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Test method and test device

A test method and test result technology, applied in the direction of error detection/correction, detection of faulty computer hardware, instruments, etc., can solve the problems of long test time and low overall test efficiency, so as to reduce time, improve test efficiency, The effect of improving the efficiency of testing

Active Publication Date: 2021-01-29
HUAWEI TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This leads to a long test time and low overall test efficiency

Method used

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Embodiment Construction

[0042] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0043] figure 1 A schematic block diagram of a testing framework of an embodiment of the present invention is shown. The test framework includes a test single board 10 and a test system 20 , and the test system 20 includes a test frame 21 , a test control box 22 , a test computer 23 and a server 24 . The test single board 10 is a test object. In the embodiment of the present invention, the test single board may be a chip in a device with a display screen,...

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Abstract

Embodiments of the invention provide a test method and a test apparatus. The test method comprises the steps of starting a kernel and finishing initialization by a test single board, and then obtaining port data generated by the test single board according to a test sequence; and comparing the port data with pre-stored comparison data corresponding to the test sequence, thereby determining a test result of a port of the test single board. According to the test method and the test apparatus, after the test single board starts the kernel and finishes the initialization, hardware of the corresponding port can normally work, at the moment, a test program can be started, and whether the test single board normally works or not can be judged without waiting the test single board to stably output a display result, so that the test time can be shortened and the test efficiency can be improved.

Description

technical field [0001] The invention relates to the field of equipment production and testing, in particular to a testing method and a testing device in the field of equipment production and testing. Background technique [0002] Televisions (Television, TV), mobile phones or set-top boxes and other devices with display input and output interfaces need to undergo production line testing before leaving the factory. The efficiency of production line testing will directly affect the production cost of the product. The production line test is different from the functional test, which focuses on the connectivity of each device on the production board. The production line test inputs a test signal at the input end, captures the output signal at the output end, and compares the test signal with the output information to determine whether the entire display path is normal. [0003] In the current test plan, the test board needs to be normally booted to Android to start the test pro...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
CPCG06F11/2221G06F11/2236
Inventor 谭丽娟晏启剑
Owner HUAWEI TECH CO LTD