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Fault detection method of voc exhaust gas continuous analysis device and voc exhaust gas continuous analysis device

An analysis device and fault detection technology, which is applied in the direction of measuring devices, analysis materials, material separation, etc., can solve problems such as deterioration, pollution, and machine failure of VOC exhaust gas continuous analysis devices

Active Publication Date: 2020-09-29
SHIMADZU SEISAKUSHO CO LTD
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Problems solved by technology

[0003] When performing gas chromatographic analysis in a laboratory, etc., the reasons for the above-mentioned abnormalities in the gas chromatogram are as follows: (1) The test conditions (analysis conditions) adjusted by the user to the VOC exhaust gas continuous analysis device and the sample are not correct. Appropriate; (2) Machine failure or contamination / deterioration in the VOC exhaust gas continuous analysis device

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  • Fault detection method of voc exhaust gas continuous analysis device and voc exhaust gas continuous analysis device
  • Fault detection method of voc exhaust gas continuous analysis device and voc exhaust gas continuous analysis device
  • Fault detection method of voc exhaust gas continuous analysis device and voc exhaust gas continuous analysis device

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Embodiment Construction

[0020] In order to further illustrate the content of the present invention, the present invention will be described in more depth and in detail through the description of specific embodiments below in conjunction with the accompanying drawings.

[0021] figure 2 A block diagram showing the main configuration of the VOC exhaust gas continuous analysis device 1 according to the embodiment of the present invention. like figure 2 As shown, the VOC exhaust gas continuous analysis device 1 provided in the embodiment includes a pre-processing part 11 , a gas chromatograph 12 , and a fault detection part 13 . In the continuous analysis of VOC waste gas, the gas chromatograph 12 constitutes the analysis part of the VOC waste gas continuous analysis device 1; the pre-processing part 11 is a structure in which the pump is installed in the rear section of the gas chromatograph 12, and the VOC waste gas is sucked and sampled; fault detection The unit 13 is used for fault detection in t...

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Abstract

The invention provides a fault detection method applied to a continuous analysis apparatus for VOC-containing exhaust gas. The continuous analysis apparatus for VOC-containing exhaust gas comprises apretreatment part and a gas chromatograph. The fault detection method comprises the following steps: carrying out continuous analysis on a VOC sample; for chromatographic peaks detected in the processof continuous analysis and corresponding to substances included in the sample, respectively comparing the area values and retention time of the chromatographic peaks detected in two adjacent detection operations; and determining that a fault occurs when the area values of the chromatographic peaks detected in the later detection operation of the two adjacent detection operations are smaller thanthe area values of the chromatographic peaks detected in the former detection operation by a specified value or above and the retention time of the chromatographic peaks detected in the later detection operation is smaller than the retention time of the chromatographic peaks detected in the former detection operation by a specified value or above, and outputting a fault detection signal. The invention also provides the continuous analysis apparatus for VOC-containing exhaust gas.

Description

technical field [0001] The invention relates to the technical fields of continuous gas chromatography analysis and waste gas continuous analysis, and in particular to a fault detection method of a VOC waste gas continuous analysis device and a VOC waste gas continuous analysis device. Background technique [0002] Abnormalities in gas chromatography in continuous analysis of VOC (volatile organic compound) exhaust gas using a gas chromatograph are generally classified into two categories: peak shape-related and baseline-related. As peak shape abnormalities, there are usually various phenomena such as smearing, leading, broken peaks, retention time fluctuations, undetected peaks, overall small peaks, and ghost peaks / carryover. E.g, figure 1 Several common phenomena of abnormal peak shape are shown, where (a) represents the phenomenon of peak breaking, (b) represents the phenomenon of smaller peak, and (c) represents the phenomenon of leading. [0003] When performing gas ch...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N30/86
CPCG01N30/8637
Inventor 并河信宽
Owner SHIMADZU SEISAKUSHO CO LTD