Particulate matter detection device and particulate matter detection method
A particle detection and particle technology, which is applied in the direction of measuring devices, particle suspension analysis, particle and sedimentation analysis, etc., can solve the problems of real-time detection of semiconductor production equipment and achieve the effect of realizing detection, improving efficiency and accuracy
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[0042] The specific implementations of the particle detection device and the particle detection method provided by the present invention will be described in detail below with reference to the accompanying drawings.
[0043] In the semiconductor manufacturing process, the particulate matter inside the semiconductor equipment is an important condition to ensure the normal progress of the semiconductor process. Therefore, it is necessary to detect the particle information inside the semiconductor equipment. Since most semiconductor equipment needs to be in a closed vacuum or low pressure state when performing semiconductor processing procedures, at this time, the chamber door of the semiconductor processing chamber cannot be opened to monitor the particle situation. At present, the method for detecting the particle information inside the semiconductor equipment needs to be carried out when the semiconductor equipment is shut down. Therefore, it is impossible to monitor the parti...
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