Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Reliability based weighted least square phase unwrapping calculation method

A technology of weighted least squares and phase unwrapping, applied in computing, image data processing, instruments, etc., can solve the problem that the least squares phase unwrapping calculation method cannot obtain correct solutions, affects the correctness of unwrapping, and cannot suppress the propagation of noise, etc. question

Active Publication Date: 2018-05-01
ZHEJIANG SCI-TECH UNIV
View PDF4 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when there are noise points, zero-amplitude points, and low-modulation points in the wrapped phase, the least squares phase expansion calculation method cannot obtain a correct solution.
The weighted least squares phase unwrapping calculation method uses weights to overcome the influence of noise, etc., but whether the introduced weights are appropriate or not will also affect the correctness of unwrapping, and also reduce the calculation speed, and cannot suppress the spread of noise and Eliminate errors caused by smoothing

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Reliability based weighted least square phase unwrapping calculation method
  • Reliability based weighted least square phase unwrapping calculation method
  • Reliability based weighted least square phase unwrapping calculation method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0061] The present invention will be further described below in conjunction with drawings and embodiments.

[0062] Examples of the present invention figure 1 As shown in the flow chart, the specific steps are as follows:

[0063] Step 1: Take the speckle interferogram before and after deformation with industrial camera equipment and obtain a two-dimensional phase wrapping image with a size of M×N containing the three-dimensional deformation information of the object to be measured through corresponding image processing

[0064] This embodiment specifically adopts the space carrier method, and the specific process is: use industrial camera equipment to shoot two speckle interferograms with carrier quantities before and after deformation, and perform Fourier transform on the two speckle interferograms respectively to obtain two spectrograms , respectively select the positive first-order spectrum in the two spectrograms to obtain two positive first-order spectrograms, then pe...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a reliability based weighted least square phase unwrapping calculation method. Industrial camera equipment shoots and collects a speckle interferogram of an object to be detected, and the speckle interferogram is processed to obtain a 2D phase wrapping image including 3D information of the object to be detected; second-order differential calculation of a wrapping phase value is used to obtain the reliability of each point in the wrapping image; and a reliability threshold is calculated and determined, a binary mask layer factor is calculated and obtained and serves as aweighted least square phase unwrapping weight, iterative calculation is carried out, and a final real phase is obtained. The method has the advantages that a weighted least square calculation methodprovides a smooth solution, and calculation is high in speed and precision, noise spreading is inhibited effectively, a smooth effect is eliminated, and the like.

Description

technical field [0001] The invention relates to the technical field of digital speckle interference, in particular to a reliability-based weighted least square phase expansion calculation method. Background technique [0002] Digital Speckle Pattern Interferometry (Digital Speckle Pattern Interferometry, DSPI) is an optical interferometry technology that combines laser technology and digital image processing. Field measurement and other advantages, has been widely used in aerospace, biomedicine, shipbuilding and other fields. Phase unwrapping is the most critical step in the application of DSPI technology, which directly affects the measurement accuracy. In recent years, scholars at home and abroad have proposed many calculation methods for phase unwrapping. Among them, the least squares phase expansion calculation method uses the criterion of the smallest difference between the discrete partial differential of the wrapped phase and the discrete partial differential of the...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06T5/00
CPCG06T5/70
Inventor 严利平张海燕陈本永
Owner ZHEJIANG SCI-TECH UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com