Automatic detection method and automatic detection device for cell tab defects

An automatic detection device and automatic detection technology, which is applied in the direction of measuring devices, optical devices, and optical testing of defects/defects, can solve the problems of low judgment accuracy, improve quality, save labor costs, and improve judgment accuracy. Effect

Active Publication Date: 2018-05-15
SHENZHEN CLOU ELECTRONICS
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to provide an automatic detection method and automatic detection device for the tab defect of the battery cell, so as to solve the problem of low accuracy of the existing battery tab defect determination

Method used

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  • Automatic detection method and automatic detection device for cell tab defects
  • Automatic detection method and automatic detection device for cell tab defects
  • Automatic detection method and automatic detection device for cell tab defects

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Embodiment Construction

[0049] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0050] figure 1 An embodiment of the automatic detection method for the tab defect of the electric core of the present invention is shown. In this embodiment, the method for automatically detecting the tab defect of the battery includes the following steps:

[0051] Step S1, transporting the cell to be tested to a preset position, and the preset position is on the extension line of the imaging direction of the imaging device.

[0052] It should be noted that the preset position in this embodiment may also be within the effective imaging range of the imaging device. Preferably, the preset positio...

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Abstract

The invention discloses an automatic detection method and an automatic detection device for cell tab defects. The method includes the steps: conveying a cell to be detected to a preset position in anextending line of a camera shooting direction of a camera shooting device; acquiring image information of the cell to be detected; judging whether a tab of the cell to be detected has the defects or not by the aid of preset tab defect detection strategy analysis image information; conveying the cell to be detected to next station if the cell to be detected does not have defects. The automatic detection method automatically analyzes whether the tab of the cell has shortcomings or not according to the image information acquired by the camera shooting device, labor cost is saved, judgment accuracy rate of the tab defects is increased, so that the quality of a battery module is improved, and the assembly rate of the battery module is increased.

Description

technical field [0001] The invention relates to the technical field of battery tab defect detection, in particular to an automatic detection method and an automatic detection device for a battery tab defect. Background technique [0002] Before the existing batteries are assembled into a battery module, the defects of the battery tabs are manually judged. Because the tab of the battery cell is relatively small, the accuracy of human judgment on whether the tab of the battery is defective is low. Therefore, after the battery cell is assembled into a battery module, if the battery tab of the battery cell is defective, the battery tab cannot enter the copper bar for connecting the tab. At present, for battery tabs with small defects, the battery tabs enter the copper bar through manual operation, and for battery tabs with large defects, the battery cells need to be replaced and reassembled. In this case, not only the quality of the battery module is reduced, but also the asse...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88G01N21/84G01B11/24G01B11/26G01B11/14
CPCG01B11/14G01B11/24G01B11/26G01N21/84G01N21/8806G01N21/8851G01N2021/845G01N2021/8887
Inventor 郭鹏亮汪超罗晓明马骏峰
Owner SHENZHEN CLOU ELECTRONICS
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