interface of the service system. The request parameters are displayed through a display interface. The tester configures the request parametersthrough the display interface, and submits the configured parameters to the business system after generalization processing. The request return result of the business system pair is automatically analyzed and a corresponding test report is generated, and the abnormal test result is assigned to a corresponding developer. At that same time, when a plurality of service system exist, the visual testing method and device can t the plurality of service systems simultaneously. The visual testing method and device provided by the present application reduce the communication cost between testers and developers in the use process, and greatly improve the development efficiency.
Owner:BEIJING QDING INTERCONNECTION TECHNOLOGY CO LTD
Method for controlling high-temperature test needle mark of wafer
ActiveCN104655883AElectrical measurement instrument detailsIndividual semiconductor device testingEngineeringHigh heat
The invention provides a method for controlling a high-temperature test needle mark of a wafer. The method comprises the following steps: a loading step: loading to a wafer to be tested into a slide holder; a delaying step: delaying a certain time before the wafer to be tested is tested; a data updating and collecting step: updating and collecting data of the wafer to be tested; a testing step: testing the wafer to be tested. The method provided by the invention has the benefit that a needle mark effect and quality accidents such as abnormal test result of the wafer and the loss of the wafer, which are caused by the fact that the precision is changed as the parts of a probe table are deformed due to the change of temperature, are avoided.
Owner:浙江确安科技有限公司
Automatic performance testing method, device and system
ActiveCN107992362AImprove turnover efficiencyIncrease usageResource allocationFunctional testingResource poolRelease press
The invention provides an automatic performance testing method, device and system which can avoid the idle occupation of presses and increase the CPU (central processing unit) utilization rate of a press cluster. The method comprises the following steps of: adding the presses into a resource pool, adding test tasks into a task queue and obtaining the number of the presses required for each test task; selecting the test tasks from the task queue as to-be-tested tasks according to a scheduling strategy, selecting the presses with the corresponding number from the resource pool, assigning to theto-be-tested tasks and carrying out performance testing on the to-be-tested tasks; and after the performance testing is completed, releasing the presses, analyzing results of the performance testing,if the results of the performance testing are normal, completing the to-be-tested tasks and if the results of the performance testing are abnormal, re-adding the to-be-tested tasks after being subjected to script debugging into the task queue and waiting for execution, wherein in the process of carrying out the performance testing on the to-be-tested tasks, the executive condition is monitored inreal time.
Owner:BEIJING JINGDONG SHANGKE INFORMATION TECH CO LTD +1
Method for diagnosing impact on metallic oxide arrester electrification test from inter-phase interference
ActiveCN103176083AShorten power outage maintenance timeAvoid misjudgmentVoltage-current phase angleElectrical testingPower flowDiagnosis methods
The invention discloses a method for diagnosing an impact on a metallic oxide arrester electrification test from inter-phase interference. The method includes: acquiring instantaneous voltage values at various sampling times from leads on high-voltages sides of an A-phase metallic oxide arrester and a C-phase metallic oxide arrester, calculating phase angles of instantaneous voltage via the Fourier algorithm, acquiring instantaneous leakage current values at various sampling times from grounding down leads of the A-phase metallic oxide arrester and the C-phase metallic oxide arrester, separating resistive current from instantaneous leakage current, calculating a phase angle of the resistive current via the Fourier algorithm, calculating an interference coefficient, and diagnosing by comparing the interference coefficient with a setting valve. By the method, the impact on the metallic oxide arrester electrification test from the inter-phase interference is accurately diagnosed, if any inter-phase interference leads a metallic oxide arrester electrification test result to be abnormal, the diagnosing result can provide powerful reference to testing workers for accurately analyzing insulating performance of the metallic oxide arresters, and testing workers' judgment error caused by the abnormal testing result due to the inter-phase interference can be effectively avoided.
Owner:STATE GRID FUJIAN ELECTRIC POWER CO LTD +2
Method and system for testing Modem module on embedded PCBA (Printed Circuit Board Assembly)
ActiveCN103336241AImprove test efficiencyIncrease productivityElectrical testingTest efficiencyModem device
The invention provides a method and system for testing a Modem module on an embedded PCBA (Printed Circuit Board Assembly). The quick test method comprises the following steps: scanning a pluggable memory in a memory interface of the PCBA; loading a test code pre-stored in the pluggable memory and testing the Modem module; driving prompting equipment on the PCBA to send normal prompting information if the result of the test is normal, otherwise, driving the prompting equipment on the PCBA to send abnormal prompting information. By utilizing the embedded PCBA to load the test code of the pluggable memory to perform a test to the Modem module, the quality of an SMT (Surface-mount Technology) of the Modem module can be quickly tested, and the result of the test can be visually observed, as a result, test efficiency is greatly improved, and a hardware guarantee is provided for the following normal working of the whole machine.
