A method and system for extracting radar scattering characteristic data based on plasma near-field test
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- BEIJING AEROSPACE INST OF THE LONG MARCH VEHICLE
- Publication Date
- 2019-08-09
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Abstract
Description
technical field
[0001] The invention relates to a method and system for extracting radar scattering characteristic data based on plasma near-field testing, and belongs to the technical field of plasma stealth performance testing. Background technique
[0002] Plasma has the characteristics of ionization, diffusibility, and easy flow. When electromagnetic waves propagate in plasma, electromagnetic waves will interact with ions and electrons in plasma, showing reflection, refraction, absorption and other effects. By wrapping the plasma around the object, the radar scattering characteristics of the object to electromagnetic waves can be changed. Therefore, the plasma can be used for the radar stealth of the object.
[0003] How to obtain radar scattering characteristic data of plasma-coated objects is an urgent problem to be solved in the field of stealth testing technology. Due to the diffusion characteristics and easy flow of plasma, after the plasma source generates plasma,...