61 results about "Temperature spectrum" patented technology

The invention discloses a low-temperature fatigue property characterization and life estimation method. The method comprises three major steps of step 1, through considering the influence of a stress ratio, deriving an S-N-R curved surface characterizing the fatigue property by adopting a Goodman equilife curve based on a three-parameter power function expression, and performing data processing by virtue of a linear regression theory; step 2, through considering an interaction effect of loads under spectrum loading, proposing a corrected spectrum loading fatigue life estimation model based on a Willenborg/Chang model and a crack tip plastic zone theory, and giving out a fatigue damage increment representation method; and step 3, calculating the low-temperature spectrum loading fatigue life of a material by adopting an accumulative damage theory. The method is simple and practical; and a low-temperature fatigue property characterization model can be constructed only by a constant-load fatigue property curved surface and an actually measured flight load spectrum of the material in a low-temperature environment, and the spectrum loading fatigue life is estimated, so that the method has important academic meanings and engineering application values.

The invention relates to a high temperature semitransparent material spectrum direction apparent emissivity inversion measuring device and method, belongs to the technical field of high temperature physical function material hot measurement and aims to solve the problems of low accuracy, low temperature upper limit, narrow measuring waveband and existence of dead measuring angle in the conventional semitransparent material spectrum direction apparent emissivity measurement. According to the invention, a fourier infrared spectrometer is used for measuring the high temperature normal direction transmissivity and the high temperature normal direction emissivity of a semitransparent material respectively, further the spectral refractivity and the spectral absorption factor of the semitransparent material are computed according to a radiation transfer inverse problem solving method, and finally the high temperature spectrum direction apparent emissivity of the semitransparent material is computed through the spectral refractivity and the spectral absorption factor of the material. The invention provides a method capable of accurately measuring the spectrum direction apparent emissivity of the semitransparent material, and can be widely applied to various fields of aviation, military, energy sources, chemical engineering and atmospheric sciences and the like.

A gas measuring apparatus includes: an infrared detecting section that receives an infrared ray from a measurement area and outputs infrared spectrum data relating to the infrared ray; a variation detecting section that detects, by using the infrared spectrum data, a variation in intensity of the infrared ray, which is caused in the infrared ray that radiates from the measurement area and which is caused by a measuring object gas in the measurement area; a converting section that converts the infrared spectrum data to radiance temperature spectrum data which represent wavelengths in an infrared region and radiance temperatures at each wavelength; a background temperature detecting section that detects, as background temperature of the measuring object gas, a maximum radiance temperature from among radiance temperatures represented by the radiance temperature spectrum data; a gas temperature detecting section that detects the temperature of the measuring object gas by using a radiance temperature in a wavelength band included in the water vapor absorption band in the infrared region from among the radiance temperatures represented by the radiance temperature spectrum data; and a computing section that computes surface density of the measuring object gas on the basis of the variation in intensity of the infrared ray, the background temperature of the measuring object gas, and the temperature of the measuring object gas.

The invention relates to a high-temperature spectrum emissivity measuring method and device of an infrared window. The device comprises a modulated type infrared radiation source, a monochromator and an integrating sphere, a probe hole of the integrating sphere is provided with a detector, the detector is connected with one port of a detection unit, the modulated type infrared radiation source is connected with one port of the detection unit, the detection unit is connected with a computer, a transmission heating furnace, the monochromator and a reflection heating furnace are connected with a control unit, and the control unit is connected with the computer. According to the invention, the high-temperature emissivity of the infrared window can be measured, problems in radiation temperature measurement of the infrared window are solved, interference in target radiation measurement caused by radiation of the infrared window itself is eliminated, and the measuring accuracy of an infrared detection system is improved. An annular heat conductive ceramic heating plate is combined with an insulated ceramic pressure plate to heat the infrared window, the temperature of a surface-mounted thermocouple is measured so that the temperature of the infrared window is controlled, the transmittance and reflectivity of the infrared window can be measured in the non room temperature condition, and the high-temperature emissivity of the infrared window is solved.

