Test method and test device
A test method and test result technology, applied in the direction of error detection/correction, detection of faulty computer hardware, instruments, etc., can solve the problems of long test time and low overall test efficiency, so as to reduce time, improve test efficiency, The effect of improving the efficiency of testing
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[0042] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.
[0043] figure 1 A schematic block diagram of a testing framework of an embodiment of the present invention is shown. The test framework includes a test single board 10 and a test system 20 , and the test system 20 includes a test frame 21 , a test control box 22 , a test computer 23 and a server 24 . The test single board 10 is a test object. In the embodiment of the present invention, the test single board may be a chip in a device with a display screen,...
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