Owner:FUZHOU ROCKCHIP SEMICON
Packaging test method
ActiveCN103730376AIncrease elasticitySimple processSemiconductor/solid-state device testing/measurementSemiconductor/solid-state device manufacturingProbe cardSemiconductor package
The invention discloses a packaging test method. The packaging test method includes the following steps that a semiconductor packaging unit is provided, wherein the semiconductor packaging unit comprises a packaging adhesive body, a lead frame and a plurality of cutting lines, and a plurality of semiconductor packaging components are defined by the cutting lines on the semiconductor packaging unit and are respectively provided with a plurality of external connection terminals; the lead frame is cut along the cutting lines to electrically insulate the semiconductor packaging components; the semiconductor packaging unit is placed on a bearing wafer; a probe card is made close to the semiconductor packaging unit placed on the bearing wafer and a plurality of probe terminals of the probe card are made to make contact with the external connection terminals respectively so that the semiconductor packaging components can be tested; semiconductor packaging components with abnormal test results are marked; the semiconductor packaging components are made monomeric, and the semiconductor packaging components marked as abnormal are removed.
Owner:WINBOND ELECTRONICS CORP
Automatic data processing method and device, electronic equipment and storage medium
ActiveCN110334008AImprove test efficiencyLow costSoftware testing/debuggingAutomatic Data ProcessingTest efficiency
The invention relates to the technical field of automatic test tools, and discloses an automatic data processing method and device, electronic equipment and a storage medium. The automatic data processing method comprises the steps: detecting a data type of test data; when the set timing test task is triggered, starting a timer; and submitting the to-be-tested data to a bank system corresponding to the data type of the to-be-tested data for test processing, and obtaining a test result corresponding to the to-be-tested data, synchronizing the test result to a feeding system, setting the test result of which the test processing duration exceeds a preset processing duration as an abnormal test result, and pushing the abnormal test result and the to-be-tested data corresponding to the abnormaltest result to an administrator. By directly submitting the test data to the bank system, the data test is completed without an interactive system, and the data test efficiency is improved, and the data test cost is reduced.
Owner:PINGAN PUHUI ENTERPRISE MANAGEMENT CO LTD
Wireless signal interference monitoring method, system and device
InactiveCN108599879ASolve the real-time monitoringSolve analysisTransmission monitoringWireless communicationFrequency spectrumCenter frequency
The invention discloses a wireless signal interference monitoring method, system and device, and the method comprises the steps: receiving a radio frequency signal through a high-gain full-band antenna; dividing the radio frequency signal into a plurality of narrow band signals corresponding to the pass bands of band-pass filters through the band-pass filters, wherein the central frequencies of the band-pass filter are uniformly distributed from the low to the high, and are in pass-band seamless connection; generating corresponding narrow band spectrum data after I / Q signal conversion, FFT processing and time identification processing, synthesizing the data to form a full-band spectrum, and storing the full-band spectrum in a computer platform. When there is a testing result abnormality ina production testing process, the corresponding spectrum data is extracted according to the testing time, and is used for the backspacing analysis of the signal interference during testing. The method achieves the real-time monitoring and analysis of the interference signal through the full-band spectrum formed by the synthesizing of the narrow band spectrums, effectively solves a problem of real-time monitoring and analysis of an interference signal in a production line test in real time, improves the accuracy of a testing result, and reduces the production cost.
