MMC sub-module accelerated life test circuit and method

A test circuit and life-accelerating technology, applied in the field of power electronics, can solve the problem of neglecting the life test of MMC sub-modules, save time, improve test efficiency, and accelerate the failure mechanism.

Pending Publication Date: 2018-10-09
CHINA EPRI ELECTRIC POWER ENG CO LTD
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  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

However, the current MMC sub-module manufacturers often ignore the life test of the MMC sub-module in the routine test when the sub-module leaves the factory.

Method used

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  • MMC sub-module accelerated life test circuit and method
  • MMC sub-module accelerated life test circuit and method
  • MMC sub-module accelerated life test circuit and method

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Embodiment Construction

[0025] The technical solution of the present invention will be described in further detail below in conjunction with the accompanying drawings.

[0026] Such as figure 1 As shown in the test circuit diagram, the present invention regards the switching frequency of the IGBT as the accelerated stress, that is, by accelerating the switching frequency of the IGBT, the two-month accelerated aging test is equivalent to the operating condition of the IGBT in 40 years, but at the same time the IGBT is operating. The temperature is maintained at the normal operating state of the MMC sub-module.

[0027] Taking the Xiamen Soft Straight Project as an example, the IGBT switching frequency is between 150-200HZ, and the design life is 40 years. In two months, it is equivalent to the operating condition of the IGBT for 40 years. According to the accelerated life theory, test the IGBT switch The rate is: 40KHZ. When the switching frequency of IGBT increases, its switching loss also increase...

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Abstract

The invention provides an MMC sub-module accelerated life test circuit and method. The test circuit is in an H-bridge structure, and comprises an inductor arranged at an H-bridge joint; a PWM wave control unit and a capacitor, which are connected with the two ends of a bridge arm respectively; and a DC power supply, which is connected in parallel with the two ends at one side of the bridge arm. The test method fully utilizes the accelerated life principle, improves test efficiency and saves time.

Description

technical field [0001] The invention relates to the field of power electronics, in particular to a test circuit and method for accelerated life of an MMC sub-module. Background technique [0002] Due to its unique advantages in new energy grid connection, island power supply, asynchronous grid interconnection, multi-terminal DC transmission, and urban distribution network capacity expansion, flexible DC transmission technology has been more and more widely adopted and applied by power systems. [0003] With the increase of the voltage level and transmission capacity of the flexible direct current transmission system, the reliability of its key equipment, the converter valve, becomes particularly important. Modular multilevel (MMC) flexible HVDC converter valve consists of power sub-modules, and the reliability of MMC sub-modules is closely related to the reliability of the converter valve. [0004] The MMC sub-module accelerated life test is an important method to study the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/003
Inventor 查鲲鹏曹均正闻福岳屈海涛李兴哲
Owner CHINA EPRI ELECTRIC POWER ENG CO LTD
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