The invention relates to the field of spectrum selective absorbing coatings, in particular to a medium-high temperature spectrum selective absorbing coating which comprises five layers of films, including a base bonding layer, an infrared reflecting layer, a passivation layer, a first absorbing layer, a second absorbing layer and an optical antireflection layer in sequence from the inside out. The first and second absorbing layers are both metal ceramic complex films, and the volume percent of the metal compositions in the first absorbing layer is greater than the volume percent of the metal compositions in the second absorbing layer. The medium-high temperature spectrum selective absorbing coating provided by the invention can work under medium and high temperature and has high light-heat conversion efficiency, good thermal stability, high working temperature and high absorptivity-emissivity ratio.

The invention discloses a power cable intermediate joint insulation detection method based on a dielectric spectrum method. The method comprises the following steps of preprocessing a power cable intermediate joint insulation layer and preparing a sample, performing broadband dielectric spectrum test on the sample, processing the test data to obtain a spectrogram of the dielectric constant changing along with temperature and frequency, obtaining a spectrogram of dielectric loss angle tangent changing along with temperature and frequency, drawing a dielectric temperature spectrum and a dielectric frequency spectrum of the same sample, formulating a rule for judging insulation aging and degradation states of the silicone rubber by the dielectric spectrum, and comparing the dielectric constants/dielectric loss angle tangent of the same sample at different temperatures, and judging the insulation life of the intermediate joint of the power cable by adopting a rule. The aging and degradation states of the silicone rubber insulation in different stages in the service process can be detected, and whether the insulation is degraded or not is judged according to the change trend of the relative dielectric constant and the dielectric loss angle tangent.

The invention provides a method, belonging to the material failure and protection technical field, which mainly solves the problem that: how to consider the effect of the fatigue load, in determination process of calendar life of the metal structure and device. The technical proposal is that: (1) compiling an one-year application temperature spectrum and a failure load spectrum; (2) determining the corrosion solution components and test acceleration multiple; (3) respectively recurrently performing a first-level corrosion test of metal test piece of high-concentration solution and a fatigue test, in the application temperature spectrum and fatigue load spectrum, until the test piece damage goes the critical damage value Dc; (4) calculating the calendar life Hc using a model (1)(saw upper right). Dt in model (1) is obtained by the corrosion and fatigue combination test and Dc is the given clinical corrosion damage value, dt is the known test solution concentration, Lambada is the test cycle period obtained by test, Sigma hi is the known application temperature spectrum, thus the calendar life of the metal structure and device containing the fatigue load Hc can be obtained.

The invention relates to the technical field of aircraft composite material interlayer tensile stress design, and provides a method for determining an allowable value of an interlayer tensile stress design of an airplane composite material, which comprises: 1, determining influence parameters including a B reference value coefficient, an environment, a laying proportion, a thickness, a corner radius joint thickness, a damage and a thermal cycle influence coefficient; 2, determining an interlayer tensile stress design allowable value calculation formula based on the B reference value; 3, determining a test matrix; 4, determining a test environment standard, an environmental influence test moisture absorption saturation determination standard, a thermal cycle influence test cycle index and temperature spectrum, and a test piece damage determination standard; 5, performing a test by referring to an ASTM D6415 test standard to obtain an interlayer tensile stress average value and a B reference value initial value; 6, calculating a B reference value and each influence parameter; and 7, calculating an interlayer tensile stress design allowable value. The method is high in accuracy, highin universality, low in test cost and high in test efficiency.

The invention discloses an LED (light-emitting diode) illuminating lamp capable of adjusting the color temperature. The LED illuminating lamp comprises a white light LED lamp, a white light driving circuit, an orange light LED lamp, an orange light driving circuit and an environment monitoring sensor, wherein the white light driving circuit corresponds to the white light LED lamp; the orange light driving circuit corresponds to the orange light LED lamp; the environment monitoring sensor can detect an external environment and transmits environment information to a control part to control the white light LED lamp and/or the orange light LED lamp to be turned on or off. The LED lamp provided by the invention has two spectra, i.e. a white light spectrum and an orange light spectrum, and the white light with color temperature of 5,000K belongs to high-color temperature spectrum, so that the LED illuminating lamp has the function of improving the visual attention of people and is widely applied to illuminating services at night; the orange spectrum can effectively illuminate under the condition that the humidity of moisture is high and the weather is adverse; in case of haze, the two spectra work at the same time, so that the problem of road illumination can be solved, and automotive vehicles can safely run on a road.

