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Semiconductor memory device

A storage device and semiconductor technology, which is applied in the direction of semiconductor devices, semiconductor/solid-state device manufacturing, semiconductor/solid-state device components, etc., can solve the problems of reduced operating speed and performance deterioration of semiconductor devices, and achieve the effect of improving electrical characteristics

Active Publication Date: 2018-02-16
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Parasitic capacitance can cause performance deterioration of semiconductor devices (e.g., reduction in operating speed)

Method used

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  • Semiconductor memory device
  • Semiconductor memory device
  • Semiconductor memory device

Examples

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Embodiment Construction

[0018] The inventive concepts will now be described more fully hereinafter with reference to the accompanying drawings, in which example embodiments of the inventive concepts are shown. However, the inventive concepts may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein.

[0019] Figure 1A is a plan view illustrating a semiconductor memory device according to example embodiments, Figure 1B showing along Figure 1A A cross-sectional view taken by the lines A-A' and BB', Figure 1C showing along Figure 1A The cross-sectional view taken by the lines CC' and DD'. Figure 2A is showing Figure 1A A magnified view of part A of the Figure 2B is showing Figure 1B Enlarged view of part B of . Figure 2C shows a semiconductor memory device according to other example embodiments and is a Figure 1B Enlarged view of part B of . Figure 3A and 3B shows semiconductor memory devices according to other example embodimen...

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PUM

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Abstract

A semiconductor memory device includes word lines extending in a first direction on a semiconductor substrate, bit line structures crossing over the word lines and extending in a second direction intersecting the first direction, and contact pad structures between the word lines and between the bit line structures in plan view. A spacer structure extends between the bit line structures and the contact pad structures. The spacer structure includes a first air gap extending in the second direction along sidewalls of the bit line structures and a second air gap surrounding each of the contact padstructures and coupled to the first air gap.

Description

technical field [0001] Embodiments of the present disclosure relate to semiconductor memory devices, and more particularly, to semiconductor memory devices including an air gap-based spacer structure. Background technique [0002] Semiconductor devices may be used in the electronics industry due to their small size, multifunctionality, and / or low manufacturing cost. Semiconductor devices may be classified into semiconductor memory devices that store logical data, semiconductor logic devices that process operations on logical data, and hybrid devices that have functions of both memory devices and logic devices. [0003] Some semiconductor devices may include vertically stacked patterns and contact plugs electrically connecting the stacked patterns to each other. As semiconductor devices have been highly integrated, the distance between patterns and / or the distance between patterns and contact plugs has decreased. Therefore, a parasitic capacitance between patterns and / or be...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L27/108H10B12/00
CPCH10B12/30H01L23/5222H01L21/764H10B63/30H10B63/80H10B12/0335H10B12/315H01L23/5226H01L23/5283H01L23/5329
Inventor 金恩靓金熙中金根楠金大益金奉秀黄有商
Owner SAMSUNG ELECTRONICS CO LTD
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