IC card connector elasticity testing method and terminal, and testing card and testing machine

A test method and a test terminal technology, applied in the direction of measuring force, measuring device, instrument, etc., can solve the problem of unable to test the contact pressure of IC card holder, etc., and achieve the effect of improving test efficiency and reducing use cost

Inactive Publication Date: 2018-01-30
FUJIAN LANDI COMML EQUIP CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The technical problem to be solved by the present invention is: the present invention provides a method for testing the elastic force of an IC card holder,

Method used

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  • IC card connector elasticity testing method and terminal, and testing card and testing machine
  • IC card connector elasticity testing method and terminal, and testing card and testing machine
  • IC card connector elasticity testing method and terminal, and testing card and testing machine

Examples

Experimental program
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Effect test

Embodiment 1

[0087] Please refer to figure 1 , Embodiment 1 of the present invention is:

[0088] The invention provides a method for testing the elasticity of an IC card holder, comprising the following steps:

[0089] S1: Perform a pressure test on the strain gauge on the test card, record and save the different strain values ​​corresponding to different pressure values ​​applied to the strain gauge, and obtain multiple coordinate points;

[0090] "Pressure test the strain gauge on the test card" is specifically:

[0091] The strain gauge on the test card is subjected to multiple pressure tests within a preset pressure range by a preset pressure test device.

[0092] "Stress test on strain gauges on test card" can also be:

[0093] Pressure test the strain gauge on the test card with 20N incremental pressure value, and the initial pressure value of the pressure test is 180N.

[0094] During the above pressure test process, the strain gauges on the test card are subjected to pressure ...

Embodiment 2

[0102] Please refer to figure 2 , the second embodiment of the present invention is:

[0103] The present invention provides a kind of IC card holder elasticity test terminal, comprises memory 11, processor 12 and is stored on memory 11 and can run on the computer program on processor 12, when described processor 12 executes described program, realize following step:

[0104] S1: Perform a pressure test on the strain gauge on the test card, record and save the different strain values ​​corresponding to different pressure values ​​applied to the strain gauge, and obtain multiple coordinate points;

[0105] "Pressure test the strain gauge on the test card" is specifically:

[0106] The strain gauge on the test card is subjected to multiple pressure tests within a preset pressure range by a preset pressure test device.

[0107] "Stress test on strain gauges on test card" can also be:

[0108] Pressure test the strain gauge on the test card with 20N incremental pressure value...

Embodiment 3

[0116] Please refer to image 3 , Embodiment three of the present invention is:

[0117] A kind of test card 8 that is used for IC card holder elasticity test provided by the present invention, described test card 8 and IC card are identical in size and shape;

[0118] The relative position of the contact of the test card 8 and the IC card holder is provided with a groove, the groove is provided with a plurality of strain gauges 10, and the plurality of strain gauges 10 are arranged in parallel in the groove, and the strain gauges The thickness of 10 is equal to the depth of the groove; the length of the groove is 40mm, and the width is 12mm; the test card 8 is a PCB board, and the width of the PCB is 85.52mm, the height is 53.92mm, and the thickness is 0.84mm. The PCB is not provided with a printed circuit, and the strain gauges 10 provided on the PCB grooves are resistive strain gauges 10 .

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Abstract

The invention relates to the field of pressure testing, and especially relates to an IC card connector elasticity testing method and terminal, and a testing card and a testing machine. The IC card connector elasticity testing method comprises carrying pressure testing on a strain gauge on the testing card, recording and saving different strain values corresponding to different pressure values applied to the strain gauge, and obtaining a plurality of coordinate points; obtaining an expression between the pressure value and the strain value according to the plurality of coordinate points; obtaining the strain value of the strain gauge when the testing card is placed in the IC card connector; and obtaining the elasticity of the contact of the IC card connector according to the expression andthe strain value. According to the invention, the elasticity value of the contact in the IC card connector can be tested, and therefore whether the IC card connector meets the demand of an EMV standard on the elasticity of the contact of the IC card connector is effectively estimated, during the testing process, the IC card connector is not damaged, once a model between the strain gauge and the pressure is established, the elasticity of metal contacts in a batch of IC card connectors can be tested, the testing efficiency is improved, and the usage cost is reduced.

Description

technical field [0001] The invention relates to the field of pressure testing, in particular to a method for testing the elastic force of an IC card holder, a terminal, a test card and a test machine. Background technique [0002] At present, there is no general test method for the elastic force of the metal contacts in the IC card holder. Usually, the elastic force of the contacts is determined by the design method and material of the metal shrapnel of the contacts. Due to structural tolerances or metal fatigue, etc., IC card holder contacts may have reduced elastic force or uneven pressure force. A general device and test method are needed to test the pressure of IC card holder contacts. Contents of the invention [0003] The technical problem to be solved by the present invention is: the present invention provides a method for testing the elastic force of an IC card holder, a terminal, a test card and a testing machine, which solves the problem that the contact pressure...

Claims

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Application Information

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IPC IPC(8): G01L1/22
Inventor 刘旭煌林魁
Owner FUJIAN LANDI COMML EQUIP CO LTD
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