38 results about "Abnormal test result" patented technology

The invention provides a method and system for testing a communication module on an embedded printed circuit board assembly (PCBA). The fast testing method includes the following steps: scanning a pluggable storage in a storage interface on the PCBA; loading testing codes pre-stored in the pluggable storage, and testing the communication module; if the testing result is normal, driving a prompting device on the PCBA to send normal prompting information, and if the testing result is abnormal, driving the prompting device on the PCBA to send abnormal prompting information. By using the embedded PCBA to load the testing codes of the pluggable storage to conduct communication module testing, quality of the surface mount technology (SMT) of the communication module can be tested fast, the testing result can be observed directly, testing efficiency is greatly improved, and hardware guarantee is provided for follow-up normal work of a whole machine.

The invention discloses an application program testing method and testing equipment. The method includes: setting up a test network; in the test network, performing a corresponding test operation through a target application program according to a preset test scene to obtain a corresponding test result; When the test result meets the test exception condition corresponding to the test scenario, a corresponding repair operation is performed on the target application program; after the repair operation is performed, a corresponding verification operation is performed on the target application program to obtain the repair result. According to the present invention, application program test automation in a weak network environment can be implemented, and labor costs for testing can be saved. In addition, it can automatically eliminate the impact of abnormal test results on subsequent tests and improve test efficiency. Verify the robustness and maintainability of the target application.

The invention discloses a method and a system for testing swinging cross or breaking of a multi-core cable. The method includes the steps of A, selecting a one cable core of a tested cable and performing a continuity test by respectively connecting two ends of the cable core on a testing channel of a continuity tester; B, selecting another cable core and repeating the step A until continuity tests for all cable cores are finished; C, selecting one pair of cable cores of the tested cable and respectively connecting one ends thereof on a test channel of a capacitance unbalance tester to test capacitance difference of the pair of the cable cores relative to other cable cores and a metal sheath; D, selecting another pair of cable cores and repeating the step C until all capacitance unbalance tests for the cable cores are finished; E, selecting cable core pairs with abnormal test results obtained in the step C and the step D, combining the cable cores two by two, respectively connecting one ends on the continuity tester to finish the continuity test between two random cable cores, obtaining result of the swinging cross, and then recording the result.

The invention discloses an automatic testing method for a PCBA. The method comprises the steps that whether a storage interface on the PCBA is connected with a pluggable storage or not is tested; if the storage interface is connected with the pluggable storage, multiple testing programs pre-stored in the pluggable storage are loaded, and testing is conducted on each to-be-tested function module of the PCBA respectively; if a testing result is normal, prompt equipment of the PCBA is controlled to send a normal prompt message, and if the testing result is abnormal, the prompt equipment is controlled to send an abnormal prompt message. The invention further discloses an automatic testing system for the PCBA. By adopting the automatic testing method and system for the PCBA, all to-be-tested function modules of the PCBA can be convenient to test, and the testing efficiency is improved.

The visual testing method and the device are provided. The method includes: acquiring the dependency package corresponding to the external interface of the service system, and parsing the dependency package to obtain the request parameters of the external interface of the service system. The request parameters are displayed through a display interface. The tester configures the request parametersthrough the display interface, and submits the configured parameters to the business system after generalization processing. The request return result of the business system pair is automatically analyzed and a corresponding test report is generated, and the abnormal test result is assigned to a corresponding developer. At that same time, when a plurality of service system exist, the visual testing method and device can t the plurality of service systems simultaneously. The visual testing method and device provided by the present application reduce the communication cost between testers and developers in the use process, and greatly improve the development efficiency.

The invention provides a method for controlling a high-temperature test needle mark of a wafer. The method comprises the following steps: a loading step: loading to a wafer to be tested into a slide holder; a delaying step: delaying a certain time before the wafer to be tested is tested; a data updating and collecting step: updating and collecting data of the wafer to be tested; a testing step: testing the wafer to be tested. The method provided by the invention has the benefit that a needle mark effect and quality accidents such as abnormal test result of the wafer and the loss of the wafer, which are caused by the fact that the precision is changed as the parts of a probe table are deformed due to the change of temperature, are avoided.

