A system for simulating USIM card in LTE terminal test

Abstract

The invention discloses a system for simulating a USIM card in an LTE terminal test, comprising a test system, a man-machine interaction interface MMI, a terminal tested module, a simulated USIM module and an NV module; the method includes the following steps: S1, configuring NV test information ; S2. Read the configuration information and data items of the NV; S3. Set the data information of the simulated USIM system; S4. Use the information of the simulated USIM to search the network, use the data to authenticate the network, and use the simulated USIM system to replace the physical USIM card And update the information in the registration process in real time. The method and system proposed by the present invention have low production cost, convenient testing, automatic batch testing, and avoid test failure in abnormal situations. In the case of USIM card, card slot damage or poor contact of the machine card, the test can be continued. When the data of the physical USIM card is abnormal, you can directly enter the debugging work of the test case.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to a method and system for simulating a USIM card in LTE terminal testing. Background technique [0002] LTE terminals need to go through a series of certification tests before they are put into commercial use. At present, the manufacturers in this field mainly include Anritsu, Rohde, Agilent, Schwartz, Galaxy Bright, etc. There are also various test systems, such as Rohde & Schwarz. Watts' TS8980 system, CMW500, Anritsu's MD8430, ME7834L / 7873L, etc. Different test systems are generally equipped with one or more test cards or special cards to complete the machine-card interaction during the test process. [0003] In the terminal test of the Internet of Things application, the main function of the USIM card is to provide user identification information, PLMN information, and security context for the terminal registration network through a series of files, so as to assist the termi...

AI Technical Summary

Problems solved by technology

However, in the early stage of the test, when the performance of the terminal chip is uncertain, the terminal is relatively tense, and the test card needs to be frequently plugged and replaced to apply different instruments, which will cause confusion in the test and wear the test card and card slot.

When all the tests of the USIM card are not completed and the driver is unstable, the test process will not be able to continue due to the obstruction of the card reading part at startup, which will affect the debugging of other content

[0005] When debugging and testing in a third-party testing laboratory, the test card will be used by testers who go to verify it. Because it is in the debugging stage, there will be many cases of abnormal operation of the card, such as abnormally stored RPLMN information, wrongly stored Prohibition of the PLMN list, etc., at least prolongs the cell search and residency process, and requires a series of search bands, frequency scans, etc. to find a suitable cell. A series of tests related to the use cases

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