Reliability based weighted least square phase unwrapping calculation method

A technology of weighted least squares and phase unwrapping, applied in computing, image data processing, instruments, etc., can solve the problem that the least squares phase unwrapping calculation method cannot obtain correct solutions, affects the correctness of unwrapping, and cannot suppress the propagation of noise, etc. question

Active Publication Date: 2018-05-01
ZHEJIANG SCI-TECH UNIV
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Problems solved by technology

However, when there are noise points, zero-amplitude points, and low-modulation points in the wrapped phase, the least squares phase expansion calculation method cannot obtain a correct solution.
The weighted least squares phase unwrapping calculation method uses weight

Method used

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  • Reliability based weighted least square phase unwrapping calculation method
  • Reliability based weighted least square phase unwrapping calculation method
  • Reliability based weighted least square phase unwrapping calculation method

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[0061] The present invention will be further described below with reference to the drawings and embodiments.

[0062] Examples of the invention figure 1 The specific steps are as follows:

[0063] Step 1: Take the speckle interferogram before and after the deformation with industrial camera equipment, and obtain the M×N two-dimensional phase wrapping image containing the three-dimensional deformation information of the object under corresponding image processing.

[0064] This embodiment specifically adopts the spatial carrier method, and the specific process is: use industrial camera equipment to photograph two speckle interferograms with carrier before and after deformation, and perform Fourier transform on the two speckle interferograms to obtain two spectrograms. , Respectively select the positive first-level spectra in the two spectrograms to obtain two positive first-level spectrograms, and then perform inverse Fourier transform on the two positive first-level spectrograms and...

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Abstract

The invention discloses a reliability based weighted least square phase unwrapping calculation method. Industrial camera equipment shoots and collects a speckle interferogram of an object to be detected, and the speckle interferogram is processed to obtain a 2D phase wrapping image including 3D information of the object to be detected; second-order differential calculation of a wrapping phase value is used to obtain the reliability of each point in the wrapping image; and a reliability threshold is calculated and determined, a binary mask layer factor is calculated and obtained and serves as aweighted least square phase unwrapping weight, iterative calculation is carried out, and a final real phase is obtained. The method has the advantages that a weighted least square calculation methodprovides a smooth solution, and calculation is high in speed and precision, noise spreading is inhibited effectively, a smooth effect is eliminated, and the like.

Description

technical field [0001] The invention relates to the technical field of digital speckle interference, in particular to a reliability-based weighted least square phase expansion calculation method. Background technique [0002] Digital Speckle Pattern Interferometry (Digital Speckle Pattern Interferometry, DSPI) is an optical interferometry technology that combines laser technology and digital image processing. Field measurement and other advantages, has been widely used in aerospace, biomedicine, shipbuilding and other fields. Phase unwrapping is the most critical step in the application of DSPI technology, which directly affects the measurement accuracy. In recent years, scholars at home and abroad have proposed many calculation methods for phase unwrapping. Among them, the least squares phase expansion calculation method uses the criterion of the smallest difference between the discrete partial differential of the wrapped phase and the discrete partial differential of the...

Claims

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Application Information

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IPC IPC(8): G06T5/00
CPCG06T5/002
Inventor 严利平张海燕陈本永
Owner ZHEJIANG SCI-TECH UNIV
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