High-precision three-dimensional reconstruction method and system based on binary surface structured light

A technology of three-dimensional reconstruction and surface structured light, which is applied in the field of three-dimensional reconstruction, can solve problems such as measurement errors and inaccurate measurements, and achieve the effects of improving reconstruction precision and accuracy, improving adaptability, and reducing the increase in computing costs

Inactive Publication Date: 2018-04-20
SHENZHEN UNIV
View PDF7 Cites 34 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Defects of the current technology: Although the current 3D measurement products can achieve high-precision and high-efficiency measurement, they can only simply measure a known object, and then perform 3D measurement after manually aligning the 3D measurement scanner
When there are multiple disturbing objects in the target scene, it is impossible to independently judge which object is the measurement target without human interference, which will cause inaccurate measurement and measurement errors
There are inherent occlusion problems in the scanning of multiple objects, and the accuracy algorithm for matching after multi-angle and multi-period measurement is also a difficult problem in 3D reconstruction

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High-precision three-dimensional reconstruction method and system based on binary surface structured light
  • High-precision three-dimensional reconstruction method and system based on binary surface structured light
  • High-precision three-dimensional reconstruction method and system based on binary surface structured light

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044] Based on the traditional three-dimensional measurement of structured light, the present invention designs a high-precision three-dimensional reconstruction method of binary surface structured light based on multi-parameter light information coding. The light mode that combines multi-parameter light information encoding surface structured light and directional LED light source projection is called binary surface structured light. Two light sources are used at the same time. The LED light source can determine the contour plane of the target object, and the structured light on the light information encoding surface can determine the depth information of the object. The interval between the surface structured light spots will be adaptively determined by the size of the outline, so as to determine the light information parameters and then determine the coding structure, and realize the theoretical technology of binary surface structured light, single projection and no scannin...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a high-precision three-dimensional reconstruction method and system based on binary surface structured light. The method comprises the steps of calibrating a CCD high-definitioncamera and a projector, projecting directional light source emitted by an LED lamp onto a scene where a target object is located, acquiring an image through the CCD high-definition camera, matching acontour approximate to the target object through a self-adaptive identification module, carrying out structured light information coding according to the result recognized by the self-adaptive identification module, projecting the structured light to the approximate position where the plane of the target contour is located by the projector, the CCD high-definition camera acquiring a modulated image projected on a target object, combining the structural light characteristic points with the gradient information obtained by the LED light contour to obtain a final three-dimensional image. The three-dimensional reconstruction system has the beneficial effects that the adaptability of the three-dimensional reconstruction system to environmental changes can be improved, the reconstruction precision and accuracy of the target object are effectively improved, and the problem that the operation cost is increased due to the multi-objective environment is solved.

Description

technical field [0001] The invention relates to the technical field of three-dimensional reconstruction, in particular to a high-precision three-dimensional reconstruction method and system based on binary surface structured light. Background technique [0002] 3D reconstruction technology is in the field of interdisciplinary research, involving many disciplines such as computer vision, computer graphics, image processing, and pattern recognition. Through the research of domestic and foreign researchers in recent decades, a large number of research results have emerged in both theory and application. The development of structured light 3D reconstruction was initially developed by Rioux et al. in the 1980s, who published a variety of light point rangefinders based on point structured light mode, which combined the reflected light point information collected from the surface of the measured object with the triangulation principle, In order to obtain the three-dimensional info...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06T17/00G06T7/80
CPCG06T7/80G06T17/00
Inventor 徐铭卢先鑫罗琼吉建华王可
Owner SHENZHEN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products