The invention provides a method for characterizing the Curie temperature of barium strontium titanate ceramic based on up-conversion luminescence, and belongs to the field of preparation of rare-earth doped barium strontium titanate (BST) ceramic, and the method is used for solving the problems of a traditional method for characterizing the Curie temperature of the barium strontium titanate ceramic by a dielectric temperature spectrum table that the requirements on the appearance are strict and damages on a sample are caused by upper electrode treatment. The characterizing method comprises the following steps: 1, mixing BaCO3, SrCO3 and TiO2 powder to prepare BST powder; 2, dryly pressing and molding the BST powder and carrying out sintering treatment to obtain BST ceramic; and 3, testing light spectrums of the up-conversion luminescence of the BST ceramic under different temperatures and drawing a change curve of the luminescence intensity of a luminescence wavelength along the temperature, wherein the temprature of the point with the greatest change rate on the curve is a Curie temperature point. The characterizing method based on the up-conversion luminescence has no limitation on the appearance, surface area and thickness of the test sample, and the testing accuracy is high.

The invention relates to the field of in-situ characterization and particularly relates to an in-situ high-temperature spectrum testing device. The device comprises a shell; a heat insulation layer isarranged in the shell; a heating furnace is arranged in the heat insulation layer; a sample table is arranged in the heating furnace; a placement groove with an upward opening is formed in the sampletable; a sample holder is arranged in the placement groove; a sample cover is arranged above the sample holder; a window is formed in the shell above the sample cover; and external light can enter the sample holder through the window; a cooling system is arranged in the shell; the in-situ high-temperature spectrum testing device further comprises a temperature detection device which can be used for detecting the temperature in the sample holder; the device further comprises a gas path system; the interior and the exterior of the shell are sealed; and the gas path system can introduce gas fromthe lower portion of the sample holder, and the gas can be discharged out of the shell from the upper portion of the sample holder. With the in-situ high-temperature spectrum testing device of the invention adopted, various spectroscopy tests, gas environment and high pressure can be simultaneously considered.

The invention discloses an identification method of an intelligent watch, which relates to the field of wearable intelligent equipment. The method comprises the following steps: receiving the currenttemperature spectrum information of the skin of an object to be identified collected by an infrared temperature measuring sensor of the intelligent watch; matching the current temperature spectrum information with the pre-recorded standard temperature spectrum data of the user to generate a matching result; wherein, when the matching degree of the current temperature spectrum information and the standard temperature spectrum data of the user reaches the preset matching degree requirement, the object to be identified being marked in the matching result to be matched with the user; according tothe matching result, the corresponding function authority being opened. The invention also provides an identity identification device and a storage medium of the smart watch, which can effectively reduce the occupation of the surface usable area of the smart watch, and can effectively improve the convenience of the identity identification of the user.

The invention discloses a multi-atmosphere high-temperature dielectric temperature spectrum testing method. The multi-atmosphere high-temperature dielectric temperature spectrum testing method is used for solving the technical problem that according to an existing temperature spectrum testing method, the error is large. According to the technical scheme, the multi-atmosphere high-temperature dielectric temperature spectrum testing method comprises the steps that a sample to be tested is placed in an atmosphere environment in which the temperature can be controlled; peripheral equipment is controlled by means of a computer, a dielectric testing parameter is preset, and compensatory calibration is completed once through a dielectric performance test instrument, so that a system error is reduced; the temperature change of the sample to be tested is monitored by a temperature feedback device according to a command of the computer; after measurement is completed at all testing frequencies, an interrupt signal is sent by the dielectric performance test instrument, and test results are read by the computer in a batch mode; after all data are verified, data passing verification are stored, and a measurement process is completed; the temperature change of a system is monitored by the computer continuously, and the measurement process is executed repeatedly till testing is completed. Due to the fact that data are tested in a batch mode under the condition of multiple frequency points, testing data are fed back in a batch mode, the average value of the measurement values obtained by conducting measurement multiple times is obtained, the validity of data is verified, wrong values are eliminated, and measurement precision is improved.

