Automatic chip testing device

Abstract

The invention provides an automatic chip testing device which comprises a device body, wherein the device body comprises a transfer mechanism and a testing mechanism; the transfer mechanism comprisesa lower bottom plate; an upper bottom plate is arranged on the lower bottom plate; a first hinged seat is arranged on the upper bottom plate; a chip carrier is rotationally connected with the upper bottom plate by virtue of the first hinged seat; a placement groove is formed in the chip carrier; a to-be-tested chip is arranged in the placement groove; a pull rod is arranged at one end of the chipcarrier; a second hinged seat is arranged on one side of the pull rod; a connecting rod is rotationally connected with the pull rod by virtue of the second hinged seat. According to the automatic chiptesting device disclosed by the invention, the to-be-tested chip is automatically tested by virtue of a mechanical structure, the testing efficiency is high, the manual labor intensity is reduced, the stability and reliability are excellent, and the testing accuracy is ensured. Meanwhile, the production and development cost of factories and enterprises is reduced, and installation and maintenanceare very convenient.

Description

technical field [0001] The invention relates to the technical field of chip testing equipment, in particular to an automatic chip testing device. Background technique [0002] In the field of chip technology, with the continuous advancement of semiconductor technology, the density of integrated circuits on a chip is also getting higher and higher, which greatly improves the function and running speed of the chip. At the same time, the testing cost of chip performance parameters is also increasing. [0003] Once the chip is packaged, it needs to be tested. Generally, the test is performed by inserting the chip to be tested into a specially designed test circuit. Most of the conventional tests are carried out manually. The chip is inserted into the test jack, docked with the test platform, and then powered on for testing. The manual operation efficiency is low, the test accuracy largely depends on the tester's experience and degree of care, and the test stability and reliabi...

AI Technical Summary

Problems solved by technology

The efficiency of manual operation is low, the accuracy of the test largely depends on the experience and carefulness of the tester, and the stability and reliability of the test are poor

Now some factories and enterprises have invested in automated production and rely on robotic arms for operation. However, most of the highly automated and intelligent robotic arms are expensive, which increases the production and development costs of factories and enterprises. At the same time, the maintenance cost of robotic arms is also high, and Difficult to maintain

Images