A kind of test method and device

Abstract

The embodiments of the invention provide a test method and a test device. The method comprises the following steps: when test data is written in a first memory device, setting backup data corresponding to the test data in a second memory device, wherein the backup data is acquired by mapping and converting the test data, and the memory space occupied by the backup data is less than the memory space occupied by the test data; reading the backup data from the second memory device, and mapping and converting the read backup data to acquire target comparison data; reading the test data from the first memory device, and performing a comparison test on the read test data and the read target comparison data; and according to the result of the comparison test, determining the test result of the first memory device. In the embodiments provided by the invention, as the backup data occupying less memory space is set in the second memory device, compared with the prior art, the integrated test data is stored in the second memory device, the space occupied by the second memory device can be effectively reduced.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a testing method and device. Background technique [0002] When testing a storage device, it is often necessary to perform a reading comparison test on the data written into the storage device. By comparing whether the written data is the same as the read data, it is judged whether the read-write function of the storage device is normal. [0003] In the prior art, when performing a read comparison test, usually while writing data to the test device, the data to be written is stored in other storage areas as backup data, so that after reading the data from the storage device, it can be Compare the stored backup data with the read data to test the read and write functions of the storage device. [0004] However, in the process of studying the above-mentioned technical solutions, it is found that the above-mentioned technical solutions have the following defects: when performing a ...

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Problems solved by technology

[0004] However, in the process of studying the above-mentioned technical solutions, it is found that the above-mentioned technical solutions have the following defects: when performing a reading function test on the test equipment, in order to ensure the accuracy of the test, it is often necessary to read and write a large amount of data for a long time, However, the above technical solution stores the data to be written in other storage areas, which will cause a large occupation of the storage area and consume a lot of resources.

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