A method for predicting temperatures tolerable by a component, a piece of equipment or a vehicle structure. This method includes the steps of determining, for each piece of equipment, component or structure of the vehicle, such as an airplane, a temperature spectrum depending on a plurality of extrinsic parameters measured during a full operating cycle of the airplane, by taking into account, for each piece of equipment, component or structure, possible combinations of the extrinsic parameters and setting aside unlikely combinations of the extrinsic parameters, determining, for each piece of equipment, component or structure, the probability of occurrence of the spectrum during the full airplane operating cycle, and defining a database including the temperature spectra so as to predict the lifetimes of the piece of equipment, component or structure and redefine weather and operational standards indicating extreme temperatures and their probability of occurrence obtained with the measured extrinsic parameters.

The invention discloses a lead-free capacitor ceramic medium material with a high dielectric constant and high temperature stability and a preparation method of the ceramic medium material. The ceramic medium material comprises substrate ingredients and doped ingredients, wherein the substrate ingredients are xBi (Zn2/3Nb1/3) O3-(1-x) BaTiO3, wherein x is equal to 0.18; doped Bi2O3 is 10-20% of the mass fraction of the substrate ingredients, and Nb2O5 is 2-3% of the mass fraction of the substrate ingredients. By the doping of Nb2O5 and Bi2O3, the sintering temperature of the capacitor ceramic material of a Bi (Zn2/3Nb1/3) O3-BaTiO3 system is not higher than 1050 DEG C, the dielectric-temperature spectrum ranges from -35 to 200 DEG C, the temperature coefficient of capacitance ranges from -250 to 250 ppm, and the dielectric constant remains above 650, so that the dielectric constant of the ceramic medium material is increased, the temperature stability remains high, the temperature coefficient of capacitance is relatively low, and the cost of the ceramic medium material is rather inexpensive as compared with those of other tombarthite systems.

The invention discloses a multi-channel high-temperature dielectric temperature spectrum testing device. The multi-channel high-temperature dielectric temperature spectrum testing device comprises a clamp and detection equipment electrically connected with the clamp; the clamp at least comprises a clamping mechanism and a heat insulating plate (4); the clamping mechanism further comprises a stainless steel bottom plate (10); a silver electrode bottom plate is fixedly arranged on the stainless steel bottom plate (10) to serve as a silver bottom electrode (7) shared by a plurality of channels; each channel is independently provided with a thermocouple (2), one end of each thermocouple (2) is buried in the silver bottom electrode (7), and the other end of each thermocouple (2) is electricallyconnected with the detection equipment; each channel is provided with a silver bolt top electrode (5); and a tested sample is clamped between the silver bolt top electrodes (5) and the silver bottomelectrode (7) and tightly fixed through tightness degree adjusting by a fixing mechanism. By adopting the technical scheme, the temperature of the sample can be accurately measured, the testable temperature range is large, the dielectric performance of a material at different temperatures is tested, and the cost is low.

The invention relates to a method for determining a temperature acceleration stress spectrum for accelerating a life test. The method comprises the following steps: 1, actually measuring an environment temperature; 2, performing equal step treatment on the measured temperature; 3, calculating an accelerated factor; 4, determining temperatures for accelerating the life test; 5, calculating the action time of each temperature for accelerating the life test; 6, drawing the temperature acceleration stress spectrum. The measured and acquired environment temperature data are subjected to equal step treatment, so that the calculated amount is greatly simplified, and the test efficiency is improved. In addition, an Eyring model serves as an acceleration equation, the temperatures and time for accelerating the life test can be calculated according to the measured temperature spectrum, the spectrum for accelerating the life test can be drawn, and the method is directly used for the test.

