Young modulus measurement device and method based on Michelson interferometer

Abstract

The invention provides a Young modulus measurement device and method based on a Michelson interferometer. The device comprises an S-shaped tension sensor, a metal wire, a transverse H-shaped support rod, a gear group shell, a tension sensor supporting base, a tension sensor display, a Michelson interferometer main body (including an M1 mirror, a movable seat, an M2 mirror, an adjusting knob, a screw rod, a compensating plate, a fine tuning knob and a beam splitting plate), an optical screen, a linear array CCD, a He-Ne laser, an optical screen support rod, a supporting transverse rod, a lasersupporting base and a single chip microcomputer, wherein the tension sensor display is connected with the S-shaped tension sensor, the left end of the metal wire is connected with a hanger of the S-shaped tension sensor, the right end of the metal wire is connected with the M1 mirror, the linear array CCD is mounted on the back of the optical screen, the single chip microcomputer is connected withthe linear array CCD, the He-Ne laser is placed on the left side of the rear end of the Michelson interferometer, and the beam splitting plate and the M2 mirror are arranged on the right side, directly facing towards the He-Ne laser, of the Michelson interferometer main body. According to the Young modulus measurement device, the convenience in the measurement process can be improved, and the precision of a measurement result can be improved.

Description

technical field [0001] The invention relates to the field of measuring the Young's modulus of metal wires, in particular to a measuring device and method for the Young's modulus based on a Michelson interferometer. Background technique [0002] The key to measuring the Young's modulus of metal by static stretching method in university physics experiments is to measure the tiny elongation of the metal wire when it is under force. The commonly used optical lever method has the disadvantages of heavy measuring instruments and insufficient measurement accuracy. The reason is that in the experiment, when the reading on the scale image is observed through the optical lever, a slight disturbance will cause the scale image to shake, which seriously affects the accuracy of the reading. Gross errors are likely to occur. Contents of the invention [0003] In order to solve the above-mentioned problems, the present invention provides a Young's modulus measurement device and method ba...

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Problems solved by technology

[0002] The key to measuring the Young's modulus of metal by static stretching method in university physics experiments is to measure the tiny elongation of the metal wire when it is under force. The commonly used optical lever method has the disadvantages of heavy measuring instruments and insufficient measurement accuracy. The reason is that in the experiment, when the reading on the scale image is observed through the optical lever, a slight disturbance will cause the scale image to shake, which seriously affects the accuracy of the reading. Gross errors are likely to occur when

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