A method for increasing the linear scanning rate of a signal receiving and analyzing instrument
An analytical instrument and linear scanning technology, applied in the automatic control of power, electrical components, etc., can solve the problems of local oscillator loop loss of lock, harmful local oscillator signal, and limited tuning speed, so as to avoid the state of loss of lock and improve the overall performance. Effect of machine scan rate
Active Publication Date: 2020-08-11
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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Problems solved by technology
If the two use the same pre-scan time, the existing technology requires the oscillator to start at a lower frequency, otherwise the local oscillator loop will lose lock due to the failure of the YIG oscillator to start, which will affect the overall phase-locked local oscillator signal is very harmful
Therefore, the prior art solutions limit the further improvement of the tuning rate
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[0030] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0031] The invention discloses a method for increasing the linear scanning rate of a signal receiving and analyzing instrument, such as image 3 As shown, the whole machine (usually the CPU control board) provides two sets of scanning control signals to the corresponding driving board (usually called the microwave driving board) of the microwave components, which are respectively used as the scanning control signal of the YIG filter and the scanning control of ...
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The present invention proposes a method for improving the linear scanning rate of a signal receiving and analyzing instrument. The CPU control board provides two sets of scanning control signals to the microwave drive board, which are respectively used as the scanning control signal of the YIG filter and the scanning control signal of the YIG oscillator. Independently control the start and end of YIG filter and YIG oscillator tuning. The tuning start time of YIG filter and YIG oscillator is different but the end time is the same, and the tuning speed of the tuning process is the same. The present invention proposes a method to solve the problem of increasing the tuning rate of YIG devices and causing the loss of lock of the local oscillator loop. Through the asynchronous scanning and synchronous tracking between the YIG filter and the YIG oscillator, the loss of the local oscillator loop can be effectively avoided. Lock.
Description
technical field [0001] The invention relates to the technical field of testing, in particular to a method for increasing the linear scanning rate of a signal receiving and analyzing instrument. Background technique [0002] At present, signal analysis instruments generally use synchronous scanning tracking technology. Synchronous scanning tracking means that when the filter and the oscillator are continuously tuned, under the action of the synchronous scanning signal, they start tuning at the same tuning rate and end tuning at the same time. There is always a constant intermediate frequency difference between the two, such as figure 1 shown. [0003] Due to the influence of YIG device characteristic factors, when realizing fast continuous tuning, a certain nonlinear tuning process will occur in the initial frequency band, and the faster the tuning speed, the more obvious the nonlinearity, and the longer the nonlinearity lasts. like figure 2 As shown, the existing method ...
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IPC IPC(8): H03L7/10
CPCH03L7/104
Inventor 李立功许建华郭小文张超杜会文周钦山岳花利
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP