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Transparent plate defect detection apparatus based on two-dimensional illumination, and method thereof

A transparent plate, defect detection technology, applied in measurement devices, material analysis by optical means, instruments, etc., can solve the problems of easy missed detection, complicated devices, etc., to improve efficiency, reduce complexity, and improve detection efficiency. Effect

Pending Publication Date: 2018-09-18
TIANJIN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] Similarly, "Method and System for Detecting Defects on the Surface and / or Inside of a Transparent Substrate (Publication No.: CN101887030A)" published by Zheng Yuan et al. in 2010 discloses a detection method with multiple light sources and multiple detection channels. The method adopts the perspective lighting method in the backlighting method, which is used to detect relatively obvious defect effects, but for small and tiny defects, it is easy to miss detection, and the device is also relatively complicated

Method used

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  • Transparent plate defect detection apparatus based on two-dimensional illumination, and method thereof
  • Transparent plate defect detection apparatus based on two-dimensional illumination, and method thereof
  • Transparent plate defect detection apparatus based on two-dimensional illumination, and method thereof

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Embodiment 1

[0045] A transparent flat plate defect detection device based on two-dimensional illumination, see figure 1 , the detection device includes: a detection table 1, two lighting devices 2, and an image acquisition device 3, the detection table 1 is used to carry a transparent flat plate 4 to be detected; the detection table 1 is fixedly connected with the lighting device 2, and the two lighting devices 2 are respectively located on adjacent sides of the inspection platform 1; the image acquisition device 3 is located above the inspection platform 1, and is used to collect defects on the transparent flat plate 4 downward when the light is illuminated.

[0046] In specific implementation, the embodiment of the present invention does not impose any restrictions on the structure and material of the detection platform 1 , as long as the detection platform can realize the above functions.

[0047] see figure 2 , the lighting device 2 is used to provide a two-dimensional side light so...

Embodiment 2

[0057] A method for detecting defects in a transparent flat plate based on two-dimensional illumination, which corresponds to the detection device in Example 1, see Figure 4 and Figure 5 , the detection method includes the following steps:

[0058] 101: the first incident light A in the two-dimensional side light source 25 is generated by the light source 251, and the second incident light B is generated by the light source 252;

[0059] That is, the same two light sources, ie the light source 251 and the light source 252 , are disposed on adjacent two sides of the detection table 1 . The brightness of the light source 251 and the light source 252 is adjustable, and the horizontal position and the vertical position of the light source 251 and the light source 252 are adjustable, and its purpose is to inject parallel light rays into the transparent plate 4 to be detected.

[0060] 102: the first outgoing light C and the second outgoing light D after passing through the transp...

Embodiment 3

[0069] In the embodiment of the present invention, a plurality of CMOS cameras 31 (i.e. imaging devices) are fixed at several angles to collect images from multiple angles, and finally the multiple images collected are all transmitted to the host computer 32, and the host computer 32 performs multi-angle images Joint analysis is to perform defect detection on images collected from multiple angles. If there is no defect in each angle, the transparent plate 4 (for example: the most typical glass plate) is considered to be free of defects, otherwise, it is considered to be defective in any angle.

[0070] During specific implementation, in the embodiment of the present invention, two intersecting light sources (251 and 252) are placed on adjacent two sides of the transparent flat plate 4 to be detected, and the transparent flat plate 4 to be detected is placed on the detection table 1, so that the light sources (251 and 252 ) is parallel to the transparent flat plate 4 to be teste...

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Abstract

The invention discloses a transparent plate defect detection apparatus based on two-dimensional illumination, and a method thereof. The apparatus comprises: a detection bench used for bearing a transparent plate to be detected; two illuminating devices fixedly connected with the detection bench and respectively located at two adjacent sides of the detection bench, wherein linear lights emitted bythe illuminating devices are parallel to the transparent plate, and go through the transparent plate; and an image acquisition device arranged above the detection bench and used for downward acquiringthe image of the transparent plate laterally illuminated by the illuminating device in a two-dimensional manner. The method comprises the following steps: generating total reflection or refraction due to the difference in the refractive index of a defect part and the refractive index of the transparent plate, determining the existence of the defect in an image processing stage according to the change gradient of a gray value, and performing rapid and efficient processing discrimination by a machine vision technology. The existence or not of a fine and minimal defect on the transparent plate can be accurately detected to accurately position the defect part.

Description

technical field [0001] The invention relates to defect detection of transparent flat plates, and is particularly suitable for detecting defects such as cracks and air bubbles in transparent flat plates, and is especially suitable for defect detection of transparent flat plates used in electronic equipment. Background technique [0002] With the advancement of technology, the current products are developing in the direction of high-quality products, people's requirements for products are getting higher and higher, and product designers are paying more attention to user experience. Whether the transparent flat material is used for decoration, or as a screen or protective layer of electronic equipment, it is necessary to strictly control the quality of the product. When people detect defects on transparent flat plates, they usually think of using light source for auxiliary detection, so that the detection effect will be better. [0003] The usual lighting method adopts the fro...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/958
CPCG01N21/958
Inventor 林凌夏彬标李刚
Owner TIANJIN UNIV