Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Nondestructive detecting method for surface defects of plate structures

A technology of non-destructive testing and plate structure, applied in measuring devices, using sound waves/ultrasonic waves/infrasonic waves to analyze solids, using sound waves/ultrasonic waves/infrasonic waves for material analysis, etc., can solve the problems that surface wave sensors cannot meet the detection requirements, and achieve large Range detection capability, high detection sensitivity, saving manpower and material resources

Inactive Publication Date: 2018-08-07
BEIJING UNIV OF TECH
View PDF6 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of the fact that a single surface wave sensor cannot meet the detection requirements of multiple defects on the surface wave propagation path, the present invention provides a non-destructive detection method for surface defects of plate structures

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Nondestructive detecting method for surface defects of plate structures
  • Nondestructive detecting method for surface defects of plate structures
  • Nondestructive detecting method for surface defects of plate structures

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0041] The center frequency of the surface wave sensor used is 0.5MHz, and the piezoelectric ceramics in the thickness vibration mode is used as the sensitive element. The element width is 3mm, the element center distance is 6mm, the element length is 20mm, and the element thickness is 1mm. The experimental setup and the location of the all-focus imaging area are as follows: Figure 6 As shown, the sensors are equally spaced along the x-axis with a pitch of 20mm. The three defects are all surface crack defects, the lengths are 1.5mm, 2.5mm and 3mm, the width is 1mm, and the depth is 5mm. All-focus imaging was performed on a 50 mm × 100 mm area containing 3 defects.

[0042] Figure 2-Figure 7 The non-destructive testing process and test results of the surface defects of the plate structure in this embodiment are given. It can be seen that this method can accurately detect the surface defects of the plate structure, and solve the problem that a single surface wave sensor cann...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Widthaaaaaaaaaa
Lengthaaaaaaaaaa
Thicknessaaaaaaaaaa
Login to View More

Abstract

The invention discloses a nondestructive detecting method for surface defects of plate structures. The nondestructive detecting method for surface defects of plate structures comprises the following steps: building a sensor array by specially-made surface wave sensors to perform defect detecting and imaging on a region to be detected of the surface of a plate structure; arranging eight surface wave sensors according a linear array, and mounting the eight surface wave sensors on the surface of the plate structure by smearing coupling agents; exciting the first surface wave sensor, and receivingand acquiring eight defect echo signals by all the sensors; successively exciting the various sensors in the array, and repeating the acquiring process to acquire 64 defect echo signals; uploading the 64 echo data to a computer, and carrying out defect imaging processing on the 64 echo data by using a full-focusing imaging algorithm so as to judge whether the surface defects exist or not. The nondestructive detecting method has the advantages that the problem that the detection requirements of a plurality of collinear defects existing on a surface wave propagation path cannot be satisfied bya single surface wave sensor under special working conditions is solved; the nondestructive detecting method is high in detection sensitivity, does not need mobile sensors and saves a large number ofmanpower and material resources.

Description

technical field [0001] The invention relates to a nondestructive detection method for surface defects of a plate structure, which belongs to the technical field of ultrasonic nondestructive detection. Background technique [0002] With the rapid development of industrialization in our country, a large number of plate structures are used in engineering applications. Because they are widely used in machinery manufacturing, petrochemical, bridge and ship industries, their quality is related to the security of the national economy. However, due to the long service life of the plate structure, corrosion, natural disasters, human factors and other reasons, surface defects are easily formed during the working process, so its effective detection is particularly important. Surface waves are widely used in the detection of surface defects of plate structures due to their characteristics of single mode, energy concentrated on the surface of the structure, and long propagation distance....

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N29/04G01N29/06G01N29/07G01N29/22
CPCG01N29/04G01N29/06G01N29/07G01N29/22G01N2291/011G01N2291/023G01N2291/0289G01N2291/0423G01N2291/106
Inventor 龚裕张海峻吕炎吴斌何存富
Owner BEIJING UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com