Method and apparatus for detecting fabric defect, computer device and storage medium

A detection method and detection algorithm technology are applied in the fields of computer equipment and storage media, devices, and fabric defect methods, which can solve problems such as low detection rate, and achieve the effect of ensuring detection rate and reducing noise.

Inactive Publication Date: 2018-08-17
GUANGDONG ESQUEL TEXTILES CO LTD
View PDF5 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, the current fabric defect detection technology has the problem of low detection rate

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and apparatus for detecting fabric defect, computer device and storage medium
  • Method and apparatus for detecting fabric defect, computer device and storage medium
  • Method and apparatus for detecting fabric defect, computer device and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0047] The method for fabric defect detection provided by this application can be applied to such as figure 1 shown in the application environment. Wherein, the terminal 102 communicates with the server 104 through the network. Through the surface image of the fabric to be tested and the surface image of the standard fabric obtained by the terminal, the first fabric defect detection algorithm is first adopted, and the surface image of the fabric to be tested is compared with the surface image of the standard fabric to determine whether there is a defect on the surface of ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a method and a system for detecting a fabric defect, a computer device and a storage medium. The method comprises the following steps: obtaining the surface image of a fabricto be tested and the surface image of a standard fabric; comparing the surface image of the fabric to be tested with the surface image of the standard fabric by using a first fabric defect detection algorithm; processing the surface image of the fabric to be tested and the surface image of the standard fabric when the defect on the surface image of the fabric to be tested is detected in order to obtain an image with prominent defect features; and detecting the obtained processing results by a second fabric defect detection algorithm in order to obtain the parameters of the defect. The method can effectively reduce noises of the defect fabric in the defect detection process and detect the existence and the parameters of the detect by adopting detection using two algorithms and image processing in order to ensure the detection rate.

Description

technical field [0001] The present application relates to the technical field of textiles, in particular to a fabric defect method, device, computer equipment and storage medium. Background technique [0002] With the development of the field of textile technology, fabric defect detection technology has emerged. In garment production, defects on the surface of dyed fabrics are generally inspected and judged by inspectors with naked eyes under a light source. [0003] However, the current fabric defect detection technology has the problem of low detection rate. Contents of the invention [0004] Based on this, it is necessary to provide a fabric defect detection method, device, computer equipment and storage medium capable of ensuring a detection rate in view of the above technical problems. [0005] A fabric defect detection method, comprising: [0006] Obtain the surface image of the fabric to be tested and the surface image of the standard fabric; [0007] Using the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88G06T7/00G06T7/136
CPCG06T7/001G06T7/136G01N21/8851G06T2207/30124G06T2207/10004
Inventor 库万书张润明张玉高何梁博祝昆
Owner GUANGDONG ESQUEL TEXTILES CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products