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A sneak path analysis method considering the storage degradation of single relays

An analysis method and relay technology, applied in the field of sneak path analysis, can solve problems such as inability to guarantee safety, achieve the effect of improving circuit storage reliability, avoiding deviations, and avoiding sneak path states

Active Publication Date: 2018-09-07
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This has led to the fact that in the design process of the circuit system containing the relay-type stand-alone unit, the sneak path analysis and design only for the performance parameters of the initial state of the relay-type stand-alone unit cannot guarantee the safety of the system in the long-term storage process

Method used

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  • A sneak path analysis method considering the storage degradation of single relays
  • A sneak path analysis method considering the storage degradation of single relays
  • A sneak path analysis method considering the storage degradation of single relays

Examples

Experimental program
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Effect test

Embodiment 1

[0032] A kind of sneak path analysis method considering the storage degradation of relay type stand-alone unit is characterized in that: it comprises the following steps:

[0033] Step 1: Establish a qualitative model of the circuit to be analyzed in Simulink software;

[0034] Step 2: According to the qualitative model and circuit function, determine the excitation device and the execution device controlled by the relay type stand-alone machine;

[0035] Step 3: According to the distribution of action time at time t during the storage degradation process of a single relay type, the Monte Carlo method is used to randomly sample and combine to generate n sets of action time data as the input data of the excitation device;

[0036] Step 4: Input the n groups of action time data into the Simulink circuit qualitative model established in step 1 respectively;

[0037] Step 5: Under the conditions of the n sets of action time data, monitor the current situation in the actuator, and...

Embodiment 2

[0042] A sneak path analysis method that considers the storage degradation of a relay-like stand-alone device described in Embodiment 1, the establishment of a qualitative model of the circuit to be analyzed described in step 1 refers to the equivalent of the components in the circuit to have a certain resistance value in the working state resistance;

[0043] For a relay, when the contact is closed, its qualitative resistance is 0, and when the contact is open, its qualitative resistance is ∞; for a diode, its qualitative resistance is 0 when it is turned on, and its qualitative resistance is ∞ when it is off;

[0044] For a resistor, its qualitative resistance value is set to X;

[0045] For the coil, the qualitative resistance is set to X;

[0046] For a triode, it is represented by a diode and a switch.

Embodiment 3

[0048] In the sneak path analysis method considering the storage degradation of a relay-like stand-alone unit described in Embodiment 1, the excitation device described in step 2 refers to a component or device that can cause changes in circuit parameters in the circuit due to state changes.

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Abstract

The invention provides a sneak path analysis method considering deterioration of relay-class single-machine storage. The method includes the following steps that 1, a qualitative model of a to-be-analyzed circuit is built in Simulink software; 2, according to the qualitative model and the circuit function, an excitation device and an actuating device controlled by a relay-class single machine aredetermined; 3, according to the actuation time distribution situation of the time t in the relay-class single-machine storage deterioration process, random sampling and combination is conducted through the Monte Carlo method to generate n sets of actuation time data, and the data serve as input data of the excitation device; 4, the n sets of actuation time data is input in the Simulink circuit qualitative model established in the step 1 respectively. The method is used for considering the deterioration of relay-class single-machine storage.

Description

technical field [0001] The invention relates to a sneak path analysis method considering the storage degradation of a single relay unit Background technique [0002] A latent path is a latent state that causes an undesired event or suppresses a desired event, manifested as an unexpected path or logic flow that occurs in a complex system, which may induce an unwanted function or suppress a desired function under certain conditions. This path or logical flow may be caused by hardware, software, operator actions, or a combination of these factors. Sneak paths are not the result of hardware failures and have nothing to do with the failure of components, but belong to the latent state of the system caused by imperfect design. In the design process, designers often only consider whether the system's functions conform to the operating procedures, but do not verify whether the system can be normal under conditions other than the operating procedures. In order to test the normal fu...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50
CPCG06F30/20
Inventor 叶雪荣邓杰王跃赵建立陈秋影翟国富
Owner HARBIN INST OF TECH