The invention relates to the technical field of electronic element manufacturing, and in particular to an automatic dielectric ceramic inspection equipment. The equipment comprises a machine frame, aworkpiece carrying and feeding device, a indexing rotary disc device, a carrier disc transferring device, a dielectric temperature spectrum tester and a discharging and collecting device, wherein theworkpiece carrying and feeding device, the indexing rotating disc device, the carrying disc transferring device, the dielectric temperature spectrum tester and the discharging and collecting device are arranged on the machine frame; the workpiece carrying and feeding device, the carrier disc transferring device and the discharging and collecting device are positioned on the periphery of the indexing rotary disc device and correspond to three vertical directions of the indexing turntable device; four stations are uniformly arranged on the periphery of the indexing rotary disc device; and the dielectric temperature spectrum tester is positioned on the side of the carrier disc transferring device. The device has the advantages of being high in automation degree, mechanical in loading and unloading, small in damage of the workpieces and high in detection efficiency.

The invention discloses a dry type transformer thermal fault diagnosis method and system. The method comprises the following steps: acquiring infrared images of a dry type transformer; acquiring a surface three-dimensional temperature spectrum of the dry type transformer; establishing a surface three-dimensional temperature field distribution database of the dry type transformer under a normal operation condition and a typical fault condition; calculating by using a grey correlation analysis method so as to obtain a weight function of extendable gray correlation analysis of the dry type transformer; establishing a fault meta-model of the dry type transformer and a present article meta-model of the dry type transformer; judging whether the dry type transformer has a typical fault or not according to the weight function of extendable gray correlation analysis of the dry type transformer, and if the dry type transformer has the typical fault, judging the type of the fault; and displayingthe type of the fault and fault alarming information. By adopting the dry type transformer thermal fault diagnosis method and the system, dry type transformer thermal fault diagnosis is carried out onthe basis of infrared three-dimensional temperature spectrums and extendable gray correlation analysis methods, and the fault diagnosis efficiency and accuracy can be improved.

The invention discloses an anti-impact material which comprises a polyurethane elastomer unit and a polystyrene microsphere unit connected through a chemical bond. The invention also provides a preparation method of the anti-impact material. The anti-impact material disclosed by the invention comprises a polyurethane elastomer unit with relatively low glass transition temperature, which can absorb the impact energy at low temperature; meanwhile, the anti-impact material also comprises a polystyrene microsphere unit; and at a high temperature, when the anti-impact material undergoes impact, the impact energy is absorbed by the non-elastic and elastic collision between the polystyrene microsphere units. Thus, excellent impact resistance of the anti-impact material can be kept in a relatively wide temperature spectrum range.

The invention discloses a variable-temperature spectrum testing device. The variable-temperature spectrum testing device comprises an operating system, a temperature changing system, a measuring system, a cooling system and an analyzing system, wherein the operating system is used for setting a test temperature; the test temperature is transmitted to a temperature control device in the temperaturechanging system through a data transmission line; the temperature control device controls the temperature of a variable-temperature objective table according to the test temperature; and after the temperature of the variable-temperature objective table on which the test sample is placed is stable, an integrating sphere is closed for measurement, and a probe transmits received light emitted by thetest sample and a light signal generated by the excitation light source exciting the sample to the analysis system to obtain optical performance parameters of the test sample at different temperatures.

A system of dielectric spectrum microscopic measurement using near-field microwaves includes a microwave source, an adjustable microwave resonator, a probe, a microwave detection circuit, a position device, and a dielectric spectrum calculation circuit. A method of dielectric spectrum microscopic measurement using near-field microwaves comprises the following steps: enabling the microwave source to generate a microwave signal, and applying the microwave signal to the adjustable microwave resonator; adjusting or fixing the position of the probe away from the target area of a measured object; tuning the adjustable microwave resonator; applying the microwave signal to a target area of the measured object by the probe; detecting a reflected microwave signal; and determining the dielectric spectrum of the target area of the measured object. More complete, direct and accurate information is provided for researching the polarization mechanism of the microwave range of the target area of the measured object. The technical blank of a microwave dielectric spectrum microscopic measurement system is filled. And a temperature control device is added, so that a microwave dielectric temperature spectrum microscopic measurement function can be further provided.