Liquid crystal display screen alignment offset defect detection method

Abstract

The invention discloses a method for achieving image acquisition of mark points for liquid crystal display screen alignment by using infrared characteristics, which can be used for detecting defects of alignment offset during compressing of material layers in the manufacturing process of a liquid crystal display screen. The invention includes a red point light source, a light source for emitting infrared light in a special wave band, a broad spectral response width camera, a telecentric lens and market common liquid crystal display screen samples. An optical system including the above parts can acquire mark points for alignment while the liquid crystal display screen is compressed, can determine if there is alignment offset not, can provides a basis for the alignment process, and has important significance for improvement of the production quality of the whole liquid crystal display screen industry.

Description

technical field [0001] The present invention designs a detection method, specifically, it is a detection method designed for detection of alignment offset defects that may occur during the manufacture of liquid crystal screens Background technique [0002] At present, the detection of alignment offset in China is mostly aimed at the alignment of PCB boards or electronic components. By obtaining the graphic image of the substrate containing the reference ruler or the verification circle, and then obtaining the image of the alignment board containing the measuring ruler, and then Judging the offset between the reference ruler and the side ruler to realize alignment offset detection. This method requires two image captures, and requires auxiliary detection such as a reference ruler or a verification circle, which increases the complexity of the process and affects the detection efficiency. [0003] On the other hand, for non-surface detection, the current common method is to u...

AI Technical Summary

Problems solved by technology

This method requires two image captures, and requires auxiliary detection such as a reference ruler or a verification circle, which increases the complexity of the process and affects the detection efficiency

[0003] On the other hand, for non-surface detection, the current common method is to use penetrating light such as X-rays to obtain internal images, which is feasible for obtaining images of objects with almost the same reflectivity. Conversely, for two objects with different reflectivities, Using this principle, it is impossible to obtain clear images of two objects at the same time

Images