Capacitive touch key chip detection and calibration system and method

Abstract

The invention discloses a capacitive touch key chip detection and calibration system and method. The system comprises an insertion detection and calibration module, a communication control and register configuration module, a data storage module, a key processing module, a comparison analysis module, an error processing module, a power control module and a terminal control module. The detection system and method can perform sensitivity performance measurement and clock calibration to a number of touch key chips, and achieve functions of chip insertion detection, graphical performance display of the terminal in the double-layer mode, comparative analysis, multi-voltage output control, real-time data recording and storage by control software, and system error handling and other functions.

Description

technical field [0001] The invention belongs to the technical field of integrated circuits, and in particular relates to a detection system and method for a touch button chip. Background technique [0002] In order to meet the application needs of high reliability and durability of touch keys, high requirements are put forward for the application scenarios of the performance indicators of capacitive touch key products. The traditional capacitive touch button chip test system is limited in operability and versatility, and the degree of modular coupling is high. Each configuration requires a different hardware design, and the cost is high; the method of using an external circuit makes the circuit Unstable and unreliable test data; lack of industry comparative analysis of the same indicators; test data needs to be manually recorded, improper operation is easy to introduce human interference, heavy repetitive workload, high labor and time costs; no dedicated touch Key chip test...

AI Technical Summary

Problems solved by technology

[0004] However, the current capacitive touch key detection device has poor reliability and stability when measuring and calibrating sensitivity performance indicators. It is difficult to implement the test and has poor versatility. On the other hand, the authenticity is reduced, and retesting results in a large amount of repetitive testing. Capacitive touch key chip testing for different projects requires a new test platform, resulting in poor versatility, and online contact testing cannot be performed on the chip, and only a single chip can be tested. Chip testing, the coupling between modules is too strong, and the modules cannot be quickly transplanted

Images