Capacitive touch key chip detection and calibration system and method

A capacitive touch and chip detection technology, applied in electronic circuit testing, electrical measurement, measurement devices, etc., can solve the problems of strong module coupling, poor versatility, and inability to detect on-line contact of chips.

Active Publication Date: 2017-08-11
CHIPSEA TECH SHENZHEN CO LTD
View PDF11 Cites 17 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, the current capacitive touch key detection device has poor reliability and stability when measuring and calibrating sensitivity performance indicators. It is difficult to implement the test and has poor versatility. On the other hand, the authenticity is reduced, and retesting results in a large amount of repetiti

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Capacitive touch key chip detection and calibration system and method
  • Capacitive touch key chip detection and calibration system and method
  • Capacitive touch key chip detection and calibration system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0043] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0044] see figure 1 , figure 2 As shown, it is the test and calibration system (system for short) realized by the present invention. Its system mainly includes insertion detection and calibration module, communication control and register configuration module, data storage module, key processing module, comparison analysis module, error processing Module, power supply control module and terminal control module, the insertion detection and calibration module, communication control and register configuration module, data storage module, key processing module, comparative analysis module, error proc...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a capacitive touch key chip detection and calibration system and method. The system comprises an insertion detection and calibration module, a communication control and register configuration module, a data storage module, a key processing module, a comparison analysis module, an error processing module, a power control module and a terminal control module. The detection system and method can perform sensitivity performance measurement and clock calibration to a number of touch key chips, and achieve functions of chip insertion detection, graphical performance display of the terminal in the double-layer mode, comparative analysis, multi-voltage output control, real-time data recording and storage by control software, and system error handling and other functions.

Description

technical field [0001] The invention belongs to the technical field of integrated circuits, and in particular relates to a detection system and method for a touch button chip. Background technique [0002] In order to meet the application needs of high reliability and durability of touch keys, high requirements are put forward for the application scenarios of the performance indicators of capacitive touch key products. The traditional capacitive touch button chip test system is limited in operability and versatility, and the degree of modular coupling is high. Each configuration requires a different hardware design, and the cost is high; the method of using an external circuit makes the circuit Unstable and unreliable test data; lack of industry comparative analysis of the same indicators; test data needs to be manually recorded, improper operation is easy to introduce human interference, heavy repetitive workload, high labor and time costs; no dedicated touch Key chip test...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R31/28
CPCG01R31/2851
Inventor 庞新洁
Owner CHIPSEA TECH SHENZHEN CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap