Power cycling test system for semiconductor devices
A technology of power cycle and test system, applied in the direction of single semiconductor device test, instrument, measurement power, etc., can solve the problems of increasing the cost of the test platform, the current source cannot meet the test requirements, etc., and achieve the effect of improving the test efficiency
Active Publication Date: 2018-10-12
北京华电锐拓科技有限公司
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Problems solved by technology
For high-voltage and high-current applications such as power systems and electric locomotives, the current of a single device reaches 3000A and above, and then the parallel test of semiconductor devices to be tested to improve efficiency will not only dramatically increase the cost of the entire test platform, but also the current source. Unable to meet the corresponding test requirements
Method used
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Embodiment 2
[0074] In this embodiment, a 90kW / 3000A power cycle test system and a 3000A IGBT device to be tested are taken as examples for illustration.
[0075] image 3 A structural block diagram of a power cycle test system provided by Embodiment 2 of the present invention. Such as image 3 As shown, the power cycle test system mainly includes a controller, a power supply system, a load system, a calibration system, a measurement system, an aging evaluation system, and a water cooling system. Among them, the power supply system includes DC power supply, measurement power supply and grid power supply. The load system includes several parallel test branches and a shunt branch. The controller mainly performs control functions and protection functions, including timing control of test switch drive pulses, Data processing and system protection, etc., each part complements each other and cooperates together to form an efficient and reliable high-voltage and high-power IGBT device power cyc...
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The invention discloses a power cycling test system for semiconductor devices. The power cycling test system comprises a controller, a driver, at least one test branch, a direct-current power source and a water cooler, wherein each test branch comprises a test branch switch and multiple to-be-tested semiconductor devices connected with the test branch switch in series, and all the to-be-tested semiconductor devices are connected in series. According to the power cycling test system, devices of other tested branches are heated by effectively using cooling time of a tested branch, the multiple to-be-tested semiconductor devices are tested, and the test efficiency of the power cycling test system can be greatly improved. Meanwhile, as the power cycling test system is provided with multiple parallel test branches, a user can switch multiple test functions according to actual demands, and devices of different manufacturers or types can be subjected to a comparison test under same test conditions.
Description
technical field [0001] The invention relates to the field of reliability testing of semiconductor devices, in particular to a power cycle testing system of semiconductor devices. Background technique [0002] Power semiconductor devices are more and more widely used in power systems. Currently, at least 60% of the world's electric energy is controlled by them. In the future, under the trend of global energy Internet, with large-scale new energy generation connected to the grid and electric vehicles This proportion will increase significantly when mobile unpredictable loads are connected to the grid. Therefore, research work on power semiconductor devices has also become a hot spot in recent years, especially high-voltage and high-power semiconductor devices. At the same time, due to the coexistence of AC and DC grids and the continuous influx of new energy sources, it has a certain impact on the grid, which puts forward higher requirements for the reliability of the DC grid...
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Login to View More IPC IPC(8): G01R31/26
CPCG01R31/2601
Inventor 邓二平陈杰郭楠伟赵志斌黄永章
Owner 北京华电锐拓科技有限公司