Simulated analysis method of zero length emitting device

Abstract

The invention discloses a simulated analysis method of a zero length emitting device, which includes steps of firstly building a three-dimensional model of every spare part of an unmanned machine emitting device; completing a topological structure model of every spare part of the unmanned machine emitting device according to mutual relationship of every spare part of the unmanned machine emittingdevice; establishing a restriction condition according to the topological structure relationship; applying all external loads to the simulation model; solving the unmanned machine on the emitting device during the emitting process and establishing the unmanned machine emission simulating model; simulating and outputting the simulating result; performing contrast analysis on the simulated emissiontest data and judging the correctness of the simulation method. Through replacing the entity experiment by the simulated analysis, the simulated analysis has low requirement on hardware and is simplein implementation condition, short in cycle and good in repeatability; the method can virtually verify the design scheme, exactly predict the test result while reduce the research expenses and shortenthe research cycle; besides, the method has good visible effect.

Description

technical field [0001] The invention relates to the field of simulation analysis, in particular to a simulation analysis method for a zero-length launch device, in particular to a simulation analysis method for safe separation of an unmanned aerial vehicle on a zero-length launch device. Background technique [0002] The zero-length launcher is an important part of the weapon system and is used for the transportation, fixation and launch of UAVs. In the development process of the launch device, it is necessary to verify the rationality of the design parameters such as the launch angle, blocking force, and de-orbit attitude of the launch device, as well as the safety during the launch process. In the past, it was necessary to verify the design indicators of the launch device through the boost launch test. However, the test has the disadvantages of high difficulty, high cost and long cycle. SUMMARY OF THE INVENTION [0003] In view of the above situation of the prior art, t...

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Problems solved by technology

In the past, it was necessary to verify the design indicators of the launch device through booster launch tests. However, the test has the disadvantages of difficulty, high cost, and long cycle

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