A liquid crystal screen alignment offset defect detection method

Abstract

The invention discloses an image acquisition method for realizing a liquid crystal screen alignment mark point by using infrared characteristics, which is used for detecting the defect of alignment deviation during lamination of various materials in the existing liquid crystal screen manufacturing process. The invention includes a red point light source, a light source emitting infrared light in a specific wave band, a wide-spectrum response width camera, a telecentric lens and a liquid crystal screen sample commonly used in the market. The optical system composed of the above components can collect the mark points used for alignment when pressing the LCD screen, and then judge whether the alignment shift occurs to provide a basis for improving the alignment process, which is of great significance to the improvement of the production quality of the entire LCD screen industry. .

Description

technical field [0001] The present invention designs a detection method, specifically, it is a detection method designed for detection of alignment offset defects that may occur during the manufacture of liquid crystal screens Background technique [0002] At present, the detection of alignment offset in China is mostly aimed at the alignment of PCB boards or electronic components. By obtaining the graphic image of the substrate containing the reference ruler or the verification circle, and then obtaining the image of the alignment board containing the measuring ruler, and then Judging the offset between the reference ruler and the side ruler to realize alignment offset detection. This method requires two image captures, and requires auxiliary detection such as a reference ruler or a verification circle, which increases the complexity of the process and affects the detection efficiency. [0003] On the other hand, for non-surface detection, the current common method is to u...

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Problems solved by technology

This method requires two image captures, and requires auxiliary detection such as a reference ruler or a verification circle, which increases the complexity of the process and affects the detection efficiency

[0003] On the other hand, for non-surface detection, the current common method is to use penetrating light such as X-rays to obtain internal images, which is feasible for obtaining images of objects with almost the same reflectivity. Conversely, for two objects with different reflectivities, Using this principle, it is impossible to obtain clear images of two objects at the same time

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