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Phase deflectometry measurement system calibration method and system

A technology of measurement system and calibration method, applied in the field of optical measurement, to achieve the effect of free and efficient calibration process, reduce measurement cost, and simplify the calibration process

Active Publication Date: 2018-03-13
JIANGSU JITRI HUST INTELLIGENT EQUIP TECH CO LTD
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Problems solved by technology

[0004] The purpose of the present invention is to solve the problems mentioned in the above background technology part by a phase deflection measurement system calibration method and system

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  • Phase deflectometry measurement system calibration method and system
  • Phase deflectometry measurement system calibration method and system
  • Phase deflectometry measurement system calibration method and system

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[0030] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. Preferred embodiments of the invention are shown in the accompanying drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thorough and comprehensive. It should be noted that, unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field of the present invention. The terms used herein in the description of the present invention are for the purpose of describing specific embodiments only, and are not intended to limit the present invention. As used herein, the term "and / or" includes any and all combinations of one o...

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Abstract

The present invention discloses a phase deflectometry measurement system calibration method and system. The method adopts a parallel step plane mirror to reflect and image a display screen, in the pose relation, a rotation matrix can be obtained via a parallel plane mirror position, and a translation matrix only needs to change the position of the parallel step plane mirror once, and by the linearsolution, a calibration process can be simplified substantially, and the measurement cost is reduced, so that the calibration process is more free and efficient.

Description

technical field [0001] The invention relates to the field of optical measurement, in particular to a method and system for calibrating a phase deflection measurement system. Background technique [0002] For the three-dimensional measurement of the specular reflective surface, according to the reflective characteristics of the specular surface, many scholars have proposed the use of phase measurement deflection to measure the specular surface shape. face shape. In the phase measurement deflectometry measurement method, the calibration of the relationship between the display screen and the camera that is not in the field of view of the camera is the key technology. [0003] In the existing calibration technology, Petz proposed to use a calibration mirror with control points on the surface to calibrate the pose relationship of the deflectometry measurement system. The control points on it need to be identified and measured by photogrammetry to obtain precise coordinates. The...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00
Inventor 张旭李晨王文超
Owner JIANGSU JITRI HUST INTELLIGENT EQUIP TECH CO LTD
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