Fixtures for Substrate Inspection
A substrate detection and substrate technology, which is applied in the direction of measuring devices, measuring electrical variables, measuring device casings, etc., can solve the problems of complex structure of contact parts and difficult bending of contact parts, and achieve the effect of simple structure
Active Publication Date: 2019-05-17
NANOSYS CO LTD
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- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0008] However, the structure for realizing the inclination of the contact piece is complicated, and the contact piece is not easy to bend in the inclined state
Method used
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[0034] The present invention will be described in detail below in conjunction with the accompanying drawings, so that those skilled in the art can easily implement it.
[0035] The detection objects of the present invention are printed circuit boards, flexible circuit boards, multilayer circuit boards, electrode plates for liquid crystal displays, plasma displays, component plates for semiconductor components, film-shaped carriers, and other electrical wiring of various substrates. These are collectively referred to as "detection substrate" in the invention.
[0036] figure 1 It is a structural schematic diagram of the jig for substrate inspection of the present invention, figure 2 yes figure 1 The enlarged schematic diagram of part A in middle, image 3 yes figure 1 Enlarged schematic diagram of part B in middle.
[0037] Such as Figure 1 to Figure 3 As shown, the jig for substrate inspection of the present invention is used to support a plurality of contacts 100, the...
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The present invention relates to a jig for substrate inspection, specifically to a jig for inspecting a substrate, which has a simple slope forming structure of a contactor for inspecting a substrate and may efficiently inspect the substrate and, more particularly, to a jig for inspecting a substrate, which includes: a plurality of contactors each having a tip end for testing a wire pattern of an inspection substrate and a rear end coming into contact with a measurement device through an electrode part; a base plate which is located on the electrode part, and includes a contactor hole for guiding and fixing the rear end of the base plate such that the rear end is connected to the electrode part; and an upper plate which includes an upper plate contactor hole for guiding and fixing the tip end, wherein the tip end of the contactor is fixed to upper contactor holes of a first upper plate and a second upper plate of the upper plate, and a rear end of the contactor moves a second base plate while being fixed to a contactor hole of a first base plate of the base plate such that a contactor located in a space part is formed to be inclined through a simple structure.
Description
technical field [0001] The invention relates to a jig, in particular to a jig for detecting a substrate with a simple structure and capable of effectively detecting a substrate. Background technique [0002] Generally, semiconductors such as integrated circuits, electrical appliances such as resistors, and electronic parts that need to accurately transmit electrical signals are equipped on the wiring pattern of the circuit board. Therefore, before installing electrical appliances and electronic parts, measure the resistance value between the contact parts of the wiring diagram to determine the electrical characteristics or judge whether it is good or bad. [0003] Specifically, after each contact touches a power supply terminal or a voltage measurement terminal, a detection current is supplied from the power supply terminal to the contact while measuring the voltage generated between the voltage measurement terminals that are in contact with the contact, and the supplied cur...
Claims
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IPC IPC(8): G01R1/04
CPCG01R1/0408
Inventor 南宇熙
Owner NANOSYS CO LTD