Owner:北京为准智能科技有限公司
Method and system for testing GPS (global position system) module on embedded PCBA (printed circuit board assembly)
ActiveCN103324571AImprove test efficiencyIncrease productivitySoftware testing/debuggingTest efficiencyMemory interface
The invention provides a method and a system for testing a GPS (global position system) module on an embedded PCBA (printed circuit board assembly). The quick testing method includes the following steps: scanning a pluggable storage in a storage port on the PCBA, loading a pre-stored testing code in the pluggable storage, testing the GPS module, if a testing result is normal, driving a prompt device on the PCBA to send out normal prompt information, and if the testing result is abnormal, driving the prompt device on the PCBA to send out abnormal prompt information. The embedded PCBA loads the test code of the pluggable storage to perform a GPS module test, SMT (surface mount technology) of the GPS module can be quickly tested to be good or not, the test result can be read visually, testing efficiency is greatly improved, and hardware guarantee is provided to follow-up normal operation of the whole set.
Owner:FUZHOU ROCKCHIP SEMICON
Test result inspection method and apparatus, computer device and storage medium
The application relates to a test result inspection method and apparatus, a computer device and a storage medium. The method includes: acquiring a test result, being a completion condition of all testitems corresponding to the sample, of a test item of a to-be-tested sample; and according to an uncompleted test item in the test result, generating uncompleted prompting information of the test item. With the provided method, the test result corresponding to the test information is detected and alarm information is generated for the test item corresponding to the abnormal test result; and a testresult of the test item corresponding to the abnormal test result is quickly located.
Owner:SHENZHEN YHLO BIOTECH
Method for automatically detecting defects of dynamic logo
ActiveCN110108448AReduce labor costsImprove test efficiencyTesting electric installations on transportOptical apparatus testingTest efficiencyGamut
The invention discloses a method for automatically detecting defects of a dynamic logo. The method comprises that following steps that: step one, a to-be-detected prototype is electrified and a dynamic logo is played; step two, according to a frame rate of dynamic logo playing, a camera is set to be at a corresponding frame rate to carry out image information collection and storage; and step three, the stored image information is read and frame-by-frame analysis is carried out on the collected image; to be specific, the image analysis includes: reading the image and acquiring a colour gamut ofthe image; distinguishing the image type being one of a non-logo image, a dynamic logo image, and a static logo image based on the colour gamut proportion; analyzing the colour gamut of the image, carrying out color gamut difference comparison to determine a result; to be specific, carrying out image stuck defect analysis and splash screen defect analysis on a dynamic logo image and then carryingout splash screen defect analysis on the static logo image; and then returning a test result and storing correspondingly collected image information in an abnormal state of the test result. Therefore, automatic detection of the dynamic logo is realized; the product quality is guaranteed; and the test efficiency is improved.
Owner:HUIZHOU DESAY SV INTELLIGENT TRANSPORTATION TECH INST CO LTD
Diagnosis method for the influence of interphase interference on the live test of metal oxide arresters
ActiveCN103176083BShorten power outage maintenance timeAvoid misjudgmentVoltage-current phase angleElectrical testingEngineeringMetal oxide surge arrester
Owner:STATE GRID FUJIAN ELECTRIC POWER CO LTD +2
Porosity gas tester
The invention discloses a gas-state tester of porosity. The gas-state tester comprises a cabinet body and a cabinet door. The cabinet door can close the cabinet body, at least one support plate used for placing a test plate is arranged in the cabinet body at intervals, a plurality of air vents are arranged on the support plate, a liquid storage container used for placing volatile acid liquid for tests is arranged in the cabinet body, a timer and an alarm are installed on the cabinet body, and the timer is electrically connected with the alarm. After a test finishes, the timer can control the alarm to send out alarming sound and red light to prompt testing staff that the test is finished. The tester avoids test result abnormality caused by the fact that the testing staff forgets to take the test plate.
Owner:竞陆电子(昆山)有限公司
A method for controlling needle marks in wafer high temperature testing
ActiveCN104655883BElectronic circuit testingElectrical measurement instrument detailsTemperature controlEngineering
The present invention provides a method for controlling needle marks in wafer high-temperature testing. The following steps are performed in sequence: a loading step, loading the wafer to be tested into a loading table, and a delaying step, before testing the wafer to be tested, Delay for a certain time, update and collect data step, update and collect the data of the wafer to be tested, test step, test the wafer to be tested. The effect of the present invention is to avoid the precision change after the deformation of each part of the probe station caused by the temperature change, thereby causing the needle mark effect and the resulting quality accidents such as abnormal wafer test results and wafer loss.
