Automatic function test system of semiconductor laser
A functional testing and laser technology, which is applied in the direction of optical instrument testing, machine/structural component testing, optical performance testing, etc., can solve problems such as low efficiency
Active Publication Date: 2018-08-24
SHENZHEN JPT OPTO ELECTRONICS CO LTD
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Problems solved by technology
[0003] Based on this, it is necessary to provide a semiconductor laser automatic functional test system for the low efficiency of the current characteristic test and spectrum current characteristic test of the semiconductor laser power
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[0029] In order to facilitate the understanding of the present invention, the following will describe the present invention more fully. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided to make the understanding of the disclosure of the present invention more thorough and comprehensive.
[0030] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention. The terms used herein in the description of the present invention are for the purpose of describing specific embodiments only, and are not intended to limit the present invention.
[0031] see Figure 1 to Figure 9 , is a semiconductor laser automatic function test system 100 in a preferred embodiment of the present invention, which is used to automatically detect and generate pow...
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The invention relates to an automatic function test system of a semiconductor laser. The system comprises a workbench, an optical power detection component, a spectrum detection component, a drive power, and a data processing device, wherein the optical power detection component comprises an optical power meter probe and a power collector; the optical power meter probe generates a corresponding power electrical signal according to a power of laser light, a power collector collects power electrical signals; the spectrum detection component comprises a spectrum light guide optical fiber and a spectrometer coupled with the spectrum light guide optical fiber; the drive power is used for outputting a current to a semiconductor laser; the spectrometer outputs spectrum detection data to the dataprocessing device; and the data processing device controls an output current of the drive power. The data processing device controls the output current of the drive power, so that the through currentof the semiconductor laser changes according to a pre-determined rule, and an optical power current characteristic curve and a spectrum current characteristic curve of the semiconductor laser can be calculated automatically by combining detection data of the optical power detection component and the spectrum detection component.
Description
technical field [0001] The invention relates to semiconductor laser testing technology, in particular to a semiconductor laser automatic function testing system. Background technique [0002] Semiconductor laser tubes have the characteristics of small size, high efficiency, and convenient use, so they have been widely used. According to the characteristics of the semiconductor laser tube, the output optical power and spectrum of the semiconductor laser tube change with the change of the driving current and the operating temperature of the laser tube. In order to provide users with complete information on semiconductor lasers, semiconductor lasers need to be tested for power and current characteristics and spectral characteristics during the development or production stage; however, traditional technical solutions generally manually adjust the current and record optical power and spectral information. As a result, the efficiency of the optical power current characteristic te...
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IPC IPC(8): G01M11/02
CPCG01M11/0207
Inventor 文少剑刘猛黄海翔廖东升董晓东
Owner SHENZHEN JPT OPTO ELECTRONICS CO LTD