The invention provides an automatic performance testing method, device and system which can avoid the idle occupation of presses and increase the CPU (central processing unit) utilization rate of a press cluster. The method comprises the following steps of: adding the presses into a resource pool, adding test tasks into a task queue and obtaining the number of the presses required for each test task; selecting the test tasks from the task queue as to-be-tested tasks according to a scheduling strategy, selecting the presses with the corresponding number from the resource pool, assigning to theto-be-tested tasks and carrying out performance testing on the to-be-tested tasks; and after the performance testing is completed, releasing the presses, analyzing results of the performance testing,if the results of the performance testing are normal, completing the to-be-tested tasks and if the results of the performance testing are abnormal, re-adding the to-be-tested tasks after being subjected to script debugging into the task queue and waiting for execution, wherein in the process of carrying out the performance testing on the to-be-tested tasks, the executive condition is monitored inreal time.

The invention discloses a method for diagnosing an impact on a metallic oxide arrester electrification test from inter-phase interference. The method includes: acquiring instantaneous voltage values at various sampling times from leads on high-voltages sides of an A-phase metallic oxide arrester and a C-phase metallic oxide arrester, calculating phase angles of instantaneous voltage via the Fourier algorithm, acquiring instantaneous leakage current values at various sampling times from grounding down leads of the A-phase metallic oxide arrester and the C-phase metallic oxide arrester, separating resistive current from instantaneous leakage current, calculating a phase angle of the resistive current via the Fourier algorithm, calculating an interference coefficient, and diagnosing by comparing the interference coefficient with a setting valve. By the method, the impact on the metallic oxide arrester electrification test from the inter-phase interference is accurately diagnosed, if any inter-phase interference leads a metallic oxide arrester electrification test result to be abnormal, the diagnosing result can provide powerful reference to testing workers for accurately analyzing insulating performance of the metallic oxide arresters, and testing workers' judgment error caused by the abnormal testing result due to the inter-phase interference can be effectively avoided.

The invention discloses a packaging test method. The packaging test method includes the following steps that a semiconductor packaging unit is provided, wherein the semiconductor packaging unit comprises a packaging adhesive body, a lead frame and a plurality of cutting lines, and a plurality of semiconductor packaging components are defined by the cutting lines on the semiconductor packaging unit and are respectively provided with a plurality of external connection terminals; the lead frame is cut along the cutting lines to electrically insulate the semiconductor packaging components; the semiconductor packaging unit is placed on a bearing wafer; a probe card is made close to the semiconductor packaging unit placed on the bearing wafer and a plurality of probe terminals of the probe card are made to make contact with the external connection terminals respectively so that the semiconductor packaging components can be tested; semiconductor packaging components with abnormal test results are marked; the semiconductor packaging components are made monomeric, and the semiconductor packaging components marked as abnormal are removed.

The invention discloses a wireless signal interference monitoring method, system and device, and the method comprises the steps: receiving a radio frequency signal through a high-gain full-band antenna; dividing the radio frequency signal into a plurality of narrow band signals corresponding to the pass bands of band-pass filters through the band-pass filters, wherein the central frequencies of the band-pass filter are uniformly distributed from the low to the high, and are in pass-band seamless connection; generating corresponding narrow band spectrum data after I/Q signal conversion, FFT processing and time identification processing, synthesizing the data to form a full-band spectrum, and storing the full-band spectrum in a computer platform. When there is a testing result abnormality ina production testing process, the corresponding spectrum data is extracted according to the testing time, and is used for the backspacing analysis of the signal interference during testing. The method achieves the real-time monitoring and analysis of the interference signal through the full-band spectrum formed by the synthesizing of the narrow band spectrums, effectively solves a problem of real-time monitoring and analysis of an interference signal in a production line test in real time, improves the accuracy of a testing result, and reduces the production cost.