Owner:浙江确安科技有限公司
Method for testing and upgrading product with network communication function suitable for factory
PendingCN113127040ASolve production data changesImprove upgrade efficiencySoftware testing/debuggingDigital data authenticationEngineeringNetwork communication
The invention relates to a method for testing and upgrading a product with a network communication function suitable for a factory, which comprises a controller, a terminal device and a communication management device which communicate with one another, wherein the communication management device is provided with an interface supporting a third-party production management system. During implementation, product shipment firmware is separated from test firmware, so that the problem of production material change caused by frequent firmware updating is thoroughly solved. Large-batch parallel firmware upgrading can be achieved, so that the upgrading efficiency is improved. Product default parameters can be set in batches, and the setting efficiency in the production period is improved. Batch system integration testing can be carried out, a testing result can be reported to a server, and abnormity can be checked in time. Abnormal indexes are obtained through intelligent calculation, abnormal test results are analyzed, environment abnormity of the test equipment is intelligently calculated, a calibration notification is sent, and maintenance is convenient.
Owner:苏州硕实电子科技有限公司
A 5G base station service fault finding method and device
ActiveCN110708715BTimely processingRapid positioningWireless communicationIp addressFault occurrence
The invention discloses a 5G base station service fault finding method and device. The method includes: obtaining topology data according to the IP address information of the 5G base station to be detected; , the first core device, and the second core device; check whether the downlink port of the access device is normal, and if normal, perform the first ping test on the convergence device; determine whether the ping test result to the convergence device is normal, and if normal, proceed to Use the convergence device, the first core device, and the second core device to perform a second ping test on the 5G base station. During this process, if the result of the second ping test is abnormal, determine the device corresponding to the abnormal test result Or the connection line is the node where the fault occurs. The invention can quickly and accurately locate the node where the fault occurs, saves time and effort, and can ensure that the fault is dealt with in time.
Owner:CHINA UNITECHS
A method and system for testing GPS module on embedded PCBA
ActiveCN103324571BImprove test efficiencyIncrease productivitySoftware testing/debuggingTest efficiencyMemory interface
The invention provides a method and a system for testing a GPS (global position system) module on an embedded PCBA (printed circuit board assembly). The quick testing method includes the following steps: scanning a pluggable storage in a storage port on the PCBA, loading a pre-stored testing code in the pluggable storage, testing the GPS module, if a testing result is normal, driving a prompt device on the PCBA to send out normal prompt information, and if the testing result is abnormal, driving the prompt device on the PCBA to send out abnormal prompt information. The embedded PCBA loads the test code of the pluggable storage to perform a GPS module test, SMT (surface mount technology) of the GPS module can be quickly tested to be good or not, the test result can be read visually, testing efficiency is greatly improved, and hardware guarantee is provided to follow-up normal operation of the whole set.
Owner:FUZHOU ROCKCHIP SEMICON
Gas-state tester of porosity
The invention discloses a gas-state tester of porosity. The gas-state tester comprises a cabinet body and a cabinet door. The cabinet door can close the cabinet body, at least one support plate used for placing a test plate is arranged in the cabinet body at intervals, a plurality of air vents are arranged on the support plate, a liquid storage container used for placing volatile acid liquid for tests is arranged in the cabinet body, a timer and an alarm are installed on the cabinet body, and the timer is electrically connected with the alarm. After a test finishes, the timer can control the alarm to send out alarming sound and red light to prompt testing staff that the test is finished. The tester avoids test result abnormality caused by the fact that the testing staff forgets to take the test plate.
Owner:竞陆电子(昆山)有限公司
Device for testing insulation resistance
PendingCN109581058AMeet humidity requirementsGuaranteed test accuracyVery high resistance measurementsMeasurement instrument housingTest efficiencyElectricity
The invention relates to a device for testing an insulation resistance and a method for testing the insulation resistance. The device for testing the insulation resistance comprises a test box, a power supply socket arranged at the outer wall of the test box, a solution box arranged in the test box, and a test assembly arranged in the test box and located above the solution box. The test assemblycomprises a test substrate, a test base arranged on the test substrate, and a test circuit connected with the test base. The test base is arranged on one side, close to the solution box, of the test substrate. The test circuit is electrically connected with the power supply socket. According to the device for testing the insulation resistance, the humidity requirement can be met without convectionwith air, the test precision is guaranteed; wiring setup is not needed for each test, so that the use operation is convenient, the test efficiency is improved, the abnormal test result caused by theproblem of the system is avoided, and the test precision is improved.
