Analysis and Correction Method of Two-Dimensional Deviation Spectrum of High Resolution Echelle Spectrometer

An echelle grating, high-resolution technology, applied in the field of spectroscopy, can solve problems such as the inability to meet actual use requirements, and achieve the effects of easy implementation, low detection limit, and high spectral resolution
CN107101723BActive Publication Date: 2018-05-01NCS TESTING TECH
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
NCS TESTING TECH
Publication Date
2018-05-01

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Abstract

The present invention belongs to the spectrum technology field, and especially relates to a high-resolution echelle grating spectrometer two-dimensional deviation spectrum analysis and correction method. The method comprises the following steps: the step 1, obtaining the echelle grating spectrometer two-dimensional spectrum; the step 2, performing interpretation of the obtained two-dimensional spectrum; the step 3, performing inversion of deviation values of prism parameters and / or deviation values of echelle grating parameters; and the step 4, performing correction of the echelle grating spectrometer two-dimensional deviation spectrum. The high-resolution echelle grating spectrometer two-dimensional deviation spectrum analysis and correction method can realize qualitative analysis and quantitative calculation of the two-dimensional deviation spectrum, can realize correction work of the two-dimensional deviation spectrogram, and can fully develop the advantages of high spectral resolution, high sensitivity and low detection limit of the echelle grating spectrometer after analysis and correction of the two-dimensional deviation spectrum; and moreover, the correction method only needs to perform small changing of installation and adjustment tools and is simple to operate and easy to realize, etc.
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Description

technical field

[0001] The invention belongs to the field of spectrum technology, and in particular relates to a method for analyzing and correcting a two-dimensional deviation spectrum of a high-resolution échelle grating spectrometer. Background technique

[0002] In recent years, atomic emission spectrometers are constantly developing in the direction of full-spectrum direct reading, intelligence, miniaturization, and low analysis cost. As the core part of the atomic emission spectrometer, the spectroscopic system directly determines the performance level of the overall instrument. High-resolution échelle grating spectrometer has the advantages of wide band range, high resolution, high sensitivity, full-spectrum transient measurement, etc., and has become the focus of atomic emission spectroscopic analysis technology research.

[0003] The echelle spectrometer is a kind of full-spectrum spectrometer with low dispersion prism and high dispersion echelle grating cross disp...

Claims

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