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Atomic Force Microscope Scanners and Atomic Force Microscopes

An atomic force microscope and scanner technology, applied in the field of microscopy, can solve the problem of easy loss of scanning probes

Active Publication Date: 2021-01-29
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide an atomic force microscope scanner and an atomic force microscope to solve the technical problem that the scanning probe is easily lost during the replacement process

Method used

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  • Atomic Force Microscope Scanners and Atomic Force Microscopes
  • Atomic Force Microscope Scanners and Atomic Force Microscopes
  • Atomic Force Microscope Scanners and Atomic Force Microscopes

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Embodiment Construction

[0020] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0021] see Figure 1-Figure 3 , the present invention provides an atomic force microscope scanner, including a scanner body 10 , at least one elastic member 20 , an adjusting member 30 and a rotating pressing member 40 provided corresponding to each elastic member 20 . The scanner body 10 is provided with a card slot 101 , and the card slot 101 is provided with a scanning probe. The adjusting member 30 is arranged on the scanner body 10, each of the elastic member...

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Abstract

The invention provides an atomic-force microscope scanner comprising a scanner body, at least one elastic member, an adjusting member corresponding to each elastic member, and a rotating pressing member. A clamp groove is formed in the scanner body; and a scanning probe is arranged in the clamp groove. The adjusting member is arranged at the scanner body; and each elastic member sleeves one adjusting member. The elastic member includes a first mobile terminal and a second mobile terminal opposite to the first mobile terminal; the first mobile terminal is connected with the adjusting member; and the second mobile terminal is connected with the rotating pressing member. The adjusting member rotates to drive the elastic member to be pressed and make rotation, so that the second mobile terminal drives the rotating pressing member to rotate and then compresses the scanning probe. Therefore, a technical problem that the scanning probe is easy to lose during the replacement process is solved.

Description

technical field [0001] The invention relates to the technical field of microscopes, in particular to an atomic force microscope scanner and an atomic force microscope. Background technique [0002] The atomic force microscope studies the surface structure and properties of substances by detecting the extremely weak interatomic interaction between the surface of the sample to be tested and a miniature force sensitive element. The main implementation method is to use the micro-cantilever to sense the van der Waals force between the needle tip and the sample. The van der Waals force will cause the micro-cantilever to swing, and then use the laser to irradiate the light on the end of the micro-cantilever. When the swing is formed, the reflected light will At this time, the laser detector will record the offset, and will also send the signal to the feedback system at this time, so as to facilitate the system to make appropriate adjustments. Finally, the surface characteristics of...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01Q60/24
CPCG01Q60/24
Inventor 王俐钟兴进张小新张维维林虹云夏振宇李佳敖雪丽邢冰心陆金德
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD