Method for determining temperature acceleration stress spectrum for accelerating life test

An accelerated life test and accelerated stress technology, applied in strength characteristics, testing of mechanical components, testing of machine/structural components, etc., can solve problems such as less consideration of temperature action time, less consideration of temperature cycle effects, etc., to simplify calculations , the effect of improving test efficiency

Inactive Publication Date: 2017-07-28
NAVAL AERONAUTICAL & ASTRONAUTICAL UNIV PLA
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] At present, the determination of the temperature accelerated stress in the accelerated life test has the following deficiencies: (1) mainly consider the amplitude and frequency of the temperature stress, and seldom consider the action time of the temperature;

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  • Method for determining temperature acceleration stress spectrum for accelerating life test
  • Method for determining temperature acceleration stress spectrum for accelerating life test
  • Method for determining temperature acceleration stress spectrum for accelerating life test

Examples

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Embodiment Construction

[0040] The principles and features of the present invention are described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention, and are not intended to limit the scope of the present invention.

[0041] The invention provides a method for determining the temperature-accelerated stress spectrum of an accelerated life test, aiming at determining the accelerated life test temperature and action time of a certain product during the accelerated life test.

[0042] Include the following steps:

[0043] Step 1: Record the ambient temperature every 2 hours, that is, t B = 2, get the temperature measured value {t within H hours 1 ,t 2 ,...t k};

[0044] Step 2: Perform equal-step processing on the ambient temperature data obtained by actual measurement within H hours

[0045] (1) Determine the step temperature value

[0046] Record the highest temperature value in the measured data as t max , the lowest value ...

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Abstract

The invention relates to a method for determining a temperature acceleration stress spectrum for accelerating a life test. The method comprises the following steps: 1, actually measuring an environment temperature; 2, performing equal step treatment on the measured temperature; 3, calculating an accelerated factor; 4, determining temperatures for accelerating the life test; 5, calculating the action time of each temperature for accelerating the life test; 6, drawing the temperature acceleration stress spectrum. The measured and acquired environment temperature data are subjected to equal step treatment, so that the calculated amount is greatly simplified, and the test efficiency is improved. In addition, an Eyring model serves as an acceleration equation, the temperatures and time for accelerating the life test can be calculated according to the measured temperature spectrum, the spectrum for accelerating the life test can be drawn, and the method is directly used for the test.

Description

technical field [0001] The invention relates to a method for determining the accelerated stress spectrum of the accelerated life test temperature. Background technique [0002] As a measure of durability, lifespan is an important tactical and technical indicator of weapons and equipment, and a key factor affecting the full effectiveness of equipment. How to design the accelerated life test load spectrum and verify the product life index through the test is a common problem faced by the current long-life product life analysis and test, and it is also a key technology in the long-life design, analysis, test, evaluation and prediction of the product. [0003] Temperature is an important factor affecting the life and reliability of equipment. The accelerated life test of equipment by increasing the ambient temperature is an important method to shorten the test time and improve the test efficiency. [0004] At present, the determination of the temperature accelerated stress in t...

Claims

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Application Information

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IPC IPC(8): G01N3/60G01M13/00
Inventor 洪亮张福光滕克难尹延涛张磊周强
Owner NAVAL AERONAUTICAL & ASTRONAUTICAL UNIV PLA
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