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A multi-trait and multi-interval localization method based on genotype error at marker loci

A technology for marking sites and genes, applied in the field of molecular biology, can solve problems such as information errors of marker genes, and achieve the effect of cost saving and accurate positioning

Active Publication Date: 2022-02-25
SUIHUA UNIV
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

However, due to the precision of the instrument and other reasons, there are often errors in the marker gene information

Method used

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  • A multi-trait and multi-interval localization method based on genotype error at marker loci
  • A multi-trait and multi-interval localization method based on genotype error at marker loci
  • A multi-trait and multi-interval localization method based on genotype error at marker loci

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Embodiment Construction

[0032] The present invention provides an embodiment of a multi-trait multi-interval positioning method based on marker locus genotypes containing errors, in order to enable those skilled in the art to better understand the technical solutions in the embodiments of the present invention, and make the present invention The above objects, features and advantages can be more obvious and understandable, and the technical solution in the present invention will be further described in detail below in conjunction with the accompanying drawings:

[0033] The present invention firstly provides a multi-trait multi-interval positioning method based on marker locus genotype containing errors, such as figure 1 shown, including:

[0034] S101, step 1, obtaining a molecular genetic map;

[0035] The data in this example comes from the work of Wittenburg et al. 2003, and this data set contains 305 F2 offspring. For the phenotype data, gallstone weight and high-density lipoprotein (High-densi...

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Abstract

The present invention provides a multi-character and multi-interval positioning method based on marker site genotypes containing errors, including: obtaining a molecular genetic map; determining the recombination rate γ between markers on both sides of the i-th marker interval i and the recombination rate between the QTL in the i-th marker interval and the upper marker locus γ i1 ; According to the recombination rate γ between the markers on both sides of the i-th marker interval i and the recombination rate between the QTL in the i-th marker interval and the upper marker locus γ i1 Generate marker genotypes and QTL genotypes; obtain marker genotypes containing errors according to the configured error rate; configure the true value of parameters; obtain the observed value of phenotypic traits through the model; configure initial values ​​​​of parameters; Formula until convergence; repeat the cycle N times to obtain the average value and mean square error of parameter estimation as the target value. The invention can well solve the problem that marker gene information contains errors, and can estimate the error rate of marker gene information.

Description

technical field [0001] The invention belongs to the technical field of molecular biology, and in particular relates to a multi-character and multi-interval positioning method based on marker site genotype containing errors. Background technique [0002] Human genetic diseases and crop phenotypic traits are almost all related to genetic genes. For a long time, for the convenience of research, most studies have ignored the situation that marker genotypes contain errors. However, due to the precision of the instrument and other reasons, there are often errors in the marker gene information. In order to prevent the occurrence of genetic diseases and make better use of favorable genes in germplasm resources, a new QTL mapping method was proposed. This analysis method can well solve the problem of multi-trait gene mapping with errors in marker genotypes. Contents of the invention [0003] The invention can well solve the problem that marker gene information contains errors, an...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G16B5/00G16B20/30G16B25/10
CPCG16B5/00G16B20/00G16B50/00
Inventor 佟良周影马春华孙晓霞邹大伟付丽耿艳秋
Owner SUIHUA UNIV
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