Owner:CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
Method and system for testing swinging cross or breaking of multi-core cable
InactiveCN102854430BImprove test efficiencyReduce the number of testsElectrical testingCapacitanceMulticore cable
The invention discloses a method and a system for testing swinging cross or breaking of a multi-core cable. The method includes the steps of A, selecting a one cable core of a tested cable and performing a continuity test by respectively connecting two ends of the cable core on a testing channel of a continuity tester; B, selecting another cable core and repeating the step A until continuity tests for all cable cores are finished; C, selecting one pair of cable cores of the tested cable and respectively connecting one ends thereof on a test channel of a capacitance unbalance tester to test capacitance difference of the pair of the cable cores relative to other cable cores and a metal sheath; D, selecting another pair of cable cores and repeating the step C until all capacitance unbalance tests for the cable cores are finished; E, selecting cable core pairs with abnormal test results obtained in the step C and the step D, combining the cable cores two by two, respectively connecting one ends on the continuity tester to finish the continuity test between two random cable cores, obtaining result of the swinging cross, and then recording the result.
Owner:SHANGHAI ELECTRIC CABLE RES INST +1
A method and system for testing communication modules on embedded PCBA
ActiveCN103293466BImprove test efficiencyIncrease productivityTransmitters monitoringReceivers monitoringTest efficiencyMemory interface
Owner:FUZHOU ROCKCHIP SEMICON
Package Test Method
ActiveCN103730376BIncrease elasticitySimple processSemiconductor/solid-state device testing/measurementSemiconductor/solid-state device manufacturingProbe cardSemiconductor package
The invention discloses a packaging and testing method, which includes the following steps. A semiconductor package unit is provided, which includes a package compound, a lead frame and a plurality of dicing lines. The dicing line defines a plurality of semiconductor package elements on the semiconductor package unit. Each semiconductor package element has a plurality of external connection terminals. The lead frame is cut along the dicing line to electrically insulate the semiconductor package components. The semiconductor packaging unit is placed on the carrier wafer. The probe card is brought close to the semiconductor package unit mounted on the carrier wafer, and the plurality of probe terminals of the probe card are respectively contacted with the external connection terminals, so as to test each semiconductor package element. Mark test results as abnormal semiconductor package components. Singulating the semiconductor package components and removing the semiconductor package components marked as abnormal.
Owner:WINBOND ELECTRONICS CORP
A method and system for testing modem module on embedded pcba
ActiveCN103336241BImprove test efficiencyIncrease productivityElectrical testingTest efficiencyModem device
The invention provides a method and system for testing a Modem module on an embedded PCBA (Printed Circuit Board Assembly). The quick test method comprises the following steps: scanning a pluggable memory in a memory interface of the PCBA; loading a test code pre-stored in the pluggable memory and testing the Modem module; driving prompting equipment on the PCBA to send normal prompting information if the result of the test is normal, otherwise, driving the prompting equipment on the PCBA to send abnormal prompting information. By utilizing the embedded PCBA to load the test code of the pluggable memory to perform a test to the Modem module, the quality of an SMT (Surface-mount Technology) of the Modem module can be quickly tested, and the result of the test can be visually observed, as a result, test efficiency is greatly improved, and a hardware guarantee is provided for the following normal working of the whole machine.
Owner:FUZHOU ROCKCHIP SEMICON
Connector for preventing terminal from being inserted obliquely
InactiveCN109728455ASolve the problem of abnormal test resultsEnhanced test detectionCoupling device detailsEconomic benefitsAbnormal test result
The present invention provides a connector for preventing a terminal from being inserted obliquely. The connector body comprises a slot configured to allow a terminal to be inserted, at least one endof the two ends of the connector is provided with a bump higher than the top surface of the slot, and the inner side of the bump is provided with a spacing groove corresponding to the thickness of theterminal adapter and configured to prevent the terminal adapter from being inclined and waggled. The connector is suitable for all terminals, and the PCBA card board having a connector with planar design effectively solves the problem of the abnormal test result due to bad contact of the terminal and the connector in the function test process. The connector is simple in structure, can greatly improve the production efficiency, can more effectively enhance the test and check of good products, saves a lot of input cost and can bring better economic benefits.
Owner:ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
Who we serve
- R&D Engineer
- R&D Manager
- IP Professional
Why Patsnap Eureka
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com