Porous film observation window
A porous film and thin film technology, which can be used in measurement devices, material analysis by measuring secondary emissions, and material analysis by optical means, which can solve problems such as large background noise, inability to achieve high-resolution imaging, and easy damage. , to achieve the effect of high-resolution imaging, fast and effective observation and positioning
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[0034] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.
[0035] Such as figure 1 As shown, the present invention relates to a porous film observation window 100, which includes a substrate 110 and a film 120 with a predetermined thickness. The substrate 110 includes a first surface 111 and a second surface 112 oppositely disposed. Moreover, the thin film 120 is disposed on both the first surface 111 and the second surface 112 . The thin film 120 may be formed on both surfaces of the substrate 110 by means of coating or the like. The shape and size of the film 120 should be consistent with the shape and size of the substrate 110 .
[0036] The substrate 110 is also provided with an observation groove 113 penetratin...
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