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A liquid crystal screen alignment offset defect detection method

A technology of alignment offset and defect detection, which is applied in the direction of instruments, nonlinear optics, optics, etc., can solve the problems that affect the detection efficiency, cannot obtain clear images of two objects at the same time, increase the complexity of the process, and achieve low cost, The Effect of Fast LCD Screen Alignment Offset Detection

Active Publication Date: 2020-07-21
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method requires two image captures, and requires auxiliary detection such as a reference ruler or a verification circle, which increases the complexity of the process and affects the detection efficiency
[0003] On the other hand, for non-surface detection, the current common method is to use penetrating light such as X-rays to obtain internal images, which is feasible for obtaining images of objects with almost the same reflectivity. Conversely, for two objects with different reflectivities, Using this principle, it is impossible to obtain clear images of two objects at the same time

Method used

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  • A liquid crystal screen alignment offset defect detection method
  • A liquid crystal screen alignment offset defect detection method
  • A liquid crystal screen alignment offset defect detection method

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Embodiment

[0021] Example: see figure 1 , a liquid crystal screen alignment defect detection method, the components of the liquid crystal screen to be tested include polarizers, glass, ITO electrodes, PI, and liquid crystals, and the method steps are as follows:

[0022] (1) The model of each part of the optical system is selected, and the optical system includes a camera, a lens, a point light source and an infrared light source;

[0023] Choose a camera with a wide spectral response area, which can perform the best effective response at 380NM to 1100NM; choose a coaxial telecentric lens as the best lens, with low distortion rate, strong magnification selectivity and high resolution

[0024] (2) Refer to figure 2 Install cameras, lenses, coaxial red light and ring-shaped infrared light sources, and LCD screens to be tested, test the imaging effects of different bands of infrared light sources and illumination heights, and determine the optimal band and installation height of the light...

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Abstract

The invention discloses an image acquisition method for realizing a liquid crystal screen alignment mark point by using infrared characteristics, which is used for detecting the defect of alignment deviation during lamination of various materials in the existing liquid crystal screen manufacturing process. The invention includes a red point light source, a light source emitting infrared light in a specific wave band, a wide-spectrum response width camera, a telecentric lens and a liquid crystal screen sample commonly used in the market. The optical system composed of the above components can collect the mark points used for alignment when pressing the LCD screen, and then judge whether the alignment shift occurs to provide a basis for improving the alignment process, which is of great significance to the improvement of the production quality of the entire LCD screen industry. .

Description

technical field [0001] The present invention designs a detection method, specifically, it is a detection method designed for detection of alignment offset defects that may occur during the manufacture of liquid crystal screens Background technique [0002] At present, the detection of alignment offset in China is mostly aimed at the alignment of PCB boards or electronic components. By obtaining the graphic image of the substrate containing the reference ruler or the verification circle, and then obtaining the image of the alignment board containing the measuring ruler, and then Judging the offset between the reference ruler and the side ruler to realize alignment offset detection. This method requires two image captures, and requires auxiliary detection such as a reference ruler or a verification circle, which increases the complexity of the process and affects the detection efficiency. [0003] On the other hand, for non-surface detection, the current common method is to u...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/13
CPCG02F1/1309
Inventor 刘霖胡杰刘三亚刘笑寒杜晓辉倪光明张静刘娟秀刘永
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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