Low temperature environment test chamber and low temperature environment test method

Abstract

The invention discloses a low temperature environment test chamber and a low temperature environment test method. The low temperature environment test chamber includes a test chamber shell, a test piece mounting platform, a heat exchanger, a heating device, a temperature measuring device, a fan and an inner air duct cylinder. A test piece is arranged on the test piece mounting platform, the heat exchanger and the heating device are used to increase and decrease the temperature in the test chamber, the temperature measuring device measures the temperature in the test chamber, and the fan and the inner air duct cylinder make a circulation air duct formed in the test chamber. The method controls the temperature in the test chamber according to the temperature measured by the temperature measuring device, a target temperature and a temperature increasing and decreasing rate. A circulating air system is formed in the test chamber, so the uniformity of the temperature in the chamber is ensured, the test piece rapidly dissipates, and the quick-responding temperature increasing and decreasing process is achieved.

Description

technical field [0001] The invention relates to the technical field of low temperature engineering, in particular to a low temperature environment experiment chamber and a test method. Background technique [0002] With the rapid development of aerospace and other technologies, because aerospace equipment and its components have been exposed to the extremely harsh space environment for a long time, in order to ensure the safe and reliable operation of aerospace equipment in the space environment, before leaving the earth, simulate and test Whether the equipment is safe and reliable in extreme temperature environment is very necessary. Therefore, in recent years, environmental test technology has been highly valued, throughout the entire process of design, development and production of military products, and its test conditions have become more and more complex. [0003] Traditional low temperature test equipment usually includes a highly insulated shell and a heat exchanger...

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Problems solved by technology

[0004] However, traditional low-temperature test equipment usually can only provide a small test space to meet the test requirements of small test pieces, and it is difficult to meet the needs of large-scale test pieces in specific low-temperature environments. For example, the announcement number is "CN204988323U", which discloses the name It is a Chinese patent for "an adjustable ultra-low temperature environment experimental device", which mainly includes a low-pressure chamber and a Dewar bottle arranged coaxially. Multiple heating devices in the low-voltage chamber increase the temperature of the low-voltage chamber. In order to ensure the rapid response of the test temperature, the device can only provide a small test space for the test needs of small instruments such as circuit boards, tap sockets, etc. If the internal test is increased space, it will be difficult for the device to ensure a rapid response to the experimental temperature to meet the test requirements of large test pieces. This is because traditional low temperature test equipment often generates gas convection through the temperature difference in different parts of the space, so that it is a low temperature test within a certain period of time. The temperature in the equipment tends to be uniform, and with the increase of the test space, if only relying on the convection generated by the temperature difference, the time required for the ambient temperature in the equipment to become uniform will become longer, making the rapid response of the ambient temperature in the experimental equipment become difficult to achieve

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