A high-efficiency general self-capacitance capacitive screen sensor function detection system and algorithm

Abstract

The present invention provides a highly efficient universal self-capacitance sensor function detection system, including RC peripheral circuit module, main chip control module, bridging FPC circuit module, self-capacity Sensor screen body to be tested, UART communication chip module and testing software; The software adopts the automatic scanning test method, which reduces the time for operators to click the software "Start" for each piece, thereby improving the test efficiency; the bridge FPC circuit module is used, which can basically be compatible with all self-capacitance design schemes in the industry, thereby saving costs; In addition, Through the improvement of test efficiency, the customer delivery time is shortened.

Description

technical field [0001] The invention relates to the technical field of capacitive screen function testing, in particular to an efficient and universal self-capacitive capacitive screen Sensor function testing system and algorithm. Background technique [0002] At present, the ITO structure of the self-capacitive capacitive screen mainly adopts a triangular pattern design, and the actual measurement method in the production process is usually as follows: [0003] In the research and development process: generally use the test board provided by the main control chip manufacturer to analyze the performance of the capacitive screen and debug the parameters. It is necessary to burn the capacitive screen control chip to output the Raw date (original capacitive sensing) value) data firmware; [0004] In the production process: the function inspection of the FPCA (flexible printed circuit board) incoming material of the capacitive screen, and the incoming material function inspecti...

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Problems solved by technology

[0004] In the production process: the function inspection of the FPCA (flexible printed circuit board) incoming material of the capacitive screen, and the incoming material function inspection of the ITO film; this link needs to burn the raw date firmware for the main control chip of the capacitive screen, and each product needs The corresponding configuration firmware is tested, and expensive test boards are required, which results in low test efficiency. At present, the test efficiency of domestic and foreign solution providers is 400-450pcs / H; it wastes manpower and material resources, and affects product delivery and delivery.

[0005] In this way, each product test needs to wait for the sample to be made, and a special configuration file is required at the same time. Since the test boards used are also different, the cost of manpower and material resources is increased, and the production efficiency is greatly reduced.

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