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Method and device for removing stray light of microscopic imaging based on optical-electrical characteristic transcendence

A technology of photoelectric characteristics and microscopic imaging, which is applied in the direction of measuring devices, color TV parts, TV system parts, etc., can solve problems such as complex algorithms, low experimental efficiency, and poor picture clarity, and improve experimental efficiency , reduce time complexity, improve the effect of image clarity

Active Publication Date: 2018-06-05
TSINGHUA UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the experimental efficiency of related technologies is low, the picture definition is poor, and the algorithm is relatively complicated, which needs to be solved

Method used

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  • Method and device for removing stray light of microscopic imaging based on optical-electrical characteristic transcendence
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  • Method and device for removing stray light of microscopic imaging based on optical-electrical characteristic transcendence

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Embodiment Construction

[0030] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

[0031] The stray light removal method and device based on photoelectric characteristic prior microscopic imaging according to the embodiments of the present invention will be described below with reference to the accompanying drawings. Stray light removal methods for imaging.

[0032] figure 1 It is a flow chart of a method for removing stray light in microscopic imaging based on prior photoelectric characteristics according to an embodiment of the present invention.

[0033] Such as figure 1 As shown, the stray light removal ...

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Abstract

The invention discloses a method and a device for removing a stray light of microscopic imaging based on optical-electrical characteristic transcendence. The method comprises the following steps: distributing a darkroom, and selecting dots intermittently in logarithm in the interval of camera supported exposure time parameters, and shooting a first picture; only opening the light source of an instrument in the darkroom, and absorbing light with a light trap under an objective lens, combining the camera exposure time and the light source intensity, and uniformly selecting dots on the light source intensity, and selecting the same dots on the camera exposure time, and shooting a second picture; subtracting the first picture from the second picture to eliminate interference of the image sensor of the camera so as to acquire the change rule of the stray light on camera exposure time and light source intensity; and calculating the stray light value of each pixel in the collected picture according to the change rule when a spatial optimal distribution model of the stray light intensity is analyzed for a specific picture to eliminate the influence of the stray light. The method can be used for reducing the time complexity of an algorithm and effectively increasing the experimental efficiency and picture resolution.

Description

technical field [0001] The invention relates to the fields of computer vision technology and image processing technology, in particular to a stray light removal method and device for microscopic imaging based on prior photoelectric characteristics. Background technique [0002] The multi-dimensional, multi-scale and high-resolution computational imaging instrument is currently the world's largest computational imaging instrument that takes into account "wide field of view, high resolution, and high frame rate". Images can realize multi-dimensional, multi-scale and high-resolution continuous observation. The instrument requires that the photos taken by the instrument have a lower signal-to-noise ratio while meeting the frame rate requirements, and can display more details, in order to clearly observe the life movement at the cell level, thereby helping experimenters to grasp the life process The effective information in it not only saves operation time (the biggest difficult...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/01G06T5/00H04N5/21H04N5/232
CPCH04N5/21G01N21/01G06T2207/10061G06T2207/20032H04N23/80G06T5/00
Inventor 范静涛陈熙戴琼海
Owner TSINGHUA UNIV
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