The invention provides a method and a system for testing a GPS (global position system) module on an embedded PCBA (printed circuit board assembly). The quick testing method includes the following steps: scanning a pluggable storage in a storage port on the PCBA, loading a pre-stored testing code in the pluggable storage, testing the GPS module, if a testing result is normal, driving a prompt device on the PCBA to send out normal prompt information, and if the testing result is abnormal, driving the prompt device on the PCBA to send out abnormal prompt information. The embedded PCBA loads the test code of the pluggable storage to perform a GPS module test, SMT (surface mount technology) of the GPS module can be quickly tested to be good or not, the test result can be read visually, testing efficiency is greatly improved, and hardware guarantee is provided to follow-up normal operation of the whole set.

The application relates to a test result inspection method and apparatus, a computer device and a storage medium. The method includes: acquiring a test result, being a completion condition of all testitems corresponding to the sample, of a test item of a to-be-tested sample; and according to an uncompleted test item in the test result, generating uncompleted prompting information of the test item. With the provided method, the test result corresponding to the test information is detected and alarm information is generated for the test item corresponding to the abnormal test result; and a testresult of the test item corresponding to the abnormal test result is quickly located.

The invention discloses a method for automatically detecting defects of a dynamic logo. The method comprises that following steps that: step one, a to-be-detected prototype is electrified and a dynamic logo is played; step two, according to a frame rate of dynamic logo playing, a camera is set to be at a corresponding frame rate to carry out image information collection and storage; and step three, the stored image information is read and frame-by-frame analysis is carried out on the collected image; to be specific, the image analysis includes: reading the image and acquiring a colour gamut ofthe image; distinguishing the image type being one of a non-logo image, a dynamic logo image, and a static logo image based on the colour gamut proportion; analyzing the colour gamut of the image, carrying out color gamut difference comparison to determine a result; to be specific, carrying out image stuck defect analysis and splash screen defect analysis on a dynamic logo image and then carryingout splash screen defect analysis on the static logo image; and then returning a test result and storing correspondingly collected image information in an abnormal state of the test result. Therefore, automatic detection of the dynamic logo is realized; the product quality is guaranteed; and the test efficiency is improved.

The invention relates to a method for testing and upgrading a product with a network communication function suitable for a factory, which comprises a controller, a terminal device and a communication management device which communicate with one another, wherein the communication management device is provided with an interface supporting a third-party production management system. During implementation, product shipment firmware is separated from test firmware, so that the problem of production material change caused by frequent firmware updating is thoroughly solved. Large-batch parallel firmware upgrading can be achieved, so that the upgrading efficiency is improved. Product default parameters can be set in batches, and the setting efficiency in the production period is improved. Batch system integration testing can be carried out, a testing result can be reported to a server, and abnormity can be checked in time. Abnormal indexes are obtained through intelligent calculation, abnormal test results are analyzed, environment abnormity of the test equipment is intelligently calculated, a calibration notification is sent, and maintenance is convenient.

The invention discloses a gas-state tester of porosity. The gas-state tester comprises a cabinet body and a cabinet door. The cabinet door can close the cabinet body, at least one support plate used for placing a test plate is arranged in the cabinet body at intervals, a plurality of air vents are arranged on the support plate, a liquid storage container used for placing volatile acid liquid for tests is arranged in the cabinet body, a timer and an alarm are installed on the cabinet body, and the timer is electrically connected with the alarm. After a test finishes, the timer can control the alarm to send out alarming sound and red light to prompt testing staff that the test is finished. The tester avoids test result abnormality caused by the fact that the testing staff forgets to take the test plate.

The present invention provides a connector for preventing a terminal from being inserted obliquely. The connector body comprises a slot configured to allow a terminal to be inserted, at least one endof the two ends of the connector is provided with a bump higher than the top surface of the slot, and the inner side of the bump is provided with a spacing groove corresponding to the thickness of theterminal adapter and configured to prevent the terminal adapter from being inclined and waggled. The connector is suitable for all terminals, and the PCBA card board having a connector with planar design effectively solves the problem of the abnormal test result due to bad contact of the terminal and the connector in the function test process. The connector is simple in structure, can greatly improve the production efficiency, can more effectively enhance the test and check of good products, saves a lot of input cost and can bring better economic benefits.