Ageing oven and ageing method

An aging furnace and furnace body technology, applied in measurement devices, instruments, environmental/reliability testing, etc., can solve the problems of low signal utilization efficiency, waste of resources, and high cost of OLED display aging test, and reduce the cost of aging test. , The effect of solving the waste of resources and high utilization rate

Inactive Publication Date: 2018-08-28
苏州广林达电子科技有限公司
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Problems solved by technology

At present, the basic process of the existing aging test is: single-chip loading-the signal machine transmits the signal to the furnace body-the furnace body heats up for aging work-aging ends-signal shutdown-furnace body cooling-loading-repeated cycle work, Therefore, the utilization efficiency of the signal machine during the test is relatively low, and because each signal machine needs to correspond to a single chip / test fixture to be tested, the current OLED display aging test costs are too high and resources are wasted.

Method used

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  • Ageing oven and ageing method

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Embodiment Construction

[0019] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0020] See Figure 1 to Figure 3 The aging furnace shown in the present invention includes a base 1, a first furnace body 2, a second furnace body 3 and a control room 4, and the first furnace body 2 and the second furnace body 3 are relatively arranged on the base 1, The control room 4 is arranged on one side of the two furnace bodies. Both the first furnace body 2 and the second furnace body 3 are provided with a heater 5 , a humidifier 6 , an evaporator 7 , a motor 8 , a bracket 9 and m test fixtures 91 . The control room 4 is provided with a power distribution room (not shown) and a machine room (not shown). The two furnace bodies have an outer surface 10 on which a...

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Abstract

The present invention relates to an ageing oven and an ageing method. The ageing oven is provided with two opposite oven bodies, signal switches are arranged at the output ends of annunciators to allow the ageing test process to only need annunciators with half quantity in the prior art for work, and each annunciator is in a working state and has a high utilization rate. The ageing oven and the ageing method greatly reduce the ageing test cost, solve the resource waste problem and have a good application prospect.

Description

technical field [0001] The invention relates to an aging furnace and an aging method. Background technique [0002] OLED displays often need to undergo various tests after production, including aging tests, and the aging tests of OLED displays are usually completed in an aging furnace. At present, the basic process of the existing aging test is: single-chip loading-the signal machine transmits the signal to the furnace body-the furnace body heats up for aging work-aging ends-signal shutdown-furnace body cooling-loading-repeated cycle work, Therefore, the utilization efficiency of the signal machine is relatively low during the test process, and since each signal machine needs to correspond to a single chip / test fixture to be tested, the current OLED display burn-in test costs are too high and resources are wasted. [0003] Based on the above circumstances, the present invention is proposed. Contents of the invention [0004] The object of the present invention is to prov...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/003
Inventor 钱太宇
Owner 苏州广林达电子科技有限公司
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