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IGBT driver performance test circuit, test device and method

A technology for testing circuits and drivers, which is applied in the field of power electronics, can solve problems such as poor applicability, many application equipment, cumbersome and complicated operations, etc., and achieve the effects of simple circuits and operations, guaranteed reliability and safety, and high versatility

Active Publication Date: 2017-11-07
TCL AIR CONDITIONER ZHONGSHAN CO LTD
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  • Claims
  • Application Information

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Problems solved by technology

Although the above-mentioned patents have made fault diagnosis on the IGBT module more realistically, there are many application equipments, and the operation is cumbersome and complicated, and the equipments are all strong electricity, which requires professional maintenance and only meets the specific application occasions. Testers are not versatile and have poor applicability

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  • IGBT driver performance test circuit, test device and method
  • IGBT driver performance test circuit, test device and method
  • IGBT driver performance test circuit, test device and method

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Embodiment Construction

[0031] The invention provides a performance test circuit, test device and method of an IGBT driver, which can extract and calculate PWM signals to obtain signal waveforms in different test modes, and can realize normal drive and IGBT in overcurrent protection mode through simple mode switching The performance test of the driver, the circuit and operation are simple, and the versatility is high, which effectively guarantees the reliability and safety of the IGBT driver.

[0032] In order to make the object, technical solution and effect of the present invention more clear and definite, the present invention will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0033]see figure 1 The performance test circuit of the IGBT driver provided by the present invention is connected with th...

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Abstract

The invention discloses an IGBT driver performance test circuit, test device and method. The IGBT driver performance test circuit is connected with an IGBT driver. A PWM signal is generated by a PWM signal generator. The PWM signal is outputted to the IGBT driver through amplitude regulation of an amplitude transformation module. Extraction regulation is performed on the time parameter of the PWM signal by an extraction operation module and then the PWM signal is outputted to a mode switching module. The current test mode is switched through the mode switching module, the IGBT driver is triggered to be in a driving motor or an overcurrent protection mode and the corresponding performance test result is outputted. Extraction operation can be performed on the PWM signal to acquire signal waveforms under different test modes, and performance testing of the IGBT driver under the normal driving and overcurrent protection modes can be realized through mode switching so that the circuit is simple, the universality is high and the reliability and the safety of the IGBT driver can be effectively guaranteed.

Description

technical field [0001] The invention relates to the technical field of power electronics, in particular to a performance test circuit, test device and method of an IGBT driver. Background technique [0002] At present, the driving circuit forms mainly include discrete components, photocouplers, thick film driving circuits and dedicated integrated driving circuits. Due to the many discrete components of the discrete IGBT drive circuit, the protection circuit is complex, the reliability and performance are relatively poor, and the requirements for design and application personnel are relatively high. When a fault occurs, it needs to be maintained by professionals, and the cost is high. Therefore, the actual application Most of them use integrated drive circuits. For example, the EXB series (such as EXB841) of Fuji Corporation in Japan, the SKHI series (such as SKHI22AH4 R) of Ximenkang Company in Germany, and the SCALE series integrated circuits produced by Swiss CONCEPT (suc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2608
Inventor 钟梓雄陈东亮张景贵
Owner TCL AIR CONDITIONER ZHONGSHAN CO LTD