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A method for identifying fine-grained sedimentary rock lithology based on xrf

A sedimentary rock and lithology technology, applied in the identification of lithology, based on XRF to identify the lithology of fine-grained sedimentary rocks, can solve the problems of unfavorable fast and accurate determination of lithology, long analysis time, etc.

Active Publication Date: 2020-04-10
PETROCHINA CO LTD
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

In the past, lithology identification mainly relied on methods such as thin section analysis, scanning electron microscope analysis, QEMSCAN, and X-ray diffraction analysis. These methods required complicated and time-consuming preparation of samples before analysis. It is easy to be affected by many subjective factors, and the analysis time of scanning electron microscope analysis, QEMSCAN, and X-ray diffraction analysis is relatively long, which is not conducive to the rapid and accurate determination of lithology on site.

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  • A method for identifying fine-grained sedimentary rock lithology based on xrf
  • A method for identifying fine-grained sedimentary rock lithology based on xrf
  • A method for identifying fine-grained sedimentary rock lithology based on xrf

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Embodiment 1

[0097] This embodiment provides a method for identifying the lithology of fine-grained sedimentary rocks based on XRF, such as figure 1 shown, including the following steps:

[0098] Step 101: Establish the percentage content of each element and the amount of each mineral substance according to the XRF measured data and the chemical molecular formula of different minerals;

[0099] Step 102: establishing an equation relationship between the percentage content of different minerals and the amount of each mineral;

[0100] Step 103: Establish an equation relationship between each mineral and the percentage content of each element according to the above equation;

[0101] Step 104: Establish radar map charts according to the percentage content of each mineral in different lithologies, and then distinguish different lithologies according to different chart shapes;

[0102] Embodiments of the present invention will be further described in detail below in conjunction with applicat...

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Abstract

The present invention provides a method for identifying the lithology of fine-grained sedimentary rocks based on XRF. The method comprises: according to the actual measurement data of XRF, establishing equation relationships between the percentage contents of various elements in different minerals and the mole amounts of various minerals; establishing equation relationships between the percentage contents of different minerals and the mole amounts of various minerals; establishing equation relationships between the percentage contents of different minerals and the percentage contents of various elements in different minerals to obtain the percentage contents of various minerals; and establishing a radar map template according to the percentage contents of various minerals in different lithology, and identifying different lithology according to different map templates so as to complete the identification of the lithology of the fine-grained sedimentary rock. According to the present invention, the method has advantages of rapid identification, high accuracy and wide applicability.

Description

technical field [0001] The invention relates to a method for identifying lithology, in particular to a method for identifying lithology of fine-grained sedimentary rocks based on XRF, and belongs to the technical field of oil and gas exploration and development. Background technique [0002] Fine-grained sedimentary rocks mainly include mudstone, dolomitic mudstone, argillaceous dolomite, calcareous mudstone, silty mudstone, argillaceous siltstone, etc. There are many types and similar appearances, so it is difficult to identify them accurately and quickly with the naked eye. In the past, lithology identification mainly relied on methods such as thin section analysis, scanning electron microscope analysis, QEMSCAN, and X-ray diffraction analysis. These methods required complicated and time-consuming preparation of samples before analysis. It is easy to be affected by many subjective factors, and the analysis time of scanning electron microscope analysis, QEMSCAN, and X-ray d...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/223
CPCG01N23/223G01N2223/076
Inventor 刘畅刘可禹王晓琦
Owner PETROCHINA CO LTD