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Circuit capable of rapidly responding fault signal, and driving system

A fault signal and rapid response technology, applied in the direction of electrical components, electronic switches, reliability improvement and modification, etc., can solve the problems of self-burning, short duration, etc., and achieve the effect of preventing the loss of fault signals

Pending Publication Date: 2017-11-24
力高(山东)新能源技术股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In such a process, once the device to be driven is short-circuited, the energy Q generated by the device to be driven is likely to burn itself
Also, if the fault signal The duration is very short, less than 100ns, and the MCU may not be able to query the fault signal In short, relying on software to realize the response of fault signals is very slow

Method used

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  • Circuit capable of rapidly responding fault signal, and driving system
  • Circuit capable of rapidly responding fault signal, and driving system
  • Circuit capable of rapidly responding fault signal, and driving system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] Such as figure 2 As shown, a circuit for quickly responding to fault signals includes a power supply VDD, a resistor R1, a capacitor C1, a first NAND gate U11A, a second NAND gate U11C, and a third NAND gate U11D. The first NAND gate U11A, the second NAND gate U11C, and the third NAND gate U11D are integrated in the NAND gate U11, and the chip model of the NAND gate U11 is 74LS00.

[0030] An input terminal of the first NAND gate U11A, that is, the first pin of the NAND gate U11 is used as a low-level enabling terminal of the fault signal. The other input terminal of the first NAND gate U11A is respectively connected with one input terminal of the second NAND gate U11C and the output terminal of the third NAND gate U11D, that is, the second pin, the tenth pin, and the third pin of the NAND gate U11. The 11-pin connection is used as the fault signal upload end after connection. The other input terminal of the second NAND gate U11C, that is, the 9th pin of the NAND gat...

Embodiment 2

[0050] Such as Figure 2-3 As shown, a driving system includes a single-chip microcomputer MCU, a buffer 1, a driving acquisition circuit 2, a device to be driven 3, and a circuit 4 for quickly responding to fault signals. The single-chip MCU comprises a first input terminal, a second input terminal, a first output terminal, a second output terminal, and a third output terminal; the buffer 1 comprises a first input terminal, a second input terminal, a first output terminal, and a drive acquisition circuit 2 includes a first input terminal, a second input terminal, a first output terminal and a second output terminal.

[0051] The first output end of the single-chip microcomputer MCU is connected with the first input end of the buffer 1, the first output end of the buffer 1 is connected with the first input end of the driving acquisition circuit 2, and the first output end of the buffer 1 is connected with the driving acquisition circuit 2, the driving acquisition circuit 2 is...

Embodiment 3

[0077] The difference from the above two embodiments is that the value of the capacitor C1 is 1000PF.

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Abstract

The invention discloses a circuit capable of rapidly responding a fault signal, and a driving system. The circuit disclosed by the invention comprises a first NAND gate U11A, a second NAND gate U11C and a third NAND gate U11D; one input end of the first NAND gate U11A is used as a fault signal low-level enabling end; another input end is separately connected to one input end of the second NAND gate U11C and the output end of the third NAND gate U11D; the output end of the third NAND gate U11D is used as a fault signal uploading end; another input end of the second NAND gate U11C is used as a control enabling end; the output end of the second NAND gate U11C is used as a low-level enabling end; the output end of the first NAND gate U11A is connected with one input end of the third NAND gate U11D; and another input end of the third NAND gate U11D is used as a fault signal resetting end. The circuit capable of rapidly responding the fault signal, and the driving system disclosed by the invention have the advantages that: a driving acquisition circuit can be rapidly closed, so that a part to be driven is protected; and furthermore, the fault signal can be latched.

Description

technical field [0001] The invention relates to the field of a driver in a circuit, in particular to a circuit and a driving system for quickly responding to fault signals. Background technique [0002] In industries such as power supplies or motor drivers, the circuit structure of driving power devices is as follows: figure 1 As shown, the circuit includes a single-chip MCU, a buffer, a drive acquisition circuit, and a device to be driven. The single-chip MCU includes a first output terminal, a second output terminal and a first input terminal. The buffer includes a first input terminal, a second input terminal and a first output terminal. The driving acquisition circuit includes a first input terminal, a second input terminal, a first output terminal and a second output terminal. The first output end of the single-chip microcomputer MCU is connected with the first input end of the buffer, and the first output end of the buffer is connected with the first input end of th...

Claims

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Application Information

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IPC IPC(8): H03K19/003H03K17/22
CPCH03K17/22H03K19/003
Inventor 孙小旭
Owner 力高(山东)新能